JPS58190716A - 試料分析装置用カラ−マツピング装置 - Google Patents

試料分析装置用カラ−マツピング装置

Info

Publication number
JPS58190716A
JPS58190716A JP57074200A JP7420082A JPS58190716A JP S58190716 A JPS58190716 A JP S58190716A JP 57074200 A JP57074200 A JP 57074200A JP 7420082 A JP7420082 A JP 7420082A JP S58190716 A JPS58190716 A JP S58190716A
Authority
JP
Japan
Prior art keywords
color
sample
analysis
measurement
sample analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57074200A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0332725B2 (enrdf_load_stackoverflow
Inventor
Fukuo Zenitani
銭谷　福男
Masao Kawai
河合　政夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP57074200A priority Critical patent/JPS58190716A/ja
Publication of JPS58190716A publication Critical patent/JPS58190716A/ja
Publication of JPH0332725B2 publication Critical patent/JPH0332725B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D7/00—Indicating measured values

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Indicating Measured Values (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57074200A 1982-04-30 1982-04-30 試料分析装置用カラ−マツピング装置 Granted JPS58190716A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57074200A JPS58190716A (ja) 1982-04-30 1982-04-30 試料分析装置用カラ−マツピング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57074200A JPS58190716A (ja) 1982-04-30 1982-04-30 試料分析装置用カラ−マツピング装置

Publications (2)

Publication Number Publication Date
JPS58190716A true JPS58190716A (ja) 1983-11-07
JPH0332725B2 JPH0332725B2 (enrdf_load_stackoverflow) 1991-05-14

Family

ID=13540299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57074200A Granted JPS58190716A (ja) 1982-04-30 1982-04-30 試料分析装置用カラ−マツピング装置

Country Status (1)

Country Link
JP (1) JPS58190716A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63107848U (enrdf_load_stackoverflow) * 1986-12-29 1988-07-12
JPS6445047A (en) * 1987-08-14 1989-02-17 Nippon Telegraph & Telephone Measuring device for cathode luminesence
JPH0279451U (enrdf_load_stackoverflow) * 1988-12-07 1990-06-19
JP2014506996A (ja) * 2011-02-15 2014-03-20 オックスフォード インストルメンツ ナノテクノロジー ツールス リミテッド 複数の画像を用いる材料識別

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63107848U (enrdf_load_stackoverflow) * 1986-12-29 1988-07-12
JPS6445047A (en) * 1987-08-14 1989-02-17 Nippon Telegraph & Telephone Measuring device for cathode luminesence
JPH0279451U (enrdf_load_stackoverflow) * 1988-12-07 1990-06-19
JP2014506996A (ja) * 2011-02-15 2014-03-20 オックスフォード インストルメンツ ナノテクノロジー ツールス リミテッド 複数の画像を用いる材料識別

Also Published As

Publication number Publication date
JPH0332725B2 (enrdf_load_stackoverflow) 1991-05-14

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