JPH0330829B2 - - Google Patents

Info

Publication number
JPH0330829B2
JPH0330829B2 JP16608481A JP16608481A JPH0330829B2 JP H0330829 B2 JPH0330829 B2 JP H0330829B2 JP 16608481 A JP16608481 A JP 16608481A JP 16608481 A JP16608481 A JP 16608481A JP H0330829 B2 JPH0330829 B2 JP H0330829B2
Authority
JP
Japan
Prior art keywords
circuit
resistance
contact
electrode
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP16608481A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5866870A (ja
Inventor
Takashi Noguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP16608481A priority Critical patent/JPS5866870A/ja
Publication of JPS5866870A publication Critical patent/JPS5866870A/ja
Publication of JPH0330829B2 publication Critical patent/JPH0330829B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/08—Measuring resistance by measuring both voltage and current

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP16608481A 1981-10-16 1981-10-16 抵抗測定回路 Granted JPS5866870A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16608481A JPS5866870A (ja) 1981-10-16 1981-10-16 抵抗測定回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16608481A JPS5866870A (ja) 1981-10-16 1981-10-16 抵抗測定回路

Publications (2)

Publication Number Publication Date
JPS5866870A JPS5866870A (ja) 1983-04-21
JPH0330829B2 true JPH0330829B2 (ru) 1991-05-01

Family

ID=15824682

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16608481A Granted JPS5866870A (ja) 1981-10-16 1981-10-16 抵抗測定回路

Country Status (1)

Country Link
JP (1) JPS5866870A (ru)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5057772A (en) * 1990-05-29 1991-10-15 Electro Scientific Industries, Inc. Method and system for concurrent electronic component testing and lead verification
CN104977469B (zh) * 2014-04-04 2018-03-23 中芯国际集成电路制造(上海)有限公司 用于集成电路设计的测量电路和方法

Also Published As

Publication number Publication date
JPS5866870A (ja) 1983-04-21

Similar Documents

Publication Publication Date Title
JP3647904B2 (ja) 着脱自在センサと共に使用される測定器
TW202131356A (zh) 電阻器陣列、具有電阻器陣列的測量電路以及製造用於電阻器陣列的帶狀材料複合體的方法
TW201546461A (zh) 基板檢查裝置以及基板檢查方法
JPH0330829B2 (ru)
JP2002048833A (ja) 回路基板検査装置
JP4219489B2 (ja) 回路基板検査装置
JP6633949B2 (ja) 基板検査装置及び基板検査方法
JP2001035759A (ja) コンデンサのインピーダンス測定装置
US20040188273A1 (en) Electrolytic polishing apparatus, electrolytic polishing method, and wafer subject to polishing
JP3227207B2 (ja) 半導体装置およびその測定方法
JP2977959B2 (ja) 半導体装置およびその測定方法
JPH0192668A (ja) コンデンサの漏洩電流測定方法
JP3612841B2 (ja) ４線式抵抗測定方法および装置
JP2004294316A (ja) 電気特性評価装置
JPH01199173A (ja) 静電容量測定式基板検査装置
JP2836101B2 (ja) プローバのアタッチメントボード
JPH0737954A (ja) コンタクト不良検出装置
JPH0532779Y2 (ru)
JPH0566732B2 (ru)
JPS59200934A (ja) 測温抵抗体計測方式
JPH0814590B2 (ja) 回路素子測定器の端子接続状態検出回路
JPS58201075A (ja) トランスフアリ−ドスイツチの特性測定回路
JPH05281297A (ja) 半導体装置のテスト方法
JP3284693B2 (ja) 陰極線管の電極間リーク電流測定方法及び測定装置並びに陰極線管の検査方法及び検査装置
JPS59171874A (ja) 絶縁耐圧試験機