JPH0712947Y2 - 部品試験装置 - Google Patents
部品試験装置Info
- Publication number
- JPH0712947Y2 JPH0712947Y2 JP632690U JP632690U JPH0712947Y2 JP H0712947 Y2 JPH0712947 Y2 JP H0712947Y2 JP 632690 U JP632690 U JP 632690U JP 632690 U JP632690 U JP 632690U JP H0712947 Y2 JPH0712947 Y2 JP H0712947Y2
- Authority
- JP
- Japan
- Prior art keywords
- magazine
- parts
- defective
- component
- tray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims description 43
- 230000002950 deficient Effects 0.000 claims description 54
- 230000032258 transport Effects 0.000 description 17
- 230000003028 elevating effect Effects 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 5
- 238000013102 re-test Methods 0.000 description 5
- 230000007547 defect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP632690U JPH0712947Y2 (ja) | 1990-01-26 | 1990-01-26 | 部品試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP632690U JPH0712947Y2 (ja) | 1990-01-26 | 1990-01-26 | 部品試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0397676U JPH0397676U (enrdf_load_stackoverflow) | 1991-10-08 |
| JPH0712947Y2 true JPH0712947Y2 (ja) | 1995-03-29 |
Family
ID=31510003
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP632690U Expired - Fee Related JPH0712947Y2 (ja) | 1990-01-26 | 1990-01-26 | 部品試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0712947Y2 (enrdf_load_stackoverflow) |
-
1990
- 1990-01-26 JP JP632690U patent/JPH0712947Y2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0397676U (enrdf_load_stackoverflow) | 1991-10-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |