JPH0332725B2 - - Google Patents

Info

Publication number
JPH0332725B2
JPH0332725B2 JP57074200A JP7420082A JPH0332725B2 JP H0332725 B2 JPH0332725 B2 JP H0332725B2 JP 57074200 A JP57074200 A JP 57074200A JP 7420082 A JP7420082 A JP 7420082A JP H0332725 B2 JPH0332725 B2 JP H0332725B2
Authority
JP
Japan
Prior art keywords
color
sample
measurement data
memories
display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57074200A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58190716A (ja
Inventor
Fukuo Zenitani
Masao Kawai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP57074200A priority Critical patent/JPS58190716A/ja
Publication of JPS58190716A publication Critical patent/JPS58190716A/ja
Publication of JPH0332725B2 publication Critical patent/JPH0332725B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D7/00—Indicating measured values

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Indicating Measured Values (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57074200A 1982-04-30 1982-04-30 試料分析装置用カラ−マツピング装置 Granted JPS58190716A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57074200A JPS58190716A (ja) 1982-04-30 1982-04-30 試料分析装置用カラ−マツピング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57074200A JPS58190716A (ja) 1982-04-30 1982-04-30 試料分析装置用カラ−マツピング装置

Publications (2)

Publication Number Publication Date
JPS58190716A JPS58190716A (ja) 1983-11-07
JPH0332725B2 true JPH0332725B2 (enrdf_load_stackoverflow) 1991-05-14

Family

ID=13540299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57074200A Granted JPS58190716A (ja) 1982-04-30 1982-04-30 試料分析装置用カラ−マツピング装置

Country Status (1)

Country Link
JP (1) JPS58190716A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2524256Y2 (ja) * 1986-12-29 1997-01-29 株式会社島津製作所 電子線マイクロアナライザ
JPS6445047A (en) * 1987-08-14 1989-02-17 Nippon Telegraph & Telephone Measuring device for cathode luminesence
JPH0749415Y2 (ja) * 1988-12-07 1995-11-13 セイコー電子工業株式会社 マッピングアナライザ装置
GB201102614D0 (en) * 2011-02-15 2011-03-30 Oxford Instr Nanotechnology Tools Ltd Material identification using multiple images

Also Published As

Publication number Publication date
JPS58190716A (ja) 1983-11-07

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