JPH0374803B2 - - Google Patents

Info

Publication number
JPH0374803B2
JPH0374803B2 JP1501685A JP1501685A JPH0374803B2 JP H0374803 B2 JPH0374803 B2 JP H0374803B2 JP 1501685 A JP1501685 A JP 1501685A JP 1501685 A JP1501685 A JP 1501685A JP H0374803 B2 JPH0374803 B2 JP H0374803B2
Authority
JP
Japan
Prior art keywords
layer
pattern
etching
photoresist
polyimide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1501685A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61174546A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP60015016A priority Critical patent/JPS61174546A/ja
Publication of JPS61174546A publication Critical patent/JPS61174546A/ja
Publication of JPH0374803B2 publication Critical patent/JPH0374803B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/22Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
JP60015016A 1985-01-29 1985-01-29 アスペクト比の大きい微細パタ−ンの製作法 Granted JPS61174546A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60015016A JPS61174546A (ja) 1985-01-29 1985-01-29 アスペクト比の大きい微細パタ−ンの製作法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60015016A JPS61174546A (ja) 1985-01-29 1985-01-29 アスペクト比の大きい微細パタ−ンの製作法

Publications (2)

Publication Number Publication Date
JPS61174546A JPS61174546A (ja) 1986-08-06
JPH0374803B2 true JPH0374803B2 (enrdf_load_stackoverflow) 1991-11-28

Family

ID=11877070

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60015016A Granted JPS61174546A (ja) 1985-01-29 1985-01-29 アスペクト比の大きい微細パタ−ンの製作法

Country Status (1)

Country Link
JP (1) JPS61174546A (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63240502A (ja) * 1987-03-27 1988-10-06 Shimadzu Corp Au透過型グレ−テイングの製作法
JPH01283515A (ja) * 1988-05-11 1989-11-15 Stanley Electric Co Ltd カラーフィルタを有する液晶表示装置の製造方法
JP2636658B2 (ja) * 1993-01-29 1997-07-30 株式会社島津製作所 Au透過型グレーティングの製作法
JP3703483B2 (ja) * 1993-09-15 2005-10-05 カール−ツァイス−スチフツング 位相コントラスト−x線顕微鏡
JP4608679B2 (ja) * 2005-03-17 2011-01-12 財団法人新産業創造研究機構 X線タルボ干渉計に用いられる位相型回折格子と振幅型回折格子の製造方法
JP6245794B2 (ja) * 2011-07-29 2017-12-13 キヤノン株式会社 遮蔽格子の製造方法

Also Published As

Publication number Publication date
JPS61174546A (ja) 1986-08-06

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