JPH0411167Y2 - - Google Patents

Info

Publication number

JPH0411167Y2

JPH0411167Y2 JP1984150918U JP15091884U JPH0411167Y2 JP H0411167 Y2 JPH0411167 Y2 JP H0411167Y2 JP 1984150918 U JP1984150918 U JP 1984150918U JP 15091884 U JP15091884 U JP 15091884U JP H0411167 Y2 JPH0411167 Y2 JP H0411167Y2

Authority

JP

Japan

Prior art keywords

contact

contact needle

measured

storage box

electrical resistance

Prior art date

1984-10-05

Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Expired

Links

• Espacenet
• Global Dossier
• Discuss

• 238000005259 measurement Methods 0.000 claims description 16
• 239000000523 sample Substances 0.000 claims description 14
• 238000005498 polishing Methods 0.000 claims description 11
• 238000001514 detection method Methods 0.000 claims description 7
• WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 4
• 230000008878 coupling Effects 0.000 description 3
• 238000010168 coupling process Methods 0.000 description 3
• 238000005859 coupling reaction Methods 0.000 description 3
• 230000007547 defect Effects 0.000 description 3
• 238000010586 diagram Methods 0.000 description 3
• POIUWJQBRNEFGX-XAMSXPGMSA-N cathelicidin Chemical compound C([C@@H](C(=O)N[C@@H](CCCNC(N)=N)C(=O)N[C@@H](CCCCN)C(=O)N[C@@H](CO)C(=O)N[C@@H](CCCCN)C(=O)N[C@@H](CCC(O)=O)C(=O)N[C@@H](CCCCN)C(=O)N[C@@H]([C@@H](C)CC)C(=O)NCC(=O)N[C@@H](CCCCN)C(=O)N[C@@H](CCC(O)=O)C(=O)N[C@@H](CC=1C=CC=CC=1)C(=O)N[C@@H](CCCCN)C(=O)N[C@@H](CCCNC(N)=N)C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](C(C)C)C(=O)N[C@@H](CCC(N)=O)C(=O)N[C@@H](CCCNC(N)=N)C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](CCCCN)C(=O)N[C@@H](CC(O)=O)C(=O)N[C@@H](CC=1C=CC=CC=1)C(=O)N[C@@H](CC(C)C)C(=O)N[C@@H](CCCNC(N)=N)C(=O)N[C@@H](CC(N)=O)C(=O)N[C@@H](CC(C)C)C(=O)N[C@@H](C(C)C)C(=O)N1[C@@H](CCC1)C(=O)N[C@@H](CCCNC(N)=N)C(=O)N[C@@H]([C@@H](C)O)C(=O)N[C@@H](CCC(O)=O)C(=O)N[C@@H](CO)C(O)=O)NC(=O)[C@H](CC=1C=CC=CC=1)NC(=O)[C@H](CC(O)=O)NC(=O)CNC(=O)[C@H](CC(C)C)NC(=O)[C@@H](N)CC(C)C)C1=CC=CC=C1 POIUWJQBRNEFGX-XAMSXPGMSA-N 0.000 description 2
• 230000001934 delay Effects 0.000 description 2
• 239000002184 metal Substances 0.000 description 2
• 238000000034 method Methods 0.000 description 2
• 238000002360 preparation method Methods 0.000 description 2
• 238000011088 calibration curve Methods 0.000 description 1
• 230000000694 effects Effects 0.000 description 1
• 238000005516 engineering process Methods 0.000 description 1
• 239000011810 insulating material Substances 0.000 description 1
• 238000009659 non-destructive testing Methods 0.000 description 1
• 238000003825 pressing Methods 0.000 description 1