JPH0377925B2 - - Google Patents

Info

Publication number
JPH0377925B2
JPH0377925B2 JP59117681A JP11768184A JPH0377925B2 JP H0377925 B2 JPH0377925 B2 JP H0377925B2 JP 59117681 A JP59117681 A JP 59117681A JP 11768184 A JP11768184 A JP 11768184A JP H0377925 B2 JPH0377925 B2 JP H0377925B2
Authority
JP
Japan
Prior art keywords
rail
inspection
stopper
pivot
camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59117681A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60261274A (ja
Inventor
Yoichi Noguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SEIEI KOSAN KK
Original Assignee
SEIEI KOSAN KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SEIEI KOSAN KK filed Critical SEIEI KOSAN KK
Priority to JP11768184A priority Critical patent/JPS60261274A/ja
Publication of JPS60261274A publication Critical patent/JPS60261274A/ja
Publication of JPH0377925B2 publication Critical patent/JPH0377925B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Intermediate Stations On Conveyors (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Closed-Circuit Television Systems (AREA)
JP11768184A 1984-06-08 1984-06-08 集積回路等検査装置 Granted JPS60261274A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11768184A JPS60261274A (ja) 1984-06-08 1984-06-08 集積回路等検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11768184A JPS60261274A (ja) 1984-06-08 1984-06-08 集積回路等検査装置

Publications (2)

Publication Number Publication Date
JPS60261274A JPS60261274A (ja) 1985-12-24
JPH0377925B2 true JPH0377925B2 (enrdf_load_stackoverflow) 1991-12-12

Family

ID=14717651

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11768184A Granted JPS60261274A (ja) 1984-06-08 1984-06-08 集積回路等検査装置

Country Status (1)

Country Link
JP (1) JPS60261274A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH065614Y2 (ja) * 1987-10-22 1994-02-09 ティーディーケイ株式会社 チップ部品自動外観検査機における部品搬送機構
CN111007082B (zh) * 2020-01-03 2025-08-08 佛亚智能装备(苏州)有限公司 一种发动机曲轴轴颈缺陷的机器视觉检测机构及检测方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6055762B2 (ja) * 1977-04-08 1985-12-06 株式会社日立製作所 円筒物体外観検査装置
JPS6143779Y2 (enrdf_load_stackoverflow) * 1979-08-21 1986-12-10

Also Published As

Publication number Publication date
JPS60261274A (ja) 1985-12-24

Similar Documents

Publication Publication Date Title
US4733360A (en) Device and method for inspecting card-like articles
US4782589A (en) Process of connecting lead frame to a semi-conductor device and a device to effect same
JP2627191B2 (ja) リードフレーム分離装置
CN218099484U (zh) 一种带限位结构的芯片测试装置
JPH0377925B2 (enrdf_load_stackoverflow)
US3517157A (en) Axial component lead attach machine
CN219350179U (zh) 一种半导体器件输送装置及半导体器材检测设备
JPS6038900A (ja) 電子部品挿入装置
US4776743A (en) Lead-frame separating apparatus
JP3269163B2 (ja) テーピング電子部品の特性検査装置
JPH0136592B2 (enrdf_load_stackoverflow)
WO2009035179A1 (en) Bad hanger detecting and removal apparatus for curing machine
US4510686A (en) Method and apparatus for straightening and aligning leads and testing electrical functioning of components
US4327472A (en) Method for separating hybrid substrate from carrier plate
KR100222587B1 (ko) 카메라의 자동 초점조절기능 검사장치
JPH10160631A (ja) 液晶パネルのアライメント装置
JPH0480347B2 (enrdf_load_stackoverflow)
JPH11317437A (ja) 平板状被処理体の受け渡し装置及びこれを用いた処理装置
JPH0532928Y2 (enrdf_load_stackoverflow)
JPH07100723A (ja) 物品搬送装置
JPH0416559B2 (enrdf_load_stackoverflow)
JPH0413668Y2 (enrdf_load_stackoverflow)
JPH05297069A (ja) 電子回路の検査装置
KR19980041632U (ko) 탄탈 프레임 언로딩장치
JPS624381Y2 (enrdf_load_stackoverflow)