JPS6168547A - 極低温試験装置 - Google Patents

極低温試験装置

Info

Publication number
JPS6168547A
JPS6168547A JP59189511A JP18951184A JPS6168547A JP S6168547 A JPS6168547 A JP S6168547A JP 59189511 A JP59189511 A JP 59189511A JP 18951184 A JP18951184 A JP 18951184A JP S6168547 A JPS6168547 A JP S6168547A
Authority
JP
Japan
Prior art keywords
test object
low temperature
test
refrigerator
helium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59189511A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0346062B2 (enExample
Inventor
Norimoto Matsuda
松田　紀元
Minoru Imamura
今村　実
Yoshihisa Awata
粟田　義久
Masaaki Aoki
正明 青木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59189511A priority Critical patent/JPS6168547A/ja
Publication of JPS6168547A publication Critical patent/JPS6168547A/ja
Publication of JPH0346062B2 publication Critical patent/JPH0346062B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP59189511A 1984-09-12 1984-09-12 極低温試験装置 Granted JPS6168547A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59189511A JPS6168547A (ja) 1984-09-12 1984-09-12 極低温試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59189511A JPS6168547A (ja) 1984-09-12 1984-09-12 極低温試験装置

Publications (2)

Publication Number Publication Date
JPS6168547A true JPS6168547A (ja) 1986-04-08
JPH0346062B2 JPH0346062B2 (enExample) 1991-07-15

Family

ID=16242491

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59189511A Granted JPS6168547A (ja) 1984-09-12 1984-09-12 極低温試験装置

Country Status (1)

Country Link
JP (1) JPS6168547A (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01110245A (ja) * 1987-10-23 1989-04-26 Iwatani Internatl Corp 極低温試験装置
JPH01213544A (ja) * 1988-02-22 1989-08-28 Chino Corp 低温試験装置のＨｅ封入方法および装置
JPH03274438A (ja) * 1990-03-26 1991-12-05 Nagase Sangyo Kk 試料特性の測定装置及びその測定方法
US20200386470A1 (en) * 2019-06-04 2020-12-10 Montana Instruments Corporation Thermal Connection Assemblies and Methods
JP2021196119A (ja) * 2020-06-15 2021-12-27 富士電機株式会社 伝熱機器
US11927515B2 (en) 2017-12-04 2024-03-12 Montana Instruments Corporation Analytical instruments, methods, and components
US12262510B2 (en) 2020-08-10 2025-03-25 Montana Instruments Corporation Quantum processing circuitry cooling systems and methods

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01110245A (ja) * 1987-10-23 1989-04-26 Iwatani Internatl Corp 極低温試験装置
JPH01213544A (ja) * 1988-02-22 1989-08-28 Chino Corp 低温試験装置のＨｅ封入方法および装置
JPH03274438A (ja) * 1990-03-26 1991-12-05 Nagase Sangyo Kk 試料特性の測定装置及びその測定方法
US11927515B2 (en) 2017-12-04 2024-03-12 Montana Instruments Corporation Analytical instruments, methods, and components
US12360025B2 (en) 2017-12-04 2025-07-15 Montana Instruments Corporation Analytical instruments, methods, and components
US20200386470A1 (en) * 2019-06-04 2020-12-10 Montana Instruments Corporation Thermal Connection Assemblies and Methods
US12181202B2 (en) * 2019-06-04 2024-12-31 Montana Instruments Corporation Thermal connection assemblies and methods
JP2021196119A (ja) * 2020-06-15 2021-12-27 富士電機株式会社 伝熱機器
US12262510B2 (en) 2020-08-10 2025-03-25 Montana Instruments Corporation Quantum processing circuitry cooling systems and methods

Also Published As

Publication number Publication date
JPH0346062B2 (enExample) 1991-07-15

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