JPH03283536A - Washing apparatus - Google Patents

Washing apparatus

Info

Publication number
JPH03283536A
JPH03283536A JP8340590A JP8340590A JPH03283536A JP H03283536 A JPH03283536 A JP H03283536A JP 8340590 A JP8340590 A JP 8340590A JP 8340590 A JP8340590 A JP 8340590A JP H03283536 A JPH03283536 A JP H03283536A
Authority
JP
Japan
Prior art keywords
steam
tank
washing
cleaned
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8340590A
Other languages
Japanese (ja)
Inventor
Akira Tsuboi
明 坪井
Kouzou Iijima
功造 飯島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
NEC Ibaraki Ltd
Original Assignee
NEC Corp
NEC Ibaraki Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, NEC Ibaraki Ltd filed Critical NEC Corp
Priority to JP8340590A priority Critical patent/JPH03283536A/en
Publication of JPH03283536A publication Critical patent/JPH03283536A/en
Pending legal-status Critical Current

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  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To perfectly remove contamination by comprising an ultrasonic wave tank for washing objects with ultrasonic wave and a steam tank for washing objects with heated steam, being provided with a shower washing means for washing objects by spraying a new solvent after washing by steam of objects. CONSTITUTION:After a wafer as a washing object is washed by ultrasonic wave in an ultrasonic wave tank 1, the object is moved by a carrier 8 and transferred into an immersing tank 2 for washing by immersing. Thereafter, the object is washed by the steam in a steam tank 3, it is then moved into the spraying range of an organic solvent shower 9 with the carrier 8 and the wafer as washing object is spray-washed by spraying a new solvent. Thereby, contaminants floating on the surface of the organic solvent adhered to both sides of wafer can be removed perfectly. Namely, since the organic solvent shower 9 is provided at the upper part of the steam tank 3 and washing is carried out with a new solvent after contamination at the liquid surface of organic solvent adhered to objects is washed by the steam when the object is taken out, contaminants adhered on the object can be removed perfectly.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は洗浄装置に関し、特に半導体電子部品の製造工
程におけるウェハー上の有機物を洗浄して除去すること
のできる洗浄装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a cleaning device, and more particularly to a cleaning device capable of cleaning and removing organic matter on a wafer in the manufacturing process of semiconductor electronic components.

[従来の技術] 従来、この種のウェハーの洗浄装置としては第2図に示
すものがある。
[Prior Art] As a conventional wafer cleaning apparatus of this type, there is one shown in FIG.

図において、この洗浄装置は、超音波槽1、侵積槽2及
び蒸気槽3で構成されている。
In the figure, this cleaning device is comprised of an ultrasonic tank 1, an infiltration tank 2, and a steam tank 3.

上記超音波槽lの底部には超音波を発生する振動子1a
が設けられており、キャリアー8内に挿入保持されたウ
ェハー等の被洗浄物を溶剤6の中に侵積けして超音波洗
浄できる構成となっている。この超音波槽1の洗浄後は
図示せぬ移動手段によりキャリアー8が移動して侵積槽
2の溶剤の中に被洗浄物であるウェハーを侵積けして洗
浄する。この後、蒸気槽3で被洗浄物であるウェハーは
蒸気洗浄される。この蒸気槽3の底部にはヒーター5が
配設されており、このヒーター5の加熱により溶剤6は
ペーパー7を発生する。このペーパー7により被洗浄物
であるウェハーは蒸気洗浄される。このペーパー7は蒸
気槽3の上部に配設された冷却コイル4によって凝縮回
収される。
At the bottom of the ultrasonic tank l is a vibrator 1a that generates ultrasonic waves.
is provided so that an object to be cleaned, such as a wafer inserted and held in the carrier 8, can be immersed in the solvent 6 and subjected to ultrasonic cleaning. After cleaning the ultrasonic tank 1, the carrier 8 is moved by a moving means (not shown) to immerse the wafer, which is the object to be cleaned, into the solvent in the immersion tank 2 for cleaning. Thereafter, the wafer, which is the object to be cleaned, is steam cleaned in the steam bath 3. A heater 5 is disposed at the bottom of the steam tank 3, and the solvent 6 generates paper 7 by heating the heater 5. A wafer, which is an object to be cleaned, is steam-cleaned using this paper 7. This paper 7 is condensed and recovered by a cooling coil 4 disposed above the steam tank 3.

上=2構成よりなる従来の洗浄装置では、まず。In a conventional cleaning device consisting of two configurations, first.

