JPH0411179Y2 - - Google Patents
Info
- Publication number
- JPH0411179Y2 JPH0411179Y2 JP1983200706U JP20070683U JPH0411179Y2 JP H0411179 Y2 JPH0411179 Y2 JP H0411179Y2 JP 1983200706 U JP1983200706 U JP 1983200706U JP 20070683 U JP20070683 U JP 20070683U JP H0411179 Y2 JPH0411179 Y2 JP H0411179Y2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- open
- short
- threshold
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20070683U JPS60111278U (ja) | 1983-12-29 | 1983-12-29 | オ−プン/シヨ−トインサ−キツトテスタ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20070683U JPS60111278U (ja) | 1983-12-29 | 1983-12-29 | オ−プン/シヨ−トインサ−キツトテスタ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60111278U JPS60111278U (ja) | 1985-07-27 |
JPH0411179Y2 true JPH0411179Y2 (ko) | 1992-03-19 |
Family
ID=30761806
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20070683U Granted JPS60111278U (ja) | 1983-12-29 | 1983-12-29 | オ−プン/シヨ−トインサ−キツトテスタ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60111278U (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013242251A (ja) * | 2012-05-22 | 2013-12-05 | Hioki Ee Corp | 導通検査装置及び導通検査方法 |
US9423444B2 (en) * | 2013-07-29 | 2016-08-23 | Biosense Webster (Israel), Ltd. | Identifying defective electrical cables |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6319811Y2 (ko) * | 1980-10-20 | 1988-06-02 |
-
1983
- 1983-12-29 JP JP20070683U patent/JPS60111278U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60111278U (ja) | 1985-07-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4742808A (en) | Method and system for recognizing the readiness for operation of an oxygen measurement sensor | |
JP3392029B2 (ja) | Icテスタの電圧印加電流測定回路 | |
JPH1054851A (ja) | 電源出力電流測定装置 | |
US7404119B2 (en) | Circuit for testing power down reset function of an electronic device | |
JPH0411179Y2 (ko) | ||
US4862069A (en) | Method of in-circuit testing | |
JP4080550B2 (ja) | 接続テスト方法 | |
JPH07104366B2 (ja) | 電流測定回路 | |
JPH07221613A (ja) | トリガ回路 | |
JPH0645909Y2 (ja) | Ic試験装置 | |
CN111123106B (zh) | 传感器和用于检查传感器的方法 | |
ES554718A0 (es) | Procedimiento de medicion para determinar la calidad de una bateria preferentemente de un acumulador de plomo. | |
JP2001091562A (ja) | 回路基板検査装置 | |
JPS641649Y2 (ko) | ||
US6445207B1 (en) | IC tester and IC test method | |
JP2723688B2 (ja) | 半導体集積回路の周波数特性測定装置 | |
JPH095368A (ja) | 巻線抵抗の測定方法 | |
JPS63135881A (ja) | 電源回路 | |
JPH0634705Y2 (ja) | Ic試験装置 | |
JPH07183346A (ja) | 半導体テスト装置 | |
JPH04307Y2 (ko) | ||
CN117147000A (zh) | 三线制热电阻检测电路、方法、线路板、设备及存储介质 | |
JP2827233B2 (ja) | 半導体試験装置 | |
JPH07244126A (ja) | 検査装置 | |
JPH0422307Y2 (ko) |