JPH0712947Y2 - 部品試験装置 - Google Patents
部品試験装置Info
- Publication number
- JPH0712947Y2 JPH0712947Y2 JP632690U JP632690U JPH0712947Y2 JP H0712947 Y2 JPH0712947 Y2 JP H0712947Y2 JP 632690 U JP632690 U JP 632690U JP 632690 U JP632690 U JP 632690U JP H0712947 Y2 JPH0712947 Y2 JP H0712947Y2
- Authority
- JP
- Japan
- Prior art keywords
- magazine
- parts
- defective
- component
- tray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims description 43
- 230000002950 deficient Effects 0.000 claims description 54
- 230000032258 transport Effects 0.000 description 17
- 230000003028 elevating effect Effects 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 5
- 238000013102 re-test Methods 0.000 description 5
- 230000007547 defect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP632690U JPH0712947Y2 (ja) | 1990-01-26 | 1990-01-26 | 部品試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP632690U JPH0712947Y2 (ja) | 1990-01-26 | 1990-01-26 | 部品試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0397676U JPH0397676U (enrdf_load_stackoverflow) | 1991-10-08 |
JPH0712947Y2 true JPH0712947Y2 (ja) | 1995-03-29 |
Family
ID=31510003
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP632690U Expired - Fee Related JPH0712947Y2 (ja) | 1990-01-26 | 1990-01-26 | 部品試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0712947Y2 (enrdf_load_stackoverflow) |
-
1990
- 1990-01-26 JP JP632690U patent/JPH0712947Y2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH0397676U (enrdf_load_stackoverflow) | 1991-10-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3591679B2 (ja) | Ic用トレイ取出装置及びic用トレイ収納装置 | |
KR100200378B1 (ko) | 아이씨 핸들러용 디바이스 반송 장치 및 디바이스 재검사 방법 | |
JP2921937B2 (ja) | Ic検査装置 | |
US6066822A (en) | Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus | |
JP3136613B2 (ja) | 半導体デバイス試験装置及びこの試験装置に使用されるテストトレイ | |
JP3016982B2 (ja) | 自動テスト用ハンドラーのトレイを取り扱う装置およびその方法 | |
US5313156A (en) | Apparatus for automatic handling | |
US6354792B1 (en) | IC receiving tray storage device and mounting apparatus for the same | |
US6104183A (en) | Semiconductor device testing apparatus | |
US5909657A (en) | Semiconductor device testing apparatus | |
US5680936A (en) | Printed circuit board sorting device | |
US6111246A (en) | Semiconductor device testing apparatus having presence or absence detectors issuing an alarm when an error occurs | |
JP5186370B2 (ja) | 電子部品移送方法および電子部品ハンドリング装置 | |
JPH10232262A (ja) | 半導体デバイスのテスト用搬送装置 | |
WO2006039395A2 (en) | Method for testing semiconductor devices and an apparatus therefor | |
WO2004108366A1 (ja) | 搬送装置、電子部品ハンドリング装置および電子部品ハンドリング装置における搬送方法 | |
KR100401014B1 (ko) | 테스트 핸들러 | |
JP3376784B2 (ja) | Ic試験装置 | |
JPH112657A (ja) | 複合ic試験装置 | |
KR20000065749A (ko) | 번인테스터용 소팅 핸들러 | |
JPH0712947Y2 (ja) | 部品試験装置 | |
KR101187306B1 (ko) | 반송장치 및 전자부품 핸들링 장치 | |
KR100196365B1 (ko) | 볼 그리드 어레이의 솔더볼 실장장치 | |
JP2000206186A (ja) | トレイ移送装置 | |
JP2000329819A (ja) | 電子部品基板の試験装置および試験方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |