JPH0422335B2 - - Google Patents

Info

Publication number
JPH0422335B2
JPH0422335B2 JP59101436A JP10143684A JPH0422335B2 JP H0422335 B2 JPH0422335 B2 JP H0422335B2 JP 59101436 A JP59101436 A JP 59101436A JP 10143684 A JP10143684 A JP 10143684A JP H0422335 B2 JPH0422335 B2 JP H0422335B2
Authority
JP
Japan
Prior art keywords
semiconductor device
measuring
handling device
handling
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59101436A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60245142A (ja
Inventor
Ryozo Fujiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP59101436A priority Critical patent/JPS60245142A/ja
Publication of JPS60245142A publication Critical patent/JPS60245142A/ja
Publication of JPH0422335B2 publication Critical patent/JPH0422335B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP59101436A 1984-05-19 1984-05-19 半導体装置用ハンドリング装置 Granted JPS60245142A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59101436A JPS60245142A (ja) 1984-05-19 1984-05-19 半導体装置用ハンドリング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59101436A JPS60245142A (ja) 1984-05-19 1984-05-19 半導体装置用ハンドリング装置

Publications (2)

Publication Number Publication Date
JPS60245142A JPS60245142A (ja) 1985-12-04
JPH0422335B2 true JPH0422335B2 (enExample) 1992-04-16

Family

ID=14300638

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59101436A Granted JPS60245142A (ja) 1984-05-19 1984-05-19 半導体装置用ハンドリング装置

Country Status (1)

Country Link
JP (1) JPS60245142A (enExample)

Also Published As

Publication number Publication date
JPS60245142A (ja) 1985-12-04

Similar Documents

Publication Publication Date Title
KR950006472A (ko) 프로브카드, 프로브카드용 동축 프로브빔 및 그 제조방법
JPH06103333B2 (ja) 高周波特性測定装置
JP3243752B2 (ja) ガス絶縁機器の部分放電検出装置およびその校正方法
DE60029483D1 (de) Nicht-invasive elektrische messung von halbleiterscheiben
TW538249B (en) Charge measurement device
JPS60123666U (ja) 回路基板等の検査装置
US4308498A (en) Kelvin test fixture for electrically contacting miniature, two terminal, leadless, electrical components
CN1173186C (zh) 高频电流检测仪
JPH0422335B2 (enExample)
JPS58101434A (ja) プロ−ブカ−ド
JPH08146046A (ja) 非接触型電圧プローブ装置
JPS6143854B2 (enExample)
JPH0742140Y2 (ja) プローブのアース構造
JPS63279179A (ja) 集積回路装置の測定用ソケット
JPS592533Y2 (ja) 部分放電測定器用リ−ド線コネクタ
JPS5889835A (ja) グランドピン
JPS5828360Y2 (ja) Ｉｃクリツプ
JPS6356951B2 (enExample)
JPH02297881A (ja) オートハンドラ用電極
JPS57114866A (en) Measuring device of semiconductor device
JPS5942707Y2 (ja) ハンドリング装置の電極子
JPH0443821Y2 (enExample)
JPS61195341A (ja) 含水率測定装置
JPH07218541A (ja) 回路基板検査装置
JPH06186284A (ja) アダプタソケット

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term