JPH0397676U - - Google Patents
Info
- Publication number
- JPH0397676U JPH0397676U JP632690U JP632690U JPH0397676U JP H0397676 U JPH0397676 U JP H0397676U JP 632690 U JP632690 U JP 632690U JP 632690 U JP632690 U JP 632690U JP H0397676 U JPH0397676 U JP H0397676U
- Authority
- JP
- Japan
- Prior art keywords
- magazine
- support section
- components
- component
- loaded
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 claims description 7
- 230000002950 deficient Effects 0.000 claims description 3
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP632690U JPH0712947Y2 (ja) | 1990-01-26 | 1990-01-26 | 部品試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP632690U JPH0712947Y2 (ja) | 1990-01-26 | 1990-01-26 | 部品試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0397676U true JPH0397676U (enrdf_load_stackoverflow) | 1991-10-08 |
JPH0712947Y2 JPH0712947Y2 (ja) | 1995-03-29 |
Family
ID=31510003
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP632690U Expired - Fee Related JPH0712947Y2 (ja) | 1990-01-26 | 1990-01-26 | 部品試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0712947Y2 (enrdf_load_stackoverflow) |
-
1990
- 1990-01-26 JP JP632690U patent/JPH0712947Y2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH0712947Y2 (ja) | 1995-03-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |