JPH0332736B2 - - Google Patents
Info
- Publication number
- JPH0332736B2 JPH0332736B2 JP56110400A JP11040081A JPH0332736B2 JP H0332736 B2 JPH0332736 B2 JP H0332736B2 JP 56110400 A JP56110400 A JP 56110400A JP 11040081 A JP11040081 A JP 11040081A JP H0332736 B2 JPH0332736 B2 JP H0332736B2
- Authority
- JP
- Japan
- Prior art keywords
- output
- reference value
- sample
- detector
- backscattered
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010894 electron beam technology Methods 0.000 claims description 10
- 230000005855 radiation Effects 0.000 claims description 7
- 238000013507 mapping Methods 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56110400A JPS5811842A (ja) | 1981-07-14 | 1981-07-14 | 高速x線マツピング装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56110400A JPS5811842A (ja) | 1981-07-14 | 1981-07-14 | 高速x線マツピング装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5811842A JPS5811842A (ja) | 1983-01-22 |
JPH0332736B2 true JPH0332736B2 (ko) | 1991-05-14 |
Family
ID=14534838
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56110400A Granted JPS5811842A (ja) | 1981-07-14 | 1981-07-14 | 高速x線マツピング装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5811842A (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2605005A1 (en) * | 2011-12-14 | 2013-06-19 | FEI Company | Clustering of multi-modal data |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5192182A (ko) * | 1975-02-10 | 1976-08-12 |
-
1981
- 1981-07-14 JP JP56110400A patent/JPS5811842A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5192182A (ko) * | 1975-02-10 | 1976-08-12 |
Also Published As
Publication number | Publication date |
---|---|
JPS5811842A (ja) | 1983-01-22 |
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