JPH04357190A - Single crystal production apparatus - Google Patents

Single crystal production apparatus

Info

Publication number
JPH04357190A
JPH04357190A JP13134191A JP13134191A JPH04357190A JP H04357190 A JPH04357190 A JP H04357190A JP 13134191 A JP13134191 A JP 13134191A JP 13134191 A JP13134191 A JP 13134191A JP H04357190 A JPH04357190 A JP H04357190A
Authority
JP
Japan
Prior art keywords
single crystal
crucible
raw material
crystal
melt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13134191A
Other languages
Japanese (ja)
Other versions
JP2500875B2 (en
Inventor
Masanori Hashimoto
正則 橋本
Masafumi Imayoshi
今吉 全史
Takashi Tobinaga
飛永 隆
Junsuke Tomioka
純輔 冨岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumco Techxiv Corp
Original Assignee
Sumco Techxiv Corp
Komatsu Electronic Metals Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumco Techxiv Corp, Komatsu Electronic Metals Co Ltd filed Critical Sumco Techxiv Corp
Priority to JP3131341A priority Critical patent/JP2500875B2/en
Publication of JPH04357190A publication Critical patent/JPH04357190A/en
Application granted granted Critical
Publication of JP2500875B2 publication Critical patent/JP2500875B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To improve the quality of a single crystal by placing a separation plate having narrowed lower end around a single crystal keeping a prescribed gap therebetween, covering a quartz crucible with a lower plate having plural small holes and passing an inert gas through the gap between the single crystal and the separation plate. CONSTITUTION:A raw material melting part 200 is evacuated through an evacuation port and an inert gas such as Ar is introduced into the apparatus. A quartz crucible 5 is heated to melt the raw material by electrifying a heater 8 and a seed crystal is immersed in the molten raw material. The inert gas flow passing through the gap between the single crystal 1 and the separation plate 13 increases its speed at the narrowed part 2 to discharge the component evaporated from the molten liquid surface through the small holes 6 of the lower plate 7. Furthermore, the intrusion of impurities into the single crystal 1 in pull-up stage is prevented e.g. by the action of the lower plate 7 to prevent the reflux of the condensed product removed from the molten liquid surface by the inert gas. The crystal is pulled up at a prescribed speed by a pull-up part 300 to obtain a single crystal 1 free from crystal defect.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】〔発明の目的〕[Object of the invention]

【0002】0002

【産業上の利用分野】本発明は、半導体単結晶製造装置
に係り、特に高純度で均質な半導体単結晶を製造する半
導体単結晶製造技術に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor single crystal manufacturing apparatus, and more particularly to a semiconductor single crystal manufacturing technique for manufacturing a highly pure and homogeneous semiconductor single crystal.

【0003】0003

【従来の技術】半導体単結晶の育成には、るつぼ内の原
料融液から円柱状の結晶を育成するCZ(チョクラルス
キー引上げ)法が用いられている。育成される単結晶に
は極めて高純度のものが要求されるが、引上げ中に凝縮
した一酸化ケイ素凝縮物からなる塊状物がるつぼ内融液
中に落下し、引上げ単結晶中に不純物として取り込まれ
たり、また単結晶化が阻害されたりするという問題があ
った。
2. Description of the Related Art A CZ (Czochralski pulling) method is used to grow semiconductor single crystals, in which a cylindrical crystal is grown from a raw material melt in a crucible. The single crystal to be grown is required to be of extremely high purity, but during pulling, lumps of silicon monoxide condensate fall into the melt in the crucible and are incorporated into the pulled single crystal as impurities. There have been problems in that the crystallization is inhibited, and single crystallization is inhibited.

