JPH0333014Y2 - - Google Patents
Info
- Publication number
- JPH0333014Y2 JPH0333014Y2 JP18175584U JP18175584U JPH0333014Y2 JP H0333014 Y2 JPH0333014 Y2 JP H0333014Y2 JP 18175584 U JP18175584 U JP 18175584U JP 18175584 U JP18175584 U JP 18175584U JP H0333014 Y2 JPH0333014 Y2 JP H0333014Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- contact probe
- probe
- hole
- mounting plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 78
- 230000002093 peripheral effect Effects 0.000 claims description 5
- 239000013013 elastic material Substances 0.000 claims description 3
- 238000012360 testing method Methods 0.000 description 10
- 230000001070 adhesive effect Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229920001971 elastomer Polymers 0.000 description 2
- 229920001342 Bakelite® Polymers 0.000 description 1
- 239000004637 bakelite Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18175584U JPH0333014Y2 (de) | 1984-11-30 | 1984-11-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18175584U JPH0333014Y2 (de) | 1984-11-30 | 1984-11-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6196371U JPS6196371U (de) | 1986-06-20 |
| JPH0333014Y2 true JPH0333014Y2 (de) | 1991-07-12 |
Family
ID=30739296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18175584U Expired JPH0333014Y2 (de) | 1984-11-30 | 1984-11-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0333014Y2 (de) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4535828B2 (ja) * | 2004-09-30 | 2010-09-01 | 株式会社ヨコオ | 検査ユニットの製法 |
-
1984
- 1984-11-30 JP JP18175584U patent/JPH0333014Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6196371U (de) | 1986-06-20 |
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