JPH0353770B2 - - Google Patents
Info
- Publication number
- JPH0353770B2 JPH0353770B2 JP55005156A JP515680A JPH0353770B2 JP H0353770 B2 JPH0353770 B2 JP H0353770B2 JP 55005156 A JP55005156 A JP 55005156A JP 515680 A JP515680 A JP 515680A JP H0353770 B2 JPH0353770 B2 JP H0353770B2
- Authority
- JP
- Japan
- Prior art keywords
- mark
- coordinate
- axis
- measurement axis
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Control Of Position Or Direction (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP515680A JPS56102823A (en) | 1980-01-19 | 1980-01-19 | Positioning device |
US06/225,049 US4385838A (en) | 1980-01-19 | 1981-01-14 | Alignment device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP515680A JPS56102823A (en) | 1980-01-19 | 1980-01-19 | Positioning device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56102823A JPS56102823A (en) | 1981-08-17 |
JPH0353770B2 true JPH0353770B2 (enrdf_load_stackoverflow) | 1991-08-16 |
Family
ID=11603394
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP515680A Granted JPS56102823A (en) | 1980-01-19 | 1980-01-19 | Positioning device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56102823A (enrdf_load_stackoverflow) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5918950A (ja) * | 1982-07-09 | 1984-01-31 | パ−キン−エルマ−・ツエンゾ−ル・アンシユタルト | 加工片上へのマスクの投影転写装置およびその調整方法 |
JPS6235640A (ja) * | 1985-08-09 | 1987-02-16 | Nec Kyushu Ltd | 半導体基板のプリアライメント機構 |
JPH0754793B2 (ja) * | 1986-04-21 | 1995-06-07 | 株式会社ニコン | 投影露光装置 |
JP2629709B2 (ja) * | 1987-05-28 | 1997-07-16 | 株式会社ニコン | 位置合わせ方法及び装置 |
JP2580651B2 (ja) * | 1987-12-18 | 1997-02-12 | 株式会社ニコン | 投影露光装置及び露光方法 |
JP2606285B2 (ja) * | 1988-06-07 | 1997-04-30 | 株式会社ニコン | 露光装置および位置合わせ方法 |
JP2713552B2 (ja) * | 1994-06-20 | 1998-02-16 | 株式会社ニコン | 露光装置 |
JPH08222514A (ja) | 1995-02-17 | 1996-08-30 | Nikon Corp | 半導体製造方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS541553A (en) * | 1977-06-07 | 1979-01-08 | Toshiba Corp | Group management control method of elevator |
JPS5493974A (en) * | 1978-01-06 | 1979-07-25 | Hitachi Ltd | Projection-system mask alignment unit |
JPS5541739A (en) * | 1978-09-20 | 1980-03-24 | Hitachi Ltd | Micro-projection type mask alignment device |
-
1980
- 1980-01-19 JP JP515680A patent/JPS56102823A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS56102823A (en) | 1981-08-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5743958B2 (ja) | 計測方法、露光方法および装置 | |
US4385838A (en) | Alignment device | |
US10191394B2 (en) | Distortion detection method, exposure apparatus, exposure method, and device manufacturing method | |
KR20170136446A (ko) | 패턴 형성 장치, 기판을 배치하는 방법, 및 물품을 제조하는 방법 | |
JP2018072541A (ja) | パターン形成方法、基板の位置決め方法、位置決め装置、パターン形成装置、及び、物品の製造方法 | |
JP3450580B2 (ja) | 露光装置および露光方法 | |
JP2646412B2 (ja) | 露光装置 | |
JP2610815B2 (ja) | 露光方法 | |
JPH0140492B2 (enrdf_load_stackoverflow) | ||
JP2015023233A (ja) | マーク検出方法及び装置、並びに露光方法及び装置 | |
JPH0353770B2 (enrdf_load_stackoverflow) | ||
JPH0669017B2 (ja) | 位置合わせ方法 | |
JPH0581046B2 (enrdf_load_stackoverflow) | ||
JPH0147006B2 (enrdf_load_stackoverflow) | ||
JPH06232027A (ja) | 投影露光装置 | |
JP6061507B2 (ja) | 露光方法及び物品の製造方法 | |
JPS62150106A (ja) | 位置検出装置 | |
JP3507205B2 (ja) | 走査型露光装置及び該装置を用いてデバイスを製造する方法 | |
JP3198718B2 (ja) | 投影露光装置及びそれを用いた半導体素子の製造方法 | |
JP6061912B2 (ja) | 計測方法、露光方法および装置 | |
JP2646417B2 (ja) | 露光装置 | |
JPH1152545A (ja) | レチクルおよびそれによって転写されたパターンならびにレチクルと半導体ウエハとの位置合わせ方法 | |
JPH04209518A (ja) | 位置ずれ計測方法、及び露光装置の精度確認方法 | |
KR102333943B1 (ko) | 노광장치, 스테이지 교정 시스템, 및 스테이지 교정방법 | |
JP3276608B2 (ja) | 半導体装置の製造方法 |