JPH0379642B2 - - Google Patents
Info
- Publication number
- JPH0379642B2 JPH0379642B2 JP58058810A JP5881083A JPH0379642B2 JP H0379642 B2 JPH0379642 B2 JP H0379642B2 JP 58058810 A JP58058810 A JP 58058810A JP 5881083 A JP5881083 A JP 5881083A JP H0379642 B2 JPH0379642 B2 JP H0379642B2
- Authority
- JP
- Japan
- Prior art keywords
- input
- standing wave
- output
- flip
- reflector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02057—Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/25—Fabry-Perot in interferometer, e.g. etalon, cavity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/266—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light by interferometric means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DD01B/238738-0 | 1982-04-05 | ||
DD23873882 | 1982-04-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58200137A JPS58200137A (ja) | 1983-11-21 |
JPH0379642B2 true JPH0379642B2 (en, 2012) | 1991-12-19 |
Family
ID=5537705
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58058810A Granted JPS58200137A (ja) | 1982-04-05 | 1983-04-05 | 定在波干渉計 |
Country Status (5)
Country | Link |
---|---|
US (1) | US4571083A (en, 2012) |
JP (1) | JPS58200137A (en, 2012) |
DE (1) | DE3300369A1 (en, 2012) |
FR (1) | FR2524633B1 (en, 2012) |
GB (1) | GB2117918B (en, 2012) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6070563A (ja) * | 1983-09-27 | 1985-04-22 | Toshiba Corp | 高密度螺旋描画装置 |
DD236587A1 (de) * | 1985-04-26 | 1986-06-11 | Ilmenau Tech Hochschule | Inkrementaler stehende-wellen-sensor |
GB2203259A (en) * | 1987-02-26 | 1988-10-12 | Plessey Co Plc | Polarisation rotator associated with reflective surface |
DE3826194A1 (de) * | 1988-08-02 | 1990-02-15 | Hommelwerke Gmbh | Vorrichtung zur laengenmessung |
GB8920364D0 (en) * | 1989-09-08 | 1989-10-25 | Downs Michael J | Optical measuring instruments |
DE3932663A1 (de) * | 1989-09-29 | 1991-04-18 | Hommelwerke Gmbh | Stehende-wellen-sensor |
DD292519A5 (de) * | 1990-03-13 | 1991-08-01 | �������@������������@��k�� | Transparentes fotoelektrisches element |
DD296549A5 (de) * | 1990-07-13 | 1991-12-05 | ����@�����@����@����@����@����K@����K`�����K@�������������@���k�� | Stehwelleninterpolator |
US5495767A (en) * | 1994-07-26 | 1996-03-05 | Alfred University | Laser vibrometer |
RU2177605C1 (ru) * | 2000-12-04 | 2001-12-27 | Атнашев Виталий Борисович | Способ спектрометрии и устройство для его осуществления (варианты) |
DE10127017B4 (de) * | 2001-06-01 | 2007-11-29 | Forschungszentrum Jülich GmbH | Photosensor für ein Durchlichtverfahren zur Detektion des Intensitätsprofils einer optisch stehenden Welle |
DE10127018B4 (de) * | 2001-06-01 | 2007-09-27 | Forschungszentrum Jülich GmbH | Photosensor für ein Durchlichtverfahren zur Detektion des Intensitätsprofils einer optisch stehenden Welle |
DE10131608B4 (de) * | 2001-06-29 | 2004-02-05 | Forschungszentrum Jülich GmbH | Photosensor für ein Durchlichtverfahren zur Detektion der Bewegungsrichtung von Intensitätsmaxima und Intensitätsminima einer optischen stehenden Welle |
RU2195693C1 (ru) * | 2001-12-17 | 2002-12-27 | Атнашев Виталий Борисович | Способ передачи и приема оптических сигналов и устройство для его осуществления |
RU2239917C2 (ru) * | 2002-01-11 | 2004-11-10 | Институт физики им. Л.В. Киренского СО РАН | Фотоприемник |
RU2241280C2 (ru) * | 2002-01-21 | 2004-11-27 | Институт физики им. Л.В. Киренского СО РАН | Фотоприемник |
