JPH0339631B2 - - Google Patents

Info

Publication number
JPH0339631B2
JPH0339631B2 JP59263002A JP26300284A JPH0339631B2 JP H0339631 B2 JPH0339631 B2 JP H0339631B2 JP 59263002 A JP59263002 A JP 59263002A JP 26300284 A JP26300284 A JP 26300284A JP H0339631 B2 JPH0339631 B2 JP H0339631B2
Authority
JP
Japan
Prior art keywords
measured
laser
analysis
lance
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59263002A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61140842A (ja
Inventor
Wataru Tanimoto
Kozo Sumyama
Zenji Oohashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP26300284A priority Critical patent/JPS61140842A/ja
Publication of JPS61140842A publication Critical patent/JPS61140842A/ja
Publication of JPH0339631B2 publication Critical patent/JPH0339631B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP26300284A 1984-12-14 1984-12-14 流動状態の金属、絶縁物の連続分析装置 Granted JPS61140842A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26300284A JPS61140842A (ja) 1984-12-14 1984-12-14 流動状態の金属、絶縁物の連続分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26300284A JPS61140842A (ja) 1984-12-14 1984-12-14 流動状態の金属、絶縁物の連続分析装置

Publications (2)

Publication Number Publication Date
JPS61140842A JPS61140842A (ja) 1986-06-27
JPH0339631B2 true JPH0339631B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-06-14

Family

ID=17383526

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26300284A Granted JPS61140842A (ja) 1984-12-14 1984-12-14 流動状態の金属、絶縁物の連続分析装置

Country Status (1)

Country Link
JP (1) JPS61140842A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999005511A1 (fr) * 1997-07-28 1999-02-04 Nippon Steel Corporation Procede et dispositif servant a determiner la cause d'une anomalie de surface d'un materiau
US6060685A (en) * 1997-10-23 2000-05-09 Trw Inc. Method for monitoring laser weld quality via plasma light intensity measurements
CN102216485B (zh) 2008-11-14 2014-12-31 西门子Vai金属科技有限公司 用于控制多种金属在适于熔融所述金属的空腔中的引入的方法和装置
JP5862101B2 (ja) * 2011-08-10 2016-02-16 Ｊｆｅスチール株式会社 溶鋼中炭素濃度の分析方法および分析装置
JP6671102B2 (ja) 2015-02-20 2020-03-25 三菱日立パワーシステムズ株式会社 固定装置、回転機械、回転機械の製造方法、組立方法及び取外方法
FI20155549A7 (fi) * 2015-07-10 2017-01-11 Outotec Finland Oy Menetelmä ja laite fludien optista säteilyspektroskooppiaa varten
JP2020187081A (ja) * 2019-05-17 2020-11-19 パナソニックＩｐマネジメント株式会社 ガス保安装置
MX2024011523A (es) * 2022-06-21 2024-09-25 Nippon Steel Corp Sistema de analisis de composicion del ba?o de metal fundido, metodo de analisis de la composicion del ba?o de metal fundido, metodo de gestion del ba?o de galvanizado por inmersion en caliente y metodo de fabricacion de laminas de acero galvanizadas por inmersion en caliente.

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5347034B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1973-09-07 1978-12-18

Also Published As

Publication number Publication date
JPS61140842A (ja) 1986-06-27

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