JPH0340324B2 - - Google Patents

Info

Publication number
JPH0340324B2
JPH0340324B2 JP58010835A JP1083583A JPH0340324B2 JP H0340324 B2 JPH0340324 B2 JP H0340324B2 JP 58010835 A JP58010835 A JP 58010835A JP 1083583 A JP1083583 A JP 1083583A JP H0340324 B2 JPH0340324 B2 JP H0340324B2
Authority
JP
Japan
Prior art keywords
division
measured
value data
measured value
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58010835A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59136612A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP58010835A priority Critical patent/JPS59136612A/ja
Priority to US06/573,431 priority patent/US4651291A/en
Publication of JPS59136612A publication Critical patent/JPS59136612A/ja
Publication of JPH0340324B2 publication Critical patent/JPH0340324B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/20—Slide gauges
    • G01B3/205—Slide gauges provided with a counter for digital indication of the measured dimension
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Operations Research (AREA)
  • Probability & Statistics with Applications (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Algebra (AREA)
  • Evolutionary Biology (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP58010835A 1983-01-26 1983-01-26 測定データ処理装置 Granted JPS59136612A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP58010835A JPS59136612A (ja) 1983-01-26 1983-01-26 測定データ処理装置
US06/573,431 US4651291A (en) 1983-01-26 1984-01-24 Method of indicating measured values of measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58010835A JPS59136612A (ja) 1983-01-26 1983-01-26 測定データ処理装置

Publications (2)

Publication Number Publication Date
JPS59136612A JPS59136612A (ja) 1984-08-06
JPH0340324B2 true JPH0340324B2 (enEXAMPLES) 1991-06-18

Family

ID=11761405

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58010835A Granted JPS59136612A (ja) 1983-01-26 1983-01-26 測定データ処理装置

Country Status (2)

Country Link
US (1) US4651291A (enEXAMPLES)
JP (1) JPS59136612A (enEXAMPLES)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6033011A (ja) * 1983-08-04 1985-02-20 Mitsutoyo Mfg Co Ltd 測定デ−タ合否判別装置
JPS6170514A (ja) * 1984-09-14 1986-04-11 Furukawa Electric Co Ltd:The 光フアイバケ−ブル接続部
US4628194A (en) * 1984-10-10 1986-12-09 Mars, Inc. Method and apparatus for currency validation
DE3642771A1 (de) * 1986-12-15 1988-06-23 Kuipers Ulrich Verfahren und vorrichtung zur messung der messgroesse eines messobjekts
WO1995000930A1 (de) * 1993-06-22 1995-01-05 Prüftechnik Dieter Busch AG Verfahren und vorrichtung zum feststellen des zustandes von maschinen mit mehreren messstellen
EP0891536B1 (de) * 1996-12-12 2003-08-13 Prüftechnik Dieter Busch Ag System zum überwachen von schwingungserregten aggregaten
US6651111B2 (en) * 2001-02-16 2003-11-18 Microsoft Corporation System and method for managing a serial port
US20100131372A1 (en) * 2007-03-05 2010-05-27 Norikazu Takashima Data processing device, computer program, and data storage medium
KR101097148B1 (ko) * 2007-03-05 2011-12-22 니뽄 다바코 산교 가부시키가이샤 데이터 처리 장치 및 데이터 기억 매체
JP4939601B2 (ja) * 2007-03-05 2012-05-30 日本たばこ産業株式会社 データ処理装置、コンピュータプログラム、データ記憶媒体
CN105202987B (zh) * 2015-10-29 2018-03-06 苏州健雄职业技术学院 一种数显卡尺用零件自动评分设备及其工作方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US31750A (en) * 1861-03-19 Fastening fob
JPS50152559A (enEXAMPLES) * 1974-05-27 1975-12-08
US4048484A (en) * 1976-04-26 1977-09-13 Brittan John L Digital grade averager
US4181959A (en) * 1976-11-30 1980-01-01 Sharp Kabushiki Kaisha Stored information transferable means for a combined electronic digital scale and calculator
US4296474A (en) * 1977-09-06 1981-10-20 Deere & Company Inspection system and apparatus therefor
USRE31750E (en) 1977-11-25 1984-11-27 Ird Mechanalysis, Inc. Data acquisition system
US4161781A (en) * 1977-11-25 1979-07-17 The Stanley Works Digital tape rule
US4270173A (en) * 1979-10-05 1981-05-26 Suttler Henry G Electronic scaler
DE2948337C2 (de) * 1979-10-11 1983-07-21 Maag-Zahnräder & -Maschinen AG, 8023 Zürich Schaltungsanordnung zum Festlegen der Grenzen einer Meßstrecke eines Zahnflankenprüfgerätes
JPS5665420U (enEXAMPLES) * 1979-10-22 1981-06-01
US4400783A (en) * 1980-09-05 1983-08-23 Westinghouse Electric Corp. Event-logging system
JPS57211604A (en) * 1981-06-22 1982-12-25 Fanuc Ltd Numerical controlling method

Also Published As

Publication number Publication date
US4651291A (en) 1987-03-17
JPS59136612A (ja) 1984-08-06

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