JPH0419503Y2 - - Google Patents

Info

Publication number
JPH0419503Y2
JPH0419503Y2 JP1984165317U JP16531784U JPH0419503Y2 JP H0419503 Y2 JPH0419503 Y2 JP H0419503Y2 JP 1984165317 U JP1984165317 U JP 1984165317U JP 16531784 U JP16531784 U JP 16531784U JP H0419503 Y2 JPH0419503 Y2 JP H0419503Y2
Authority
JP
Japan
Prior art keywords
circuit board
base
probe
guide
guide plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1984165317U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6180469U (US07709020-20100504-C00041.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1984165317U priority Critical patent/JPH0419503Y2/ja
Publication of JPS6180469U publication Critical patent/JPS6180469U/ja
Application granted granted Critical
Publication of JPH0419503Y2 publication Critical patent/JPH0419503Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)
JP1984165317U 1984-10-31 1984-10-31 Expired JPH0419503Y2 (US07709020-20100504-C00041.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1984165317U JPH0419503Y2 (US07709020-20100504-C00041.png) 1984-10-31 1984-10-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1984165317U JPH0419503Y2 (US07709020-20100504-C00041.png) 1984-10-31 1984-10-31

Publications (2)

Publication Number Publication Date
JPS6180469U JPS6180469U (US07709020-20100504-C00041.png) 1986-05-28
JPH0419503Y2 true JPH0419503Y2 (US07709020-20100504-C00041.png) 1992-05-01

Family

ID=30723170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1984165317U Expired JPH0419503Y2 (US07709020-20100504-C00041.png) 1984-10-31 1984-10-31

Country Status (1)

Country Link
JP (1) JPH0419503Y2 (US07709020-20100504-C00041.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101506663B1 (ko) * 2013-10-18 2015-03-30 주식회사 에스에프이 유체 공급 장치

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6658048B2 (ja) * 2016-02-15 2020-03-04 富士ゼロックス株式会社 検査装置、検査装置の製造方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54124964A (en) * 1978-03-10 1979-09-28 Rockwell International Corp Voltage level shifter
JPS5530368B2 (US07709020-20100504-C00041.png) * 1976-02-18 1980-08-11
JPS5834063B2 (ja) * 1979-05-01 1983-07-23 日本電信電話株式会社 デイジタル通信装置の監視方式
JPS6184568A (ja) * 1984-10-02 1986-04-30 Yokowo Mfg Co Ltd インサ−キツトテスタ

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5824094Y2 (ja) * 1978-08-19 1983-05-23 ブラザー工業株式会社 加熱調理器
JPS56144365U (US07709020-20100504-C00041.png) * 1980-03-31 1981-10-30
JPS57101974U (US07709020-20100504-C00041.png) * 1980-12-12 1982-06-23
JPS5834063U (ja) * 1981-08-31 1983-03-05 株式会社日立製作所 インサ−キツトテスタ用万能接続治具
JPS5882680U (ja) * 1981-11-30 1983-06-04 スタンレー電気株式会社 基板試験用接続装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5530368B2 (US07709020-20100504-C00041.png) * 1976-02-18 1980-08-11
JPS54124964A (en) * 1978-03-10 1979-09-28 Rockwell International Corp Voltage level shifter
JPS5834063B2 (ja) * 1979-05-01 1983-07-23 日本電信電話株式会社 デイジタル通信装置の監視方式
JPS6184568A (ja) * 1984-10-02 1986-04-30 Yokowo Mfg Co Ltd インサ−キツトテスタ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101506663B1 (ko) * 2013-10-18 2015-03-30 주식회사 에스에프이 유체 공급 장치

Also Published As

Publication number Publication date
JPS6180469U (US07709020-20100504-C00041.png) 1986-05-28

Similar Documents

Publication Publication Date Title
JPH022547B2 (US07709020-20100504-C00041.png)
JP2006302906A (ja) 集積回路素子用ソケット及び回路基板
JP2007017234A (ja) 検査装置用ソケット
CN104614610A (zh) 一种测试pcba的模块化针床工装
JPH1164426A (ja) プリント基板の検査装置およびプリント基板の検査 装置の組み立てキット
KR102622884B1 (ko) 전기적 접속장치
JP4175492B2 (ja) プリント基板検査治具
JPH0419503Y2 (US07709020-20100504-C00041.png)
JPH048381Y2 (US07709020-20100504-C00041.png)
JP2006324057A (ja) プリント基板へのプレスフィット端子の圧入方法および圧入装置
JPH075228A (ja) バーンインテスト用接触装置
JPH0385456A (ja) プローバ
US20050083071A1 (en) Electronic circuit assembly test apparatus
KR0127183Y1 (ko) 클램프 지그 장치
KR20000009830U (ko) 인쇄회로기판 검사장치
JP3125450B2 (ja) プリント配線板の検査治具
JPH0630780U (ja) プリント基板検査装置
JP2759451B2 (ja) プリント基板検査治具
US20240241153A1 (en) Spring probe contact assembly
JP2609860B2 (ja) プリント基板検査治具用ピン
JPH0441342Y2 (US07709020-20100504-C00041.png)
JPH0438299Y2 (US07709020-20100504-C00041.png)
JPH06294815A (ja) 実装部品の検査方法
JPH1026646A (ja) コンタクト装置
KR20000015694U (ko) 인쇄회로기판 검사기구 및 상기 검사기구를 구비한 인쇄회로기