JPH0393765U - - Google Patents

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Publication number
JPH0393765U
JPH0393765U JP135790U JP135790U JPH0393765U JP H0393765 U JPH0393765 U JP H0393765U JP 135790 U JP135790 U JP 135790U JP 135790 U JP135790 U JP 135790U JP H0393765 U JPH0393765 U JP H0393765U
Authority
JP
Japan
Prior art keywords
ozone
sample gas
ethylene
line
reaction chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP135790U
Other languages
English (en)
Japanese (ja)
Other versions
JP2509633Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990001357U priority Critical patent/JP2509633Y2/ja
Publication of JPH0393765U publication Critical patent/JPH0393765U/ja
Application granted granted Critical
Publication of JP2509633Y2 publication Critical patent/JP2509633Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Optical Measuring Cells (AREA)
JP1990001357U 1990-01-10 1990-01-10 連続式低濃度エチレン分析計 Expired - Lifetime JP2509633Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990001357U JP2509633Y2 (ja) 1990-01-10 1990-01-10 連続式低濃度エチレン分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990001357U JP2509633Y2 (ja) 1990-01-10 1990-01-10 連続式低濃度エチレン分析計

Publications (2)

Publication Number Publication Date
JPH0393765U true JPH0393765U (enrdf_load_stackoverflow) 1991-09-25
JP2509633Y2 JP2509633Y2 (ja) 1996-09-04

Family

ID=31505269

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990001357U Expired - Lifetime JP2509633Y2 (ja) 1990-01-10 1990-01-10 連続式低濃度エチレン分析計

Country Status (1)

Country Link
JP (1) JP2509633Y2 (enrdf_load_stackoverflow)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49121592A (enrdf_load_stackoverflow) * 1973-03-05 1974-11-20
JPS60228941A (ja) * 1984-04-26 1985-11-14 Yanako Keisoku:Kk ガス検知器
JPS635242A (ja) * 1986-06-20 1988-01-11 テカン アクチエン ゲゼルシヤフト アナリテイシエ インスツルメンテ 化学的発光−ガス分析方法およびフォトダイオ−ド−化学的発光検出器

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49121592A (enrdf_load_stackoverflow) * 1973-03-05 1974-11-20
JPS60228941A (ja) * 1984-04-26 1985-11-14 Yanako Keisoku:Kk ガス検知器
JPS635242A (ja) * 1986-06-20 1988-01-11 テカン アクチエン ゲゼルシヤフト アナリテイシエ インスツルメンテ 化学的発光−ガス分析方法およびフォトダイオ−ド−化学的発光検出器

Also Published As

Publication number Publication date
JP2509633Y2 (ja) 1996-09-04

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