超音波槽lで被洗浄物であるウェハーを超音波洗浄した
後、侵積槽2で侵積は洗浄する。その後、蒸気槽3で蒸
気洗浄される。
After a wafer, which is an object to be cleaned, is ultrasonically cleaned in an ultrasonic bath 1, the invasive material is cleaned in an immersion bath 2. Thereafter, it is steam cleaned in a steam tank 3.

[発明が解決しようとする課題] しかしながら、従来の洗浄装置では被洗浄物であるウェ
ハーを超音波槽l及び侵積槽2から夫々取り出す時に各
槽内に満たされている有機溶剤上面に浮いている汚れが
ウェハーに付着するため、蒸気槽3による蒸気洗浄にお
いても充分に汚れを除去できない欠点がある。
[Problems to be Solved by the Invention] However, in the conventional cleaning apparatus, when the wafer to be cleaned is taken out from the ultrasonic bath 1 and the immersion bath 2, the organic solvent that is filled in each bath floats on the top surface. Since the dirt attached to the wafer adheres to the wafer, there is a drawback that even steam cleaning using the steam bath 3 cannot sufficiently remove the dirt.

[課題を解決するための手段] 本発明の洗浄装置は、少な(とも被洗浄物を超音波で洗
浄する超音波槽と、加熱された蒸気によって洗浄する蒸
気槽とを備え、前記蒸気槽には被洗浄物の蒸気洗浄後に
新溶剤を被洗浄物に噴出して洗浄するシャワー洗浄手段
を含むように構成したものである。
[Means for Solving the Problems] The cleaning apparatus of the present invention includes an ultrasonic bath for cleaning objects to be cleaned with ultrasonic waves, and a steam bath for cleaning objects with heated steam, The apparatus is constructed to include a shower cleaning means for spraying fresh solvent onto the object to clean it after steam cleaning the object.

E実施例] 次に、本発明の実施例について図面を参照して詳細に説
明する。
E Example] Next, an example of the present invention will be described in detail with reference to the drawings.

第1図は本発明の洗浄装置の一実施例を示す構成図であ
る。なお、第1図において、第2図のものと同一の機能
及び構成を有するものについては同じ符号を用いて説明
する。
FIG. 1 is a configuration diagram showing an embodiment of the cleaning device of the present invention. In FIG. 1, parts having the same functions and configurations as those in FIG. 2 will be described using the same reference numerals.

図において、この洗浄装置は、超音波槽1、侵積槽2及
び蒸気槽3で構成されている。
In the figure, this cleaning device is comprised of an ultrasonic tank 1, an infiltration tank 2, and a steam tank 3.

上記超音波槽1の底部には超音波を発生する振動子1a
が設けられており、キャリアー8内に挿入保持されたウ
ェハー等の被洗浄物を溶剤6の中に侵積けして超音波洗
浄できる構成となっている。この超音波槽lの洗浄後は
キャリアー8が移動して侵積槽2の溶剤の中に被洗浄物
であるウェハーを侵積けして洗浄する。この後、蒸気槽
3で被洗浄物であるウェハーは蒸気洗浄される。この蒸
気槽3の底部にはヒーター5が配設されており、このヒ
ーター5の加熱により溶剤6はペーパー7を発生する。
At the bottom of the ultrasonic tank 1 is a vibrator 1a that generates ultrasonic waves.
is provided so that an object to be cleaned, such as a wafer inserted and held in the carrier 8, can be immersed in the solvent 6 and subjected to ultrasonic cleaning. After cleaning the ultrasonic tank 1, the carrier 8 moves to immerse the wafer, which is the object to be cleaned, into the solvent in the immersion tank 2 for cleaning. Thereafter, the wafer, which is the object to be cleaned, is steam cleaned in the steam bath 3. A heater 5 is disposed at the bottom of the steam tank 3, and the solvent 6 generates paper 7 by heating the heater 5.

このペーパー7により被洗浄物であるウェハーは蒸気洗
浄される。このペパー7は蒸気槽3の上部に配設された
冷却コイル4によって凝縮回収される。この蒸気槽3の
上部には有機溶剤シャワー9が配設されており、このシ
ャワー9によりキャリアー8内に保持された被洗浄物に
新しい溶剤を噴出してスプレー洗浄できる構成となって
いる。
A wafer, which is an object to be cleaned, is steam-cleaned using this paper 7. This pepper 7 is condensed and recovered by a cooling coil 4 disposed above the steam tank 3. An organic solvent shower 9 is disposed above the steam tank 3, and the shower 9 is configured to spray fresh solvent onto the object held in the carrier 8 for spray cleaning.