【0004】そこで、このような問題を解決するため、
るつぼの縁から内側に平たい環状リムを突出させるとと
もに、この環状リムに、円筒形状または円錐状に先細り
となるようにカバーを取り付け、さらに反応炉内に不活
性ガスを流速および圧力を適当に調節することによって
、引上げ中に凝縮した凝縮物または塊状物が融液中に落
ち込むのを防止するという方法が提案されている(特公
昭57−40119号または特公昭58−1080)。
[0004] Therefore, in order to solve such problems,
A flat annular rim is protruded inward from the edge of the crucible, a cover is attached to the annular rim so that it tapers into a cylindrical or conical shape, and the flow rate and pressure of inert gas are adjusted appropriately into the reactor. A method has been proposed in which the condensate or lumps condensed during pulling are prevented from falling into the melt by doing so (Japanese Patent Publication No. 57-40119 or Japanese Patent Publication No. 58-1080).

【0005】しかしながらこのような構造では、カバー
の外側すなわち低温部側には、引上げ中に凝縮した一酸
化ケイ素凝縮物または塊状物が付着し、これが融液中に
落下する。そして融液中に落下した凝縮物は成長するケ
イ素単結晶中に結晶欠陥を生ずる原因となっていた。
However, in such a structure, silicon monoxide condensate or lumps that are condensed during pulling adhere to the outside of the cover, that is, on the low-temperature side, and fall into the melt. The condensate that fell into the melt caused crystal defects in the growing silicon single crystal.

【0006】さらに、本発明者らは種々の実験の結果、
このように引上げ単結晶中に不純物として取り込まれ、
多結晶化の原因になる物質として、一酸化ケイ素凝縮物
以外にも、金属、金属酸化物等があることを発見した。
Furthermore, as a result of various experiments, the present inventors found that
In this way, it is incorporated into the pulled single crystal as an impurity,
We discovered that in addition to silicon monoxide condensates, there are metals, metal oxides, and other substances that cause polycrystalization.

【0007】[0007]

【発明が解決しようとする課題】このように従来の構造
では、カバーの外側すなわち低温部側には、引上げ中に
凝縮した一酸化ケイ素凝縮物または塊状物あるいは金属
、金属酸化物等が付着し、これが融液中に落下し、成長
するケイ素単結晶中に結晶欠陥を発生させる原因となっ
ていた。
[Problems to be Solved by the Invention] In this conventional structure, silicon monoxide condensate or lumps, metals, metal oxides, etc. that are condensed during pulling adhere to the outside of the cover, that is, the low temperature side. This falls into the melt and causes crystal defects in the growing silicon single crystal.

【0008】本発明は、前記実情に鑑みてなされたもの
で、不純物が成長するケイ素単結晶中に取り込まれるの
を防止し、結晶欠陥が少なく信頼性の高い半導体単結晶
を得ることのできる半導体単結晶製造装置を提供するこ
とを目的とする。
The present invention has been made in view of the above-mentioned circumstances, and provides a semiconductor that can prevent impurities from being incorporated into a growing silicon single crystal and obtain a highly reliable semiconductor single crystal with few crystal defects. The purpose is to provide a single crystal manufacturing device.

【0009】〔発明の構成〕[Configuration of the invention]

【0010】0010

【課題を解決するための手段】そこで本発明では、半導
体単結晶製造装置において単結晶引上げ装置内のヒータ
とるつぼ上方の全面を覆い、単結晶引上げ領域の固液界
面付近にまで下降、縮径して、引上げ領域の前記単結晶
との間に開口部を構成し、この開口部を残して前記単結
晶製造装置内の気相部を2分する隔離板と、この隔離板
の内部(下方)にあって、るつぼの上方を蓋状に覆うよ
うに配設され、複数の小孔を有する下方板とを配設しこ
の隔離板と単結晶との間に不活性ガスを流し、下方板に
設けた小孔を介して排出せしめるようにしている。
[Means for Solving the Problems] Accordingly, in the present invention, in a semiconductor single crystal manufacturing apparatus, the entire surface above the heater and crucible in the single crystal pulling device is covered, and the diameter is reduced by descending to the vicinity of the solid-liquid interface in the single crystal pulling region. and a separator that forms an opening between the single crystal in the pulling region and divides the gas phase in the single crystal manufacturing apparatus into two by leaving this opening, and the inside of this separator (downward). ), a lower plate is arranged to cover the upper part of the crucible like a lid and has a plurality of small holes, and an inert gas is flowed between the separator plate and the single crystal, and the lower plate It is made to be discharged through a small hole provided in the.

