JPH0427931A - Contact type exposure device - Google Patents

Contact type exposure device

Info

Publication number
JPH0427931A
JPH0427931A JP2135113A JP13511390A JPH0427931A JP H0427931 A JPH0427931 A JP H0427931A JP 2135113 A JP2135113 A JP 2135113A JP 13511390 A JP13511390 A JP 13511390A JP H0427931 A JPH0427931 A JP H0427931A
Authority
JP
Japan
Prior art keywords
disk
mask
exposed
pressure
exposed object
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2135113A
Other languages
Japanese (ja)
Inventor
Akira Shibata
芝田 章
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP2135113A priority Critical patent/JPH0427931A/en
Publication of JPH0427931A publication Critical patent/JPH0427931A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/707Chucks, e.g. chucking or un-chucking operations or structural details
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70841Constructional issues related to vacuum environment, e.g. load-lock chamber

Abstract

PURPOSE:To prevent the reduction of the yield due to a defect of contact by providing a pressurizing mechanism, which applies a pressure to a mask from the rear face of a body to be exposed, to resolve the slip due to the surface shape like waviness of the body to be exposed. CONSTITUTION:A disk 6 is placed on a disk chuck 5, and a vacuum pump 7 is operated to suck the disk 6 by vacuum. A mask 1 is aligned to the disk 6 and is placed on a spacer 2. Thereafter, a vacuum pump 3 is operated to evacuate the gap between the mask 1 and the disk 6. Then, the mask 1 is curved to the surface of the disk by the air pressure and is closely brought into contact with the disk 6. Next, a pressure pump 8 is operated to apply a pressure to the disk 6 from the rear face of the disk 6 through a pressure hole 5c. Thus, the mask 1 and the disk 6 are completely brought into contact with each other even in outermost peripheral parts because the disk 6 is curved in the surface direction.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 この発明は、例えば被露光体であるガラス基板に溝を形
成するためにマスクをガラス基板に密着させて露光をお
こなう密着型露光装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application This invention relates to a contact exposure apparatus that performs exposure by bringing a mask into close contact with a glass substrate, for example, in order to form grooves on a glass substrate, which is an object to be exposed. .

(ロ)従来の技術 従来この種の密着型露光装置は、第2図に示すように、
例えばノリコンウェハやガラスディスクなどの被露光体
20を吸着する真空チャック2Iを存するディスクチャ
ック台22と、真空引穴24を有しマスク23がセット
されるスペーサ25と、被露光体20に光ヒームを照射
する光源26とで構成される。
(b) Conventional technology Conventionally, this type of contact exposure apparatus has the following features, as shown in FIG.
For example, a disk chuck stand 22 includes a vacuum chuck 2I for adsorbing an object 20 to be exposed such as a Noricon wafer or a glass disk, a spacer 25 having a vacuum hole 24 and into which a mask 23 is set, and a spacer 25 for attaching an optical beam to the object 20 to be exposed. It is composed of a light source 26 that emits light.

上記の構成において、ディスクチャック台22に被露光
体20がセットされ、スペーサ25上にマスク23が載
置されたのち、真空引穴24を介して真空引きされると
、マスク23か外気圧により押されて被露光体20側へ
湾曲し、被露光体20に密着する。
In the above configuration, after the exposed object 20 is set on the disk chuck stand 22 and the mask 23 is placed on the spacer 25, when the vacuum is drawn through the vacuum hole 24, the mask 23 is moved by the external pressure. It is pushed and curves toward the exposed object 20, and comes into close contact with the exposed object 20.

(ハ)発明が解決しようとする課題 しかしながら上記の構成においては、被露光体20とマ
スク23とのそれぞれの密着される側の表面形状にズレ
がある場合、マスク23の湾曲だけでは密着し切れない
場合があった。このような場合、不完全な密着のために
露光不良をおこすことかめっf二。
(c) Problems to be Solved by the Invention However, in the above configuration, if there is a deviation in the surface shape of the exposed object 20 and the mask 23 on the sides that are brought into close contact with each other, the curvature of the mask 23 alone will not be enough to bring them into close contact. There were cases where there was none. In such cases, poor exposure may occur due to incomplete adhesion.

この発明:よ上記の事情を考慮してtされf二らので、
表面1ざ、平坦度、平行度ことのマスクと被露光体との
表面形状に差かある場合でも、マスクと被露光体との密
着度を高めることかできる密着型露光装置を提供しよう
とするものである。
This invention: In view of the above circumstances,
To provide a contact type exposure device capable of increasing the degree of adhesion between a mask and an exposed object even when there is a difference in surface shape between the mask and the exposed object, such as surface roughness, flatness, and parallelism. It is something.

