JPH0374461U - - Google Patents
Info
- Publication number
- JPH0374461U JPH0374461U JP13614689U JP13614689U JPH0374461U JP H0374461 U JPH0374461 U JP H0374461U JP 13614689 U JP13614689 U JP 13614689U JP 13614689 U JP13614689 U JP 13614689U JP H0374461 U JPH0374461 U JP H0374461U
- Authority
- JP
- Japan
- Prior art keywords
- transport chamber
- slit
- ion
- target
- deflection electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010884 ion-beam technique Methods 0.000 claims description 6
- 150000002500 ions Chemical class 0.000 claims 6
- 238000010586 diagram Methods 0.000 description 6
- 238000005468 ion implantation Methods 0.000 description 1
Description
第1図は本考案の実施例にかかるイオンビーム
電流可変装置の構成図。第2図はパルスデユーテ
イが50%以下の時の偏向電極に印加する電圧と
、スリツトを通過するビーム電流の波形図。第3
図はパルスデユーテイが50%以上の時の偏向電
極に印加する電圧と、スリツトを通過するビーム
電流の波形図。第4図は従来例に係るイオン注入
装置の概略構成図。第5図はイオンビーム電流密
度の分布図。第6図はスリツトを通つたイオンビ
ーム電流密度の分布図。
1……イオン源、2……輸送チヤンバ、3……
スリツト駆動モータ、4……スリツト、5……タ
ーゲツトチヤンバ、6……ターゲツト、7……偏
向電極、8……偏向電源、9……スリツト穴。
FIG. 1 is a configuration diagram of an ion beam current variable device according to an embodiment of the present invention. Figure 2 is a waveform diagram of the voltage applied to the deflection electrode and the beam current passing through the slit when the pulse duty is 50% or less. Third
The figure is a waveform diagram of the voltage applied to the deflection electrode and the beam current passing through the slit when the pulse duty is 50% or more. FIG. 4 is a schematic configuration diagram of a conventional ion implantation apparatus. Figure 5 is a distribution diagram of ion beam current density. Figure 6 is a distribution diagram of the ion beam current density passing through the slit. 1...Ion source, 2...Transport chamber, 3...
Slit drive motor, 4...Slit, 5...Target chamber, 6...Target, 7...Deflection electrode, 8...Deflection power source, 9...Slit hole.
Claims (1)
おりイオン源で生じたイオンを輸送する空間をな
す輸送チヤンバと、真空に引かれておりイオンを
照射すべきターゲツトを保持し輸送チヤンバに連
続して設けられるターゲツトチヤンバと、輸送チ
ヤンバの中に設けられイオンビームの軸線上にス
リツト穴を有するスリツトと、輸送チヤンバの中
であつてスリツトの前方に設けられイオンビーム
を偏向させる偏向電極と、偏向電極に電圧を印加
する偏向電源とよりなり、イオンビームを偏向さ
せてスリツト穴を通らなくする電圧振幅のパルス
電圧を偏向電極に印加することによりターゲツト
に達するビーム電流量を可変にしたことを特徴と
するイオン注入装置におけるビーム電流量可変装
置。 An ion source that generates ions, a transport chamber that is evacuated and forms a space for transporting the ions generated in the ion source, and a vacuum that is connected to the transport chamber and holds the target to be irradiated with ions. a target chamber provided in the transport chamber, a slit provided in the transport chamber and having a slit hole on the axis of the ion beam, and a deflection electrode provided in the transport chamber in front of the slit to deflect the ion beam; It consists of a deflection power supply that applies voltage to the deflection electrode, and by applying a pulse voltage to the deflection electrode with a voltage amplitude that deflects the ion beam so that it does not pass through the slit hole, the amount of beam current that reaches the target can be varied. A variable beam current amount device in an ion implanter featuring features.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13614689U JPH0374461U (en) | 1989-11-22 | 1989-11-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13614689U JPH0374461U (en) | 1989-11-22 | 1989-11-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0374461U true JPH0374461U (en) | 1991-07-26 |
Family
ID=31683370
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13614689U Pending JPH0374461U (en) | 1989-11-22 | 1989-11-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0374461U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008536309A (en) * | 2005-04-02 | 2008-09-04 | バリアン・セミコンダクター・エクイップメント・アソシエイツ・インコーポレイテッド | Method and apparatus for recovering from glitches in fixed beam ion implantation using fast ion beam control |
-
1989
- 1989-11-22 JP JP13614689U patent/JPH0374461U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008536309A (en) * | 2005-04-02 | 2008-09-04 | バリアン・セミコンダクター・エクイップメント・アソシエイツ・インコーポレイテッド | Method and apparatus for recovering from glitches in fixed beam ion implantation using fast ion beam control |
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