【0011】また本発明の第2では、引上げ単結晶の周
囲を囲み、下方程縮径した内円筒と、内円筒上端に連設
され、るつぼとヒータ上方全面を覆う上方板と、上方板
の外周にとり付けられる外円筒とからなる隔離板と、こ
の隔離板の内部(下方)にあって、るつぼの原料融液を
蓋状に覆い、複数の小孔を有する下方板とを設け、引上
げ方向から原料融液方向にむけて、この隔離板と単結晶
との間に不活性ガスを流すようにしている。
In the second aspect of the present invention, an inner cylinder that surrounds the pulled single crystal and whose diameter decreases toward the bottom; an upper plate that is connected to the upper end of the inner cylinder and covers the entire upper surface of the crucible and the heater; A separator plate consisting of an outer cylinder attached to the outer periphery, and a lower plate that is located inside (below) this separator plate and covers the raw material melt in the crucible like a lid and has a plurality of small holes are provided. An inert gas is caused to flow between the separator and the single crystal in the direction of the raw material melt.

【0012】望ましくは、この円筒の単結晶との間隔は
、20mmとし、円筒の下端部では10mm程度となる
ように縮径している。
Preferably, the distance between the cylinder and the single crystal is 20 mm, and the diameter is reduced to about 10 mm at the lower end of the cylinder.

【0013】さらに、望ましくはこの小孔には上方に向
かって縮径し先端が解放となっている円錐状または円錐
台状の筒をとりつけるようにしてもよい。
Furthermore, it is preferable that a conical or truncated conical tube whose diameter decreases upward and is open at the tip is attached to the small hole.

【0014】[0014]

【作用】上記構成によれば、引上げ中の単結晶のまわり
に所定の間隔を隔て、複数の小孔の配設された板状体を
有しているため、蒸発物が凝結して原料融液中に落下す
るのを防止することができる。
[Function] According to the above structure, since the plate-shaped body is provided with a plurality of small holes at a predetermined interval around the single crystal being pulled, the evaporated matter is condensed and the raw material is melted. It can prevent it from falling into the liquid.

【0015】一方、この円筒の下端部を縮径し、引上げ
中の単結晶との間隔が小さくなるようにしているため、
一方で、引上げ中の単結晶と溶解ケイ素の境界領域で不
活性ガスの流速が上昇し、わずかに原料融液中に不純物
が含まれていたとしても引上げ時にガス状不純物が単結
晶に付着するのは防止される。
On the other hand, since the diameter of the lower end of this cylinder is reduced to reduce the distance between it and the single crystal being pulled,
On the other hand, the flow rate of inert gas increases in the boundary region between the single crystal and the dissolved silicon during pulling, and even if the raw material melt contains a small amount of impurities, gaseous impurities will adhere to the single crystal during pulling. is prevented.

【0016】また、この円筒と単結晶との隙間は、融液
から引き上げられたばかりの高温の単結晶から輻射熱が
効率よく除去されるのに必要であり、この隙間の下限値
として20mm程度は必要である。
[0016] Furthermore, this gap between the cylinder and the single crystal is necessary for the radiant heat to be efficiently removed from the high-temperature single crystal that has just been pulled from the melt, and the lower limit of this gap is approximately 20 mm. It is.

【0017】また、上方に向かって縮径し先端が解放と
なっている円錐状または円錐台状の筒を小孔にとりつけ
ることにより、生成した凝縮物が融液中に落下するのを
防ぐことができる。
[0017] Furthermore, by attaching a conical or truncated conical cylinder whose diameter decreases upward and is open at the tip to the small hole, it is possible to prevent the generated condensate from falling into the melt. Can be done.

【0018】[0018]

【実施例】以下、本発明の実施例について図面を参照し
つつ詳細に説明する。
Embodiments Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

【0019】実施例1 本発明の第1の実施例の単結晶製造装置は、図1および
図2に示すように(図1は断面図、図2は下方板の斜視
図である)、単結晶製造装置本体100と、この内部に
設けられた原料融液部200と、引上げ部300とから
構成されている。そして、引上げ部300のまわりを囲
み、下端で引上げ単結晶1との間が10mm程度となる
ような縮径部2を有する円筒状の内円筒3と、内円筒3
の上端に連設され、引上げ部300の近傍から石英るつ
ぼ5の縁を越え、ヒータ8と製造装置100との間に達
して上方を覆う上方板4と、上方板4の外縁に連設され
て下降し、ヒータ8を囲み、製造装置本体100の底部
(図示せず)で支えられた外円筒30とからなる隔離板
50と、隔離板50の内部(下方)に、石英るつぼ5の
上面に蓋をするように形成され、小孔6を有する下方板
7とを具備している。
Embodiment 1 A single crystal manufacturing apparatus according to a first embodiment of the present invention is as shown in FIGS. 1 and 2 (FIG. 1 is a sectional view and FIG. 2 is a perspective view of the lower plate). It is composed of a crystal manufacturing apparatus main body 100, a raw material melt section 200 provided inside the main body 100, and a pulling section 300. Then, a cylindrical inner cylinder 3 surrounds the pulling part 300 and has a reduced diameter part 2 such that the distance from the pulled single crystal 1 at the lower end is about 10 mm;
An upper plate 4 that is connected to the upper end of the quartz crucible 5 from near the pulling part 300 and reaches between the heater 8 and the manufacturing apparatus 100 to cover the upper side; A separator 50 consisting of an outer cylinder 30 that surrounds the heater 8 and is supported by the bottom (not shown) of the manufacturing apparatus main body 100; The lower plate 7 is formed to cover the lower plate and has a small hole 6.

【0020】そして隔離板50の縮径部2は、融液との
境界部近傍で急激に間隔が小さく(l2 )なるように
構成されている。そしてさらに、この下方板7は、小孔
6それぞれに上方に向かって縮径し先端が解放状態であ
る円錐状または円錐台状の小筒6sを配設しており、生
成した凝縮物が融液中に落下するのを防ぐ構造になって
いる。なお、隔離板3と単結晶1との間隔は上部でl1
 =20mm、下端でl2=10mmとした。さらに下
方板7の側方にも側方孔7hが形成されている。
The reduced diameter portion 2 of the separator 50 is constructed such that the distance between the reduced diameter portions 2 of the separator plate 50 sharply decreases (l2) near the boundary with the melt. Further, this lower plate 7 is provided with a small cylinder 6s in the shape of a cone or truncated cone whose diameter decreases upward in each of the small holes 6 and whose tip is open, so that the generated condensate can be melted. It has a structure that prevents it from falling into the liquid. Note that the distance between the separator 3 and the single crystal 1 is l1 at the top.
= 20 mm, and l2 = 10 mm at the lower end. Further, side holes 7h are formed on the sides of the lower plate 7.

【0021】また、石英るつぼ5と上方板4との間には
ヒータ8が配設され石英るつぼの温度を所定の値に保持
するようになっている。
Furthermore, a heater 8 is provided between the quartz crucible 5 and the upper plate 4 to maintain the temperature of the quartz crucible at a predetermined value.

【0022】そしてこの隔離板50の上方からは、単結
晶製造装置本体100の上方に配設された供給口O1 
を介してアルゴンガスが供給され、下方に配設された排
気口(図示せず)を介して排気される。
From above this separator 50, a supply port O1 arranged above the single crystal manufacturing apparatus main body 100 can be seen.
Argon gas is supplied through the chamber and exhausted through an exhaust port (not shown) disposed below.