上記構成よりなる洗浄装置の作用について説明する。The operation of the cleaning device having the above configuration will be explained.

まず、超音波槽1で被洗浄物であるウェハーを超音波洗
浄した後、キャリアー8により被洗浄物を移動して侵積
槽2で侵積は洗浄する。その後、蒸気槽3で蒸気洗浄し
た後、キャリアー8により有機溶剤シャワー9の噴出範
囲内に移動させて被洗浄物であるウェハーに新溶剤を噴
出してスプレー洗浄する。こうすることによって、ウェ
ハーの両面に付着した有機溶剤液面に浮いている汚れを
完全に落すことができる。
First, a wafer, which is an object to be cleaned, is ultrasonically cleaned in an ultrasonic tank 1, and then the object to be cleaned is moved by a carrier 8, and the invasion is cleaned in an invasion tank 2. Thereafter, after steam cleaning in the steam tank 3, the wafer is moved by the carrier 8 into the spout range of the organic solvent shower 9, and a new solvent is spouted onto the wafer to be cleaned, thereby spray cleaning the wafer. By doing so, it is possible to completely remove dirt floating on the surface of the organic solvent adhering to both surfaces of the wafer.

[発明の効果] 以上説明したように、本発明は、蒸気槽上部に有機溶剤
シャワーを設けるようにしているので被洗浄物取り出し
時に被洗浄物に付着した有機溶剤液面の汚れを蒸気洗浄
後見に新しい溶剤で洗浄するので、被洗浄物に付着した
汚れを完全に除去できる効果がある。
[Effects of the Invention] As explained above, in the present invention, since an organic solvent shower is provided at the top of the steam tank, dirt on the organic solvent liquid surface adhering to the object to be cleaned can be checked after steam cleaning when the object to be cleaned is taken out. Since cleaning is performed with a fresh solvent after the cleaning process, dirt adhering to the object to be cleaned can be completely removed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例に係る洗浄装置の構成を示す
図、第2図は従来の洗浄装置の構成を示す図である。 l・・・超音波槽、la・・・振動子、2・・・浸積槽
、3・・・蒸気槽、4・・・冷却コイル、5・・・ヒー
ター、6・・・溶剤、7・・・ペーパー、8・・・キャ
リアー、9・・・有機溶剤シャワー
FIG. 1 is a diagram showing the configuration of a cleaning device according to an embodiment of the present invention, and FIG. 2 is a diagram showing the configuration of a conventional cleaning device. l... Ultrasonic bath, la... Vibrator, 2... Immersion tank, 3... Steam tank, 4... Cooling coil, 5... Heater, 6... Solvent, 7・・・Paper, 8...Carrier, 9...Organic solvent shower

Claims (1)

【特許請求の範囲】[Claims]  被洗浄物を有機溶剤を用いて洗浄する洗浄装置におい
て、前記洗浄装置には少なくとも被洗浄物を超音波で洗
浄する超音波槽と、加熱された蒸気によって洗浄する蒸
気槽とを備え、前記蒸気槽には被洗浄物の蒸気洗浄後に
新溶剤を被洗浄物に噴出して洗浄するシャワー洗浄手段
を含むようにしたことを特徴とする洗浄装置。
A cleaning device that cleans an object to be cleaned using an organic solvent, the cleaning device includes at least an ultrasonic bath that cleans the object to be cleaned with ultrasonic waves, and a steam bath that cleans the object with heated steam, A cleaning device characterized in that the tank includes a shower cleaning means for spraying fresh solvent onto the object to be cleaned after steam cleaning the object.
JP8340590A 1990-03-30 1990-03-30 Washing apparatus Pending JPH03283536A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8340590A JPH03283536A (en) 1990-03-30 1990-03-30 Washing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8340590A JPH03283536A (en) 1990-03-30 1990-03-30 Washing apparatus

Publications (1)

Publication Number Publication Date
JPH03283536A true JPH03283536A (en) 1991-12-13

Family

ID=13801519

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8340590A Pending JPH03283536A (en) 1990-03-30 1990-03-30 Washing apparatus

Country Status (1)

Country Link
JP (1) JPH03283536A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5511569A (en) * 1993-07-20 1996-04-30 Mitsubishi Denki Kabushiki Kaisha Cleaning apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5511569A (en) * 1993-07-20 1996-04-30 Mitsubishi Denki Kabushiki Kaisha Cleaning apparatus

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