(ニ)課題を解決するための手段 この発明は、表面にレジストが璽布されfこ円盤状の被
露光体をその裏面の外周部において吸着して保持する保
持機構と、保持機構に保持された被露光体の表面にマス
クを密着させる密着機構と、少なくとも被露光体の情報
記録領域となる部分を被露光体の裏面よりマスク方向に
加圧する加圧機構と、マスクか密着された被露光体に光
ヒームを照射する光源と、を備えてなる密着型露光装置
である。
(d) Means for Solving the Problems The present invention includes a holding mechanism that sucks and holds a disk-shaped object to be exposed, the surface of which is coated with resist, on the outer periphery of its back surface, and a contact mechanism that brings the mask into close contact with the surface of the exposed object, a pressure mechanism that presses at least a portion of the exposed object that will become the information recording area from the back surface of the exposed object in the direction of the mask, and an exposed object that is in close contact with the mask. This is a contact exposure device that includes a light source that irradiates the body with a beam of light.

(ホ)作用 保持機構か保持している円盤状の被露光体の表面に、密
着機構かマスクを密着さける。この場合に、加圧機構が
少なくとも被露光体の情報記録領域となる部分を被露光
体の裏面よりマスク方向に加圧する。これによって被露
光体D\マスタ方向に少許湾曲し、披露″に体とマスク
と′:)密着度か高められろ。
(e) Place the contact mechanism or mask in close contact with the surface of the disc-shaped exposed object held by the action holding mechanism. In this case, the pressure mechanism presses at least a portion of the exposed object that will become the information recording area from the back surface of the exposed object in the direction of the mask. As a result, the exposed object D is slightly curved in the direction of the master, and the degree of close contact between the exposed body and the mask can be increased.

そして光源が光ヒームを被露光体に照射して、被露光体
表面のレジストか露光される。
Then, the light source irradiates the object to be exposed with a beam of light, and the resist on the surface of the object to be exposed is exposed.

(へ)実施例 以下この発明の実施例を図面にて詳述するか、この発明
は以下の実施例に限定されるものではない。
(F) EXAMPLES Hereinafter, examples of the present invention will be described in detail with reference to the drawings, but the present invention is not limited to the following examples.

第1図において、lはマスクで、例えば直径150mm
、厚さ5mm、平坦度5μmのガラスで形成されている
。マスク【は、真空引穴2aを有するスペーサ2の上面
に載置されている。スペーサ2の中央部には開口2bが
設けられておりこの開口2bに連通ずる真空引穴5には
真空ポンプ3が接続されている。スペーサ2及び真空ポ
ンプ3とて密着機構4が構成される。
In Fig. 1, l is a mask, for example, 150 mm in diameter.
It is made of glass with a thickness of 5 mm and a flatness of 5 μm. The mask [ is placed on the upper surface of the spacer 2 having the vacuum hole 2a. An opening 2b is provided in the center of the spacer 2, and a vacuum pump 3 is connected to a vacuum hole 5 communicating with the opening 2b. The spacer 2 and the vacuum pump 3 constitute a close contact mechanism 4.

5はディスクチャック台で、円盤状の被露光体(以下デ
ィスクと記す)6を、その裏面の外周部において真空吸
着すべく、真空ポンプ7に接続される環状間隙5aを何
している。まrニブイスクチャツク台5の中央部分には
、ディスク6をその裏面より加圧するにめに、加圧室5
bか形成されており、加圧室5bは加圧穴5cを介して
加圧ポンプ8に接続されている。上記において、ディス
クチャック台5と真空ポツプ6とて保持機構9か、また
加圧室5b、加圧穴5c及び加圧ポンプ8とて加圧機構
10が、それぞれ構成される。
Reference numeral 5 denotes a disk chuck stand, which has an annular gap 5a connected to a vacuum pump 7 in order to vacuum-adsorb a disk-shaped object to be exposed (hereinafter referred to as disk) 6 at the outer periphery of its back surface. A pressurizing chamber 5 is provided in the center of the nib screw holder 5 in order to pressurize the disk 6 from the back side thereof.
b is formed, and the pressurizing chamber 5b is connected to the pressurizing pump 8 via the pressurizing hole 5c. In the above, the disc chuck stand 5 and the vacuum pop 6 constitute the holding mechanism 9, and the pressurizing chamber 5b, the pressurizing hole 5c and the pressurizing pump 8 constitute the pressurizing mechanism 10, respectively.

