JPH0332736B2 - - Google Patents

Info

Publication number
JPH0332736B2
JPH0332736B2 JP56110400A JP11040081A JPH0332736B2 JP H0332736 B2 JPH0332736 B2 JP H0332736B2 JP 56110400 A JP56110400 A JP 56110400A JP 11040081 A JP11040081 A JP 11040081A JP H0332736 B2 JPH0332736 B2 JP H0332736B2
Authority
JP
Japan
Prior art keywords
output
reference value
sample
detector
backscattered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56110400A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5811842A (ja
Inventor
Sanenori Oka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Nippon Steel Corp
Original Assignee
Seiko Epson Corp
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Nippon Steel Corp filed Critical Seiko Epson Corp
Priority to JP56110400A priority Critical patent/JPS5811842A/ja
Publication of JPS5811842A publication Critical patent/JPS5811842A/ja
Publication of JPH0332736B2 publication Critical patent/JPH0332736B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP56110400A 1981-07-14 1981-07-14 高速x線マツピング装置 Granted JPS5811842A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56110400A JPS5811842A (ja) 1981-07-14 1981-07-14 高速x線マツピング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56110400A JPS5811842A (ja) 1981-07-14 1981-07-14 高速x線マツピング装置

Publications (2)

Publication Number Publication Date
JPS5811842A JPS5811842A (ja) 1983-01-22
JPH0332736B2 true JPH0332736B2 (ko) 1991-05-14

Family

ID=14534838

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56110400A Granted JPS5811842A (ja) 1981-07-14 1981-07-14 高速x線マツピング装置

Country Status (1)

Country Link
JP (1) JPS5811842A (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2605005A1 (en) * 2011-12-14 2013-06-19 FEI Company Clustering of multi-modal data

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5192182A (ko) * 1975-02-10 1976-08-12

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5192182A (ko) * 1975-02-10 1976-08-12

Also Published As

Publication number Publication date
JPS5811842A (ja) 1983-01-22

Similar Documents

Publication Publication Date Title
US3761186A (en) Apparatus for optically inspecting the condition of a surface having known variations in the condition
US3876879A (en) Method and apparatus for determining surface characteristics incorporating a scanning electron microscope
JP2585616B2 (ja) 二次イオン質量分析計方法
US4097158A (en) Half-maximum threshold circuit for optical micrometer
US3779649A (en) Method of and an electro-optical system for inspecting material
WO1986004410A1 (en) Apparatus for detecting positions of crack caused by fatigue
JPH0332736B2 (ko)
JPH0416707A (ja) 電子ビームによるパターン認識方法
US4459482A (en) Auger spectroscopic technique measuring the number of electrons emitted from a surface as a function of the energy level of those electrons
US4177482A (en) Population and profile data of bodies in a transparent mass
JPH0580034A (ja) 超音波探傷装置
US4704558A (en) Method and apparatus for automatic oscilloscope calibration
JPS5940268B2 (ja) アコ−スティック・エミッション信号検出感度検査方法及び装置
JPH0430489Y2 (ko)
JP3399001B2 (ja) 陰極線管のインデックスパターン検査方法及び検査装置
JPS6142817B2 (ko)
JPH01155251A (ja) 表面分析装置
JPS6010048Y2 (ja) 電子線プロ−ブ装置の試料位置設定装置
JPS6235218B2 (ko)
JPS6426129A (en) Ic pattern inspecting device using electron microscope
JPH02238371A (ja) 過渡発光現象測定装置
JPH0674742A (ja) 電子ビーム寸法測定装置
JPH0634723A (ja) 半導体評価解析装置
JPH03181809A (ja) 外観形状評価装置
JPH0425663B2 (ko)