JPH0373451U - - Google Patents

Info

Publication number
JPH0373451U
JPH0373451U JP12413490U JP12413490U JPH0373451U JP H0373451 U JPH0373451 U JP H0373451U JP 12413490 U JP12413490 U JP 12413490U JP 12413490 U JP12413490 U JP 12413490U JP H0373451 U JPH0373451 U JP H0373451U
Authority
JP
Japan
Prior art keywords
image
optical axis
optical
imaging
pixel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12413490U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0537476Y2 (en, 2012
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPH0373451U publication Critical patent/JPH0373451U/ja
Application granted granted Critical
Publication of JPH0537476Y2 publication Critical patent/JPH0537476Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Control Of Position Or Direction (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP1990124134U 1984-02-22 1990-11-26 Expired - Lifetime JPH0537476Y2 (en, 2012)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US58259084A 1984-02-22 1984-02-22

Publications (2)

Publication Number Publication Date
JPH0373451U true JPH0373451U (en, 2012) 1991-07-24
JPH0537476Y2 JPH0537476Y2 (en, 2012) 1993-09-22

Family

ID=24329741

Family Applications (2)

Application Number Title Priority Date Filing Date
JP60032947A Pending JPS60194537A (ja) 1984-02-22 1985-02-22 整列装置
JP1990124134U Expired - Lifetime JPH0537476Y2 (en, 2012) 1984-02-22 1990-11-26

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP60032947A Pending JPS60194537A (ja) 1984-02-22 1985-02-22 整列装置

Country Status (1)

Country Link
JP (2) JPS60194537A (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012064608A (ja) * 2010-09-14 2012-03-29 Hitachi High-Technologies Corp 検査装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6262538A (ja) * 1985-09-13 1987-03-19 Toshiba Corp 位置決め装置
JPH0625011Y2 (ja) * 1988-02-15 1994-06-29 株式会社東京精密 半導体チップの基準線検出装置
JP2015226043A (ja) * 2014-05-30 2015-12-14 株式会社ディスコ ウェーハｉｄ読み取り装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54159876A (en) * 1978-06-07 1979-12-18 Nec Corp Wafer position detection method and its unit
JPS56134741A (en) * 1980-03-25 1981-10-21 Toshiba Corp Position detecting device
JPS574134A (en) * 1980-06-10 1982-01-09 Fujitsu Ltd Recognizing device
JPS57167651A (en) * 1981-04-07 1982-10-15 Mitsubishi Electric Corp Inspecting device for surface of semiconductor wafer
JPS57169251A (en) * 1981-04-09 1982-10-18 Toshiba Corp Recognizing device for position
JPS57198641A (en) * 1981-05-30 1982-12-06 Toshiba Corp Pattern detection
JPS5919344A (ja) * 1982-07-23 1984-01-31 Hitachi Ltd ２視野光学装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57133428A (en) * 1981-02-12 1982-08-18 Nippon Kogaku Kk <Nikon> Alignment optical system capable of variable magnification

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54159876A (en) * 1978-06-07 1979-12-18 Nec Corp Wafer position detection method and its unit
JPS56134741A (en) * 1980-03-25 1981-10-21 Toshiba Corp Position detecting device
JPS574134A (en) * 1980-06-10 1982-01-09 Fujitsu Ltd Recognizing device
JPS57167651A (en) * 1981-04-07 1982-10-15 Mitsubishi Electric Corp Inspecting device for surface of semiconductor wafer
JPS57169251A (en) * 1981-04-09 1982-10-18 Toshiba Corp Recognizing device for position
JPS57198641A (en) * 1981-05-30 1982-12-06 Toshiba Corp Pattern detection
JPS5919344A (ja) * 1982-07-23 1984-01-31 Hitachi Ltd ２視野光学装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012064608A (ja) * 2010-09-14 2012-03-29 Hitachi High-Technologies Corp 検査装置

Also Published As

Publication number Publication date
JPS60194537A (ja) 1985-10-03
JPH0537476Y2 (en, 2012) 1993-09-22

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