JPH0346062B2 - - Google Patents
Info
- Publication number
- JPH0346062B2 JPH0346062B2 JP59189511A JP18951184A JPH0346062B2 JP H0346062 B2 JPH0346062 B2 JP H0346062B2 JP 59189511 A JP59189511 A JP 59189511A JP 18951184 A JP18951184 A JP 18951184A JP H0346062 B2 JPH0346062 B2 JP H0346062B2
- Authority
- JP
- Japan
- Prior art keywords
- test object
- low temperature
- refrigerator
- test
- cryogenic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 claims description 77
- 238000010438 heat treatment Methods 0.000 claims description 9
- 239000001307 helium Substances 0.000 description 27
- 229910052734 helium Inorganic materials 0.000 description 27
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 27
- 239000007789 gas Substances 0.000 description 12
- 238000001816 cooling Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000000638 solvent extraction Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Sampling And Sample Adjustment (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59189511A JPS6168547A (ja) | 1984-09-12 | 1984-09-12 | 極低温試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59189511A JPS6168547A (ja) | 1984-09-12 | 1984-09-12 | 極低温試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6168547A JPS6168547A (ja) | 1986-04-08 |
| JPH0346062B2 true JPH0346062B2 (enExample) | 1991-07-15 |
Family
ID=16242491
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59189511A Granted JPS6168547A (ja) | 1984-09-12 | 1984-09-12 | 極低温試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6168547A (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01110245A (ja) * | 1987-10-23 | 1989-04-26 | Iwatani Internatl Corp | 極低温試験装置 |
| JPH01213544A (ja) * | 1988-02-22 | 1989-08-28 | Chino Corp | 低温試験装置のＨｅ封入方法および装置 |
| JPH087120B2 (ja) * | 1990-03-26 | 1996-01-29 | 長瀬産業株式会社 | 試料特性の測定装置及びその測定方法 |
| US11275000B2 (en) | 2017-12-04 | 2022-03-15 | Montana Instruments Corporation | Analytical instruments, methods, and components |
| US12181202B2 (en) * | 2019-06-04 | 2024-12-31 | Montana Instruments Corporation | Thermal connection assemblies and methods |
| JP7585627B2 (ja) * | 2020-06-15 | 2024-11-19 | 富士電機株式会社 | 伝熱機器 |
| US11956924B1 (en) | 2020-08-10 | 2024-04-09 | Montana Instruments Corporation | Quantum processing circuitry cooling systems and methods |
-
1984
- 1984-09-12 JP JP59189511A patent/JPS6168547A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6168547A (ja) | 1986-04-08 |
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