【0023】従って、アルゴンガスは、隔離板の内円筒
3と引上げ単結晶1との間をとおって流れ、縮径部2で
急速に流速を増し、原料融液からの揮散物(酸化ケイ素
,金属酸化物)とともに、下方板7に設けられた小孔6
から流出し、ヒータ8および外円筒30の内側に沿って
流れ、最終的に系外へと排気される。
Therefore, the argon gas flows between the inner cylinder 3 of the separator plate and the pulled single crystal 1, rapidly increases the flow velocity in the diameter-reduced section 2, and removes volatile matter (silicon oxide, silicon oxide, etc.) from the raw material melt. metal oxide) and small holes 6 provided in the lower plate 7.
, flows along the inside of the heater 8 and the outer cylinder 30, and is finally exhausted to the outside of the system.

【0024】さらに、単結晶製造装置内に発生する凝縮
物は、この下方板7と上方板4との間を通って流出され
るが、この下方板7は、各小孔6に連設された小筒6s
を有しているため、上方板4の内壁に付着したとしても
、上方に向かって縮径し先端が解放となっている円錐状
または円錐台状の小筒6sの存在により原料融液中に落
下することはほとんどない。
Further, the condensate generated in the single crystal production apparatus is discharged through the space between the lower plate 7 and the upper plate 4, and the lower plate 7 is connected to each small hole 6. small tube 6s
Therefore, even if it adheres to the inner wall of the upper plate 4, it will not be contained in the raw material melt due to the presence of the conical or truncated conical small cylinder 6s whose diameter decreases upward and the tip is open. It almost never falls.

【0025】これら下方板7、隔離板50は、石英、カ
ーボン等熱的に安定な材料で構成される。
The lower plate 7 and the separator 50 are made of thermally stable materials such as quartz and carbon.

【0026】また、原料融液部200は、ヒータ8内に
、ペディスタル(るつぼ支持台)9に装着されたるつぼ
受け10に支持された黒鉛るつぼ11内にさらに石英る
つぼ5を装着し、この石英るつぼ5内部でシリコン原料
を溶融せしめ原料融液として保持するようになっている
In addition, the raw material melt section 200 further includes a quartz crucible 5 mounted in the graphite crucible 11 supported by a crucible holder 10 mounted on a pedestal (crucible support stand) 9 within the heater 8. The silicon raw material is melted inside the crucible 5 and held as a raw material melt.

【0027】さらに、引上げ部300はこの原料融液内
に種結晶を浸漬し所定の速度で引き上げることにより単
結晶1を育成するようになっている。
Furthermore, the pulling section 300 grows the single crystal 1 by immersing a seed crystal in this raw material melt and pulling it up at a predetermined speed.

【0028】次に、この図1の単結晶製造装置を用いて
シリコン単結晶の育成を行う方法について説明する。
Next, a method for growing a silicon single crystal using the single crystal manufacturing apparatus shown in FIG. 1 will be described.

【0029】まず、排気口を真空排気し、原料融液部2
00を減圧状態とする。
First, the exhaust port is evacuated, and the raw material melt part 2
00 is a reduced pressure state.

【0030】そして、石英るつぼ5内を加熱するための
ヒータ8をオンし、原料融液を得ると共に、この原料融
液内に種結晶を浸漬し、引上げ部300によって所定の
速度で引き上げることにより単結晶1を育成する。
Then, the heater 8 for heating the inside of the quartz crucible 5 is turned on to obtain a raw material melt, and the seed crystal is immersed in the raw material melt and pulled up at a predetermined speed by the pulling unit 300. Grow single crystal 1.

【0031】単結晶育成時の条件は、石英るつぼ4の直
径16インチ、石英るつぼ3内の融液量15kg、育成
単結晶1の直径4インチ、抵抗率(リンド―プ)15Ω
・cm、引上げ速度1mm/min.である。
The conditions for single crystal growth are as follows: quartz crucible 4 has a diameter of 16 inches, the amount of melt in the quartz crucible 3 is 15 kg, the grown single crystal 1 has a diameter of 4 inches, and the resistivity (phosphorus dope) is 15 Ω.
・cm, pulling speed 1mm/min. It is.

【0032】このように本発明の装置によれば、隔離板
50および下方板7を具備した構成をとることにより、
装置内に導入される不活性ガスの流れが、固液界面近傍
(引上げ中の単結晶と融液との境界近傍)で最大となる
ことから、融液面からの揮散物が速やかに運び去られ、
引上げ時に単結晶中に不純物が取り込まれるのを防ぐこ
とができる。
As described above, according to the device of the present invention, by adopting the configuration including the separator plate 50 and the lower plate 7,
Since the flow of inert gas introduced into the device is maximum near the solid-liquid interface (near the boundary between the single crystal being pulled and the melt), volatile matter from the melt surface is quickly carried away. is,
Impurities can be prevented from being incorporated into the single crystal during pulling.

【0033】また、融液上方に設けられた下方板7は、
不活性ガスにより融液面上から除去された凝縮物の逆流
を防止する。
Further, the lower plate 7 provided above the melt is
The inert gas prevents backflow of condensate removed from the melt surface.

【0034】そしてさらに、上述したように、小孔6に
は小筒6sが設けられているため、生成した凝縮物が落
下しても融液中に戻る確率が大幅に低減される。
Furthermore, as described above, since the small tube 6s is provided in the small hole 6, even if the generated condensate falls, the probability that it will return to the melt is greatly reduced.

【0035】従って、通常のCZ法では、不純物が混入
していたのに対して、本発明を用いて育成した単結晶で
は不純物の混入が大幅に低減される。
[0035] Therefore, while the conventional CZ method involves contamination with impurities, the contamination of impurities is significantly reduced in the single crystal grown using the present invention.

【0036】なお、本発明の装置において、融液近傍の
部品の材質としては石英、カ―ボンが望ましいが、特に
融液に触れる部分については高純度の石英にするのが望
ましい。
In the apparatus of the present invention, quartz or carbon is preferable as the material for the parts near the melt, but it is particularly desirable to use high-purity quartz for the parts that come into contact with the melt.

【0037】なお前記実施例では小さい孔を弧をなすよ
うに配列したが、図3に変形例を示すように断面円形の
孔を所定の密度で配列するようにしてもよい。また小孔
に取り付けられる小筒は省略しても良い。
In the above embodiment, the small holes are arranged in an arc, but as shown in a modification shown in FIG. 3, holes with a circular cross section may be arranged at a predetermined density. Further, the small tube attached to the small hole may be omitted.

【0038】また前記実施例では、隔離板50の内円筒
3の下端部は、軸方向に対して垂直に縮径部が形成され
、固液界面近傍で単結晶との間隔が急激に小さくなって
いるが、図4に隔離板51として示すように徐々に単結
晶との間隔が小さくなるテーパ形状としてもよい。
Furthermore, in the above embodiment, the lower end of the inner cylinder 3 of the separator 50 is formed with a diameter-reduced portion perpendicular to the axial direction, and the distance from the single crystal near the solid-liquid interface is rapidly reduced. However, as shown in FIG. 4 as a separator 51, it may have a tapered shape in which the distance from the single crystal gradually decreases.

【0039】さらに、本発明は前記実施例に限定される
ことなく、種々の応用例、例えば、シリコン以外の単結
晶の育成、磁場の印加や粒状原料の使用等においても適
用可能である。
Furthermore, the present invention is not limited to the above embodiments, but can be applied to various applications, such as the growth of single crystals other than silicon, the application of a magnetic field, and the use of granular raw materials.

【0040】[0040]

