JPH0429987B2 - - Google Patents

Info

Publication number
JPH0429987B2
JPH0429987B2 JP58098519A JP9851983A JPH0429987B2 JP H0429987 B2 JPH0429987 B2 JP H0429987B2 JP 58098519 A JP58098519 A JP 58098519A JP 9851983 A JP9851983 A JP 9851983A JP H0429987 B2 JPH0429987 B2 JP H0429987B2
Authority
JP
Japan
Prior art keywords
light
receiving element
emitting element
tray
panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58098519A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59222774A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9851983A priority Critical patent/JPS59222774A/ja
Publication of JPS59222774A publication Critical patent/JPS59222774A/ja
Publication of JPH0429987B2 publication Critical patent/JPH0429987B2/ja
Granted legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP9851983A 1983-06-02 1983-06-02 発光素子用試験装置 Granted JPS59222774A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9851983A JPS59222774A (ja) 1983-06-02 1983-06-02 発光素子用試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9851983A JPS59222774A (ja) 1983-06-02 1983-06-02 発光素子用試験装置

Publications (2)

Publication Number Publication Date
JPS59222774A JPS59222774A (ja) 1984-12-14
JPH0429987B2 true JPH0429987B2 (US06272168-20010807-M00014.png) 1992-05-20

Family

ID=14221896

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9851983A Granted JPS59222774A (ja) 1983-06-02 1983-06-02 発光素子用試験装置

Country Status (1)

Country Link
JP (1) JPS59222774A (US06272168-20010807-M00014.png)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62169064A (ja) * 1986-01-21 1987-07-25 Chino Corp 光半導体試験装置
JPS62274274A (ja) * 1986-05-23 1987-11-28 Chino Corp 光半導体素子試験装置
JPS63281078A (ja) * 1987-05-13 1988-11-17 Daito Denshi Kogyo Kk 半導体素子のエ−ジング検査装置
JPH074605Y2 (ja) * 1987-12-23 1995-02-01 ローム株式会社 発光素子の試験装置
JPH06317629A (ja) * 1993-05-10 1994-11-15 Sumitomo Electric Ind Ltd 半導体レーザのエージング方法およびエージング用ボード
JPH072933U (ja) * 1993-06-11 1995-01-17 住友電気工業株式会社 半導体レ−ザ信頼性試験装置
JP4646037B2 (ja) * 2006-11-24 2011-03-09 三菱電機株式会社 バーイン装置槽内ラック

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4511434Y1 (US06272168-20010807-M00014.png) * 1966-06-04 1970-05-21
JPS5128190A (US06272168-20010807-M00014.png) * 1974-07-01 1976-03-09 Snam Progetti
JPS5311959B2 (US06272168-20010807-M00014.png) * 1973-07-12 1978-04-25
JPS5641272B2 (US06272168-20010807-M00014.png) * 1978-07-07 1981-09-26

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5539349Y2 (US06272168-20010807-M00014.png) * 1974-12-27 1980-09-13
JPS5311959U (US06272168-20010807-M00014.png) * 1976-07-12 1978-01-31
JPS5641272U (US06272168-20010807-M00014.png) * 1979-09-05 1981-04-16

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4511434Y1 (US06272168-20010807-M00014.png) * 1966-06-04 1970-05-21
JPS5311959B2 (US06272168-20010807-M00014.png) * 1973-07-12 1978-04-25
JPS5128190A (US06272168-20010807-M00014.png) * 1974-07-01 1976-03-09 Snam Progetti
JPS5641272B2 (US06272168-20010807-M00014.png) * 1978-07-07 1981-09-26

Also Published As

Publication number Publication date
JPS59222774A (ja) 1984-12-14

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