JPH0371073B2 - - Google Patents

Info

Publication number
JPH0371073B2
JPH0371073B2 JP58188495A JP18849583A JPH0371073B2 JP H0371073 B2 JPH0371073 B2 JP H0371073B2 JP 58188495 A JP58188495 A JP 58188495A JP 18849583 A JP18849583 A JP 18849583A JP H0371073 B2 JPH0371073 B2 JP H0371073B2
Authority
JP
Japan
Prior art keywords
circuit
terminal
bias
voltage
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58188495A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6080776A (ja
Inventor
Iwao Uchama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP58188495A priority Critical patent/JPS6080776A/ja
Publication of JPS6080776A publication Critical patent/JPS6080776A/ja
Publication of JPH0371073B2 publication Critical patent/JPH0371073B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58188495A 1983-10-11 1983-10-11 試験用回路 Granted JPS6080776A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58188495A JPS6080776A (ja) 1983-10-11 1983-10-11 試験用回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58188495A JPS6080776A (ja) 1983-10-11 1983-10-11 試験用回路

Publications (2)

Publication Number Publication Date
JPS6080776A JPS6080776A (ja) 1985-05-08
JPH0371073B2 true JPH0371073B2 (enrdf_load_stackoverflow) 1991-11-11

Family

ID=16224725

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58188495A Granted JPS6080776A (ja) 1983-10-11 1983-10-11 試験用回路

Country Status (1)

Country Link
JP (1) JPS6080776A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1837430A1 (de) * 2006-03-22 2007-09-26 Groz-Beckert KG Nadelhalter für eine Nähmaschine

Also Published As

Publication number Publication date
JPS6080776A (ja) 1985-05-08

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