【発明の効果】以上説明してきたように、本発明によれ
ば、引上げ中の単結晶のまわりに所定の間隔を隔てて配
設され、下端部を縮径し、引上げ中の単結晶との間隔が
小さくなるようにした隔離板と、前記るつぼの原料融液
を覆うように所定の高さに配設され、複数の小孔を有す
る下方板とを具備しているため、引上げ中の単結晶と融
液との固液界面での不活性ガスの流速が上昇し、ガス状
不純物を速やかに融液面上より運び去り、しかも逆流を
防ぐことができ、育成中の単結晶にこれら不純物が付着
するのを防止し、高純度でかつ欠陥のない高品質の半導
体単結晶を効率よく得ることが可能となる。
Effects of the Invention As explained above, according to the present invention, the crystals are arranged around the single crystal being pulled at a predetermined interval, and the diameter of the lower end is reduced so as to be connected to the single crystal being pulled. It is equipped with a separator plate with a small interval and a lower plate with a plurality of small holes arranged at a predetermined height so as to cover the raw material melt in the crucible. The flow rate of the inert gas at the solid-liquid interface between the crystal and the melt increases, allowing gaseous impurities to be quickly carried away from the melt surface and preventing backflow. It is possible to prevent the adhesion of particles and to efficiently obtain a high-quality semiconductor single crystal with high purity and no defects.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明の第1の実施例の単結晶育成装置の説明
図。
FIG. 1 is an explanatory diagram of a single crystal growth apparatus according to a first embodiment of the present invention.

【図2】同単結晶育成装置の下方板の斜視図。FIG. 2 is a perspective view of the lower plate of the single crystal growth apparatus.

【図3】本発明の下方板の変形例を示す図。FIG. 3 is a diagram showing a modification of the lower plate of the present invention.

【図4】本発明の第2の実施例の単結晶育成装置を示す
FIG. 4 is a diagram showing a single crystal growth apparatus according to a second embodiment of the present invention.

【符号の説明】[Explanation of symbols]

100  単結晶製造装置本体 200  原料融液部 300  引上げ部 1  引上げ単結晶 2  縮径部 3  内円筒 4  上方板 5  石英るつぼ 6  小孔 6S  小孔 7  下方板 8  ヒータ 9  ペディスタル(るつぼ支持台) 10  るつぼ受け 11  黒鉛るつぼ 13  隔離板 30  外円筒 50  隔離板 51  隔離板 100 Single crystal manufacturing equipment main body 200 Raw material melt section 300 Pulling part 1 Pulled single crystal 2 Reduced diameter part 3 Inner cylinder 4 Upper board 5 Quartz crucible 6 Small hole 6S small hole 7 Lower plate 8 Heater 9 Pedestal (crucible support stand) 10 Crucible holder 11 Graphite crucible 13 Separation plate 30 Outer cylinder 50 Separation plate 51 Separation plate