RU2243615C2 (ru) * | 2002-02-28 | 2004-12-27 | Институт физики им. Л.В. Киренского СО РАН | Фотоприемник |
RU2255306C2 (ru) * | 2002-03-20 | 2005-06-27 | Институт физики им. Л.В. Киренского Сибирского отделения РАН | Интерферометр |
RU2234055C2 (ru) * | 2002-10-14 | 2004-08-10 | Специальное конструкторско-технологическое бюро "Наука" КНЦ СО РАН | Интерферометр |
WO2005008201A1 (fr) * | 2003-07-21 | 2005-01-27 | Special Designing And Technological Bureau 'nauka' Krasnoyarsk Scientific Center Of Siberian Department Russian Academy Of Sciences | Procede de mesure de la fonction de correlation de flux lumineux et dispositif associe |
CN109642868B (zh) * | 2016-08-19 | 2022-03-15 | 国立大学法人香川大学 | 光学特性测定装置和光学特性测定方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB993072A (en) * | 1963-03-21 | 1965-05-26 | Ferranti Ltd | Improvements relating to measuring apparatus |
US3447014A (en) * | 1966-06-27 | 1969-05-27 | Robert J Jordan | Interferometer comprising photocathode of fractional light wavelength thickness in envelope having optically flat windows |
GB1184080A (en) * | 1967-09-19 | 1970-03-11 | Optomechanisms Inc | Single Optical Block Interferometer Means |
JPS4917264A (en, 2012) * | 1972-06-03 | 1974-02-15 | ||
JPS591962B2 (ja) * | 1976-02-27 | 1984-01-14 | 五紀 伴 | 測距装置 |
US4443107A (en) * | 1981-08-03 | 1984-04-17 | Alexander David H | Optical displacement sensor |
-
1983
- 1983-01-07 DE DE19833300369 patent/DE3300369A1/de active Granted
- 1983-02-28 US US06/468,328 patent/US4571083A/en not_active Expired - Fee Related
- 1983-03-24 GB GB08308044A patent/GB2117918B/en not_active Expired
- 1983-03-31 FR FR8305338A patent/FR2524633B1/fr not_active Expired
- 1983-04-05 JP JP58058810A patent/JPS58200137A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
GB2117918A (en) | 1983-10-19 |
GB2117918B (en) | 1986-04-30 |
DE3300369A1 (de) | 1983-10-06 |
JPS58200137A (ja) | 1983-11-21 |
FR2524633A1 (fr) | 1983-10-07 |
GB8308044D0 (en) | 1983-05-05 |
US4571083A (en) | 1986-02-18 |
FR2524633B1 (fr) | 1987-02-13 |
DE3300369C2 (en, 2012) | 1987-06-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0379642B2 (en, 2012) | ||
NL1033095C2 (nl) | Littrow-interferometer. | |
JP2997047B2 (ja) | 光学式計測装置 | |
US8441649B2 (en) | Multi-beam interferometer displacement measuring system utilized in a large measuring range | |
US8582112B2 (en) | Double pass interferometer with tilted mirrors | |
CN104729403B (zh) | 一种多光束阶梯型平面反射镜激光干涉仪及其测量方法 | |
CN103512505B (zh) | 用于干涉式间距测量的设备 | |
JPH0715363B2 (ja) | 差動平面鏡干渉計システム | |
CN104697440B (zh) | 一种多光束阶梯角反射镜激光干涉仪及其测量方法 | |
CN106949842B (zh) | 二维位移测量装置及测量方法 | |
JP2755757B2 (ja) | 変位及び角度の測定方法 | |
JP6063166B2 (ja) | 干渉計方式により間隔測定するための機構 | |
CN112444194A (zh) | 二自由度位移测量的法布里珀罗光栅干涉仪及其测量方法和六自由度干涉仪 | |
US5187545A (en) | Integrated optical position measuring device and method with reference and measurement signals | |
JPS62233704A (ja) | 差動平面鏡干渉計システム | |
CN108627084B (zh) | 一种基于静止的迈克尔逊干涉仪的激光器波长校准系统 | |
US5471302A (en) | Interferometric probe for distance measurement utilizing a diffraction reflecting element as a reference surface | |
US9739598B2 (en) | Device for interferential distance measurement | |
CN204495277U (zh) | 一种抗干扰阶梯角反射镜激光干涉仪 | |
US7072048B2 (en) | Interferometric plural-dimensional displacement measuring system | |
Zhu et al. | Multi-Period Fast Rotating Optical Delay Line With 228.47 ps Delay Time | |
JP2024056589A (ja) | 光学式距離計 | |
JPH06502254A (ja) | 物体の横方向ずれ測定装置 | |
JP2923859B2 (ja) | 屈折率測定装置 | |
TWM459393U (zh) | 共光程抗傾角之多光束干涉裝置 |