JPH0343581B2 - - Google Patents
Info
- Publication number
- JPH0343581B2 JPH0343581B2 JP56161441A JP16144181A JPH0343581B2 JP H0343581 B2 JPH0343581 B2 JP H0343581B2 JP 56161441 A JP56161441 A JP 56161441A JP 16144181 A JP16144181 A JP 16144181A JP H0343581 B2 JPH0343581 B2 JP H0343581B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- photoelectric
- signal
- substrate
- detection means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16144181A JPS5862544A (ja) | 1981-10-09 | 1981-10-09 | 欠陥検査装置 |
US06/343,552 US4468120A (en) | 1981-02-04 | 1982-01-28 | Foreign substance inspecting apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16144181A JPS5862544A (ja) | 1981-10-09 | 1981-10-09 | 欠陥検査装置 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63039615A Division JPS63241343A (ja) | 1988-02-24 | 1988-02-24 | 欠陥検査装置 |
JP63039614A Division JPS63241342A (ja) | 1988-02-24 | 1988-02-24 | 欠陥検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5862544A JPS5862544A (ja) | 1983-04-14 |
JPH0343581B2 true JPH0343581B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-07-03 |
Family
ID=15735169
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16144181A Granted JPS5862544A (ja) | 1981-02-04 | 1981-10-09 | 欠陥検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5862544A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61260632A (ja) * | 1985-05-15 | 1986-11-18 | Hitachi Ltd | 異物検査装置 |
JP2512878B2 (ja) * | 1987-01-29 | 1996-07-03 | 株式会社ニコン | 異物検査装置 |
US5255089A (en) * | 1992-03-26 | 1993-10-19 | International Business Machines Corporation | Portable particle detector assembly |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56115945A (en) * | 1980-02-18 | 1981-09-11 | Hitachi Electronics Eng Co Ltd | Detecting device for defect of panel plate |
-
1981
- 1981-10-09 JP JP16144181A patent/JPS5862544A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5862544A (ja) | 1983-04-14 |