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】  原料融液を充填したるつぼと、前記る
つぼの周囲に配設され、るつぼ内の原料を溶融し原料融
液を形成する加熱ヒ―タと、前記るつぼ内の溶融原料に
種結晶を浸漬して単結晶を引上げる引上機構とを具備し
た単結晶製造装置において、前記加熱ヒータおよびるつ
ぼの上方を覆い、るつぼ中央に向かって下降し、固液界
面近傍にまで達して下端部ほど縮径して、引上げ領域の
前記単結晶との間に開口部を構成し、この開口部を残し
て前記単結晶製造装置内の気相部を2分する隔離板と、
この隔離板内の原料融液面から一定の高さに、石英るつ
ぼの上方を蓋状に覆うように配設され、複数の小孔を有
する下方板とを具備し、前記隔離板と前記単結晶との間
に不活性ガスを流し、前記下方板に設けた小孔を介して
排出せしめるようにしたことを特徴とする単結晶製造装
置。
1. A crucible filled with a raw material melt; a heating heater disposed around the crucible to melt the raw material in the crucible to form a raw material melt; In a single crystal manufacturing apparatus equipped with a pulling mechanism that immerses the crystal and pulls the single crystal, it covers the heater and the upper part of the crucible, descends toward the center of the crucible, reaches near the solid-liquid interface, and reaches the lower end. a separator whose diameter is reduced by about 100 mm to form an opening between the single crystal in the pulling region and leave this opening to divide the gas phase portion in the single crystal manufacturing apparatus into two;
A lower plate is disposed at a certain height from the surface of the raw material melt in the separator so as to cover the upper part of the quartz crucible in a lid-like manner, and has a plurality of small holes, and the separator and the single 1. An apparatus for producing a single crystal, characterized in that an inert gas is passed between the crystal and the crystal and is discharged through a small hole provided in the lower plate.
【請求項2】  前記小孔は、上方に向かって縮径し先
端が解放となっている円錐状または円錐台状の筒を有し
ていることを特徴とする請求項1に記載の単結晶製造装
置。
2. The single crystal according to claim 1, wherein the small hole has a conical or truncated conical tube whose diameter decreases upward and whose tip is open. Manufacturing equipment.
【請求項3】  原料融液を充填したるつぼと、前記る
つぼの周囲に配設され、るつぼ内の原料を溶融し原料融
液を形成する加熱ヒ―タと、前記るつぼ内の溶融原料に
種結晶を浸漬して単結晶を引上げる引上機構とを具備し
た単結晶製造装置において、引上げ領域の前記単結晶の
まわりに所定の間隔を隔てて配設され、下端部を縮径し
、前記単結晶との間隔が小さくなるようにした内円筒と
、前記るつぼと加熱ヒータ上方を覆う上方板と、前記上
方板の外周に設置された外円筒とからなる隔離板と、前
記るつぼの原料融液を覆うように前記上方板の所定の高
さに配設され、複数の小孔を有する下方板とを具備し、
この円筒と単結晶との間に不活性ガスを流し、前記小孔
を介して排出せしめるようにしたことを特徴とする単結
晶製造装置。
3. A crucible filled with a raw material melt; a heater disposed around the crucible to melt the raw material in the crucible to form a raw material melt; In a single crystal manufacturing apparatus equipped with a pulling mechanism for dipping the crystal and pulling the single crystal, the single crystal is disposed at a predetermined interval around the single crystal in the pulling region, the lower end is reduced in diameter, and the a separator consisting of an inner cylinder with a small distance from the single crystal, an upper plate that covers the crucible and above the heater, and an outer cylinder installed around the outer periphery of the upper plate; a lower plate disposed at a predetermined height of the upper plate so as to cover the liquid and having a plurality of small holes;
A single crystal manufacturing apparatus characterized in that an inert gas is caused to flow between the cylinder and the single crystal and is discharged through the small hole.
JP3131341A 1991-06-03 1991-06-03 Single crystal manufacturing equipment Expired - Lifetime JP2500875B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3131341A JP2500875B2 (en) 1991-06-03 1991-06-03 Single crystal manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3131341A JP2500875B2 (en) 1991-06-03 1991-06-03 Single crystal manufacturing equipment

Publications (2)

Publication Number Publication Date
JPH04357190A true JPH04357190A (en) 1992-12-10
JP2500875B2 JP2500875B2 (en) 1996-05-29

Family

ID=15055680

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3131341A Expired - Lifetime JP2500875B2 (en) 1991-06-03 1991-06-03 Single crystal manufacturing equipment

Country Status (1)

Country Link
JP (1) JP2500875B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009102194A (en) * 2007-10-23 2009-05-14 Tokuyama Corp Metal fluoride single crystalline body pulling apparatus and method of manufacturing metal fluoride single crystalline body using the same apparatus
JP2015086106A (en) * 2013-10-31 2015-05-07 京セラ株式会社 Melting pot, crystal production device, and crystal production method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62138386A (en) * 1985-12-11 1987-06-22 Shin Etsu Handotai Co Ltd Device for pulling single crystal
JPS6442920A (en) * 1987-08-10 1989-02-15 Fujitsu Ltd Ring counter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62138386A (en) * 1985-12-11 1987-06-22 Shin Etsu Handotai Co Ltd Device for pulling single crystal
JPS6442920A (en) * 1987-08-10 1989-02-15 Fujitsu Ltd Ring counter

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009102194A (en) * 2007-10-23 2009-05-14 Tokuyama Corp Metal fluoride single crystalline body pulling apparatus and method of manufacturing metal fluoride single crystalline body using the same apparatus
JP2015086106A (en) * 2013-10-31 2015-05-07 京セラ株式会社 Melting pot, crystal production device, and crystal production method

Also Published As

Publication number Publication date
JP2500875B2 (en) 1996-05-29

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