ディスク6は、例えば直径130 m m 、厚さ12
mm、平坦度20μmのガラスからなり、その表面に厚
み約2000人のレジスト膜かコーティングされている
The disk 6 has a diameter of 130 mm and a thickness of 12 mm, for example.
It is made of glass with a flatness of 20 μm and its surface is coated with a resist film approximately 2000 mm thick.

マスク1は、スペーサ2によってディスク6の表面との
間隔が例えば10μのとなるようにセットされる。
The mask 1 is set with a spacer 2 such that the distance from the surface of the disk 6 is, for example, 10 μ.

なお、スペーサ4及びディスクチャック台5の、マスク
I及びディスク6か載置される部位の表面は、充分な密
着性が得られるよう加工されている。
Incidentally, the surfaces of the spacer 4 and the disk chuck table 5 at the portions on which the mask I and the disk 6 are placed are processed so as to obtain sufficient adhesion.

11は光源で、ディスクチャック台5上方の所定位置に
配設されており、例えば紫外線をディスク6に照射する
ものである。
A light source 11 is disposed at a predetermined position above the disk chuck table 5 and irradiates the disk 6 with, for example, ultraviolet light.

以上の構成において、ディスク6かディスクチャック台
5上に載置され、真空ポンプ7か作動されてディスク6
が真空吸着される。またマスク1かディスク6と位置合
わせされてスペーサ2上に載置される。この後、真空ポ
ンプ3が作動され、マスクIとディスク6との間隙の真
空度か例えば約300mmF(gに保持される。これに
よって、マスクlか、外気圧によりディスク6表面側に
湾曲してディスク6に密着する。
In the above configuration, the disk 6 is placed on the disk chuck stand 5, and the vacuum pump 7 is operated to hold the disk 6.
is vacuum-adsorbed. Further, it is placed on the spacer 2 in alignment with the mask 1 or the disk 6. After this, the vacuum pump 3 is activated, and the degree of vacuum in the gap between the mask I and the disk 6 is maintained at, for example, about 300 mmF (g. It comes into close contact with the disc 6.

次に加圧ポツプ8か作動され、加圧穴5cを介してディ
スク6裏面よりディスク6を例えば約05kg/cm”
の圧力で加圧する(この圧力は1気圧であってもよい)
、、これによってディスク6がその表面方向に湾曲する
ので、マスクlとディスク6とがその最外周部位におい
ても完全に密着し、その部位の密着不良か発生しなくな
る。
Next, the pressurizing pop 8 is activated, and the disk 6 is pushed from the back side of the disk 6 through the pressurizing hole 5c to a pressure of, for example, about 05 kg/cm.
(This pressure may be 1 atm)
As a result, the disk 6 is curved in the direction of its surface, so that the mask 1 and the disk 6 are brought into complete contact with each other even at the outermost circumferential portion, and there is no possibility of poor adhesion at that portion.

なお、ディスク6を加圧しない場合は、ディスク6の最
外周部位の一部すなわち半径方向に約2mm、円周方向
に約30mmの範囲において密着不良が発生しf二。
Note that when the disk 6 is not pressurized, poor adhesion occurs in a part of the outermost portion of the disk 6, that is, in a range of about 2 mm in the radial direction and about 30 mm in the circumferential direction.

上記実施例においては、ディスク6が円盤状でその中央
部の穴のないしのに対応する装置を説明したが、ディス
クか例えばコンパクトディスクのように中心に中心穴を
存する、例えば外径130m m 、内径15mmのガ
ラス基板であっても、以下に述へるような構成とするこ
とによって対応することができる。その場合、上記実施
例を多少変形し、ディスクの中心式近傍部位に対応して
、ディスクチャック台に上記実施例における環状間隙を
有する載置台あるいは真空チャック機構を設け、加圧室
の圧力がディスクの中心穴から漏洩しないように構成す
ればよい。
In the above embodiment, the disk 6 is disk-shaped and has a hole in the center. Even a glass substrate with an inner diameter of 15 mm can be accommodated by the configuration described below. In that case, the above embodiment may be slightly modified, and the disk chuck table may be provided with a mounting table having an annular gap or a vacuum chuck mechanism in the above embodiment, corresponding to the central area of the disk, so that the pressure in the pressurizing chamber can be adjusted to the disk. The structure should be such that it does not leak from the center hole.

(ト)発明の効果 この発明によれば、被露光体をその裏面から加圧するの
で、マスクの湾曲に加え、被露光体が湾曲させられるの
で、両者のそり、うねりなどの表面形状に起因するズレ
が解消され、マスクと被露光との密着度が増加し、密着
不良による歩留りの低下を防止することかできる。
(G) Effects of the Invention According to this invention, since the exposed object is pressurized from its back surface, in addition to the curvature of the mask, the exposed object is also curved. The misalignment is eliminated, the degree of adhesion between the mask and the exposed object is increased, and a decrease in yield due to poor adhesion can be prevented.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の実施例の構成を示す構成説明図、第
2図は従来例の構成を示す構成説明図である。 ■・・・・・マスク、4・・・・・・密着機構、6・・
・・・・被露光体、9・・・・・保持機構、10・・・
・・・加圧機構、11・・・・・光源。
FIG. 1 is a configuration explanatory diagram showing the configuration of an embodiment of the present invention, and FIG. 2 is a configuration explanatory diagram showing the configuration of a conventional example. ■...Mask, 4...Adherence mechanism, 6...
...Exposed object, 9...Holding mechanism, 10...
... Pressure mechanism, 11... Light source.

Claims (1)

【特許請求の範囲】 1、表面にレジストが塗布された円盤状の被露光体をそ
の裏面の外周部において吸着して保持する保持機構と、 保持機構に保持された被露光体の表面にマスクを密着さ
せる密着機構と、 少なくとも被露光体の情報記録領域となる部分を被露光
体の裏面よりマスク方向に加圧する加圧機構と、 マスクが密着された被露光体に光ビームを照射する光源
と、 を備えてなる密着型露光装置。
[Scope of Claims] 1. A holding mechanism that adsorbs and holds a disc-shaped exposed object whose surface is coated with resist at the outer periphery of its back surface, and a mask on the surface of the exposed object held by the holding mechanism. a pressure mechanism that presses at least a portion of the exposed object that will become an information recording area from the back surface of the exposed object toward the mask; and a light source that irradiates the exposed object with the mask in close contact with a light beam. A contact exposure device equipped with the following.
JP2135113A 1990-05-23 1990-05-23 Contact type exposure device Pending JPH0427931A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2135113A JPH0427931A (en) 1990-05-23 1990-05-23 Contact type exposure device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2135113A JPH0427931A (en) 1990-05-23 1990-05-23 Contact type exposure device

Publications (1)

Publication Number Publication Date
JPH0427931A true JPH0427931A (en) 1992-01-30

Family

ID=15144138

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2135113A Pending JPH0427931A (en) 1990-05-23 1990-05-23 Contact type exposure device

Country Status (1)

Country Link
JP (1) JPH0427931A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007134368A (en) * 2005-11-08 2007-05-31 Nikon Corp Pattern transferring apparatus, aligner, and pattern transfer method
JP2007305895A (en) * 2006-05-15 2007-11-22 Apic Yamada Corp Imprinting method, and nano-imprinting apparatus
JP2010517300A (en) * 2007-01-29 2010-05-20 ヒューレット−パッカード デベロップメント カンパニー エル.ピー. Contact lithography apparatus and method using substrate deformation
JP2013089692A (en) * 2011-10-14 2013-05-13 Denso Corp Semiconductor device manufacturing method
CN103901736A (en) * 2014-01-25 2014-07-02 保定来福光电科技有限公司 Method of depth fitting of operation film in exposure machine

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58173727A (en) * 1982-04-05 1983-10-12 Canon Inc Contacting method of body in contact printing process

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58173727A (en) * 1982-04-05 1983-10-12 Canon Inc Contacting method of body in contact printing process

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007134368A (en) * 2005-11-08 2007-05-31 Nikon Corp Pattern transferring apparatus, aligner, and pattern transfer method
JP2007305895A (en) * 2006-05-15 2007-11-22 Apic Yamada Corp Imprinting method, and nano-imprinting apparatus
JP2010517300A (en) * 2007-01-29 2010-05-20 ヒューレット−パッカード デベロップメント カンパニー エル.ピー. Contact lithography apparatus and method using substrate deformation
JP2013089692A (en) * 2011-10-14 2013-05-13 Denso Corp Semiconductor device manufacturing method
CN103901736A (en) * 2014-01-25 2014-07-02 保定来福光电科技有限公司 Method of depth fitting of operation film in exposure machine

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