JP4043189B2 - Method for cleaning substrate for electrophotographic photosensitive member - Google Patents

Method for cleaning substrate for electrophotographic photosensitive member Download PDF

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Publication number
JP4043189B2
JP4043189B2 JP2000384451A JP2000384451A JP4043189B2 JP 4043189 B2 JP4043189 B2 JP 4043189B2 JP 2000384451 A JP2000384451 A JP 2000384451A JP 2000384451 A JP2000384451 A JP 2000384451A JP 4043189 B2 JP4043189 B2 JP 4043189B2
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Prior art keywords
substrate
cleaning
photosensitive member
electrophotographic photosensitive
brush
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JP2002182404A (en
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泰秀 高下
文夫 宮本
立志 馬屋原
栄 鈴木
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Ricoh Co Ltd
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Ricoh Co Ltd
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Description

【0001】
【発明の属する技術分野】
本発明は、電子写真感光体用アルミニウム円筒基体表面に感光層を形成する前に、該基体を洗浄する基体の洗浄方法に関する。
【0002】
【従来の技術】
電子写真感光体は、導電性の円筒基体の外周面に感光性物質を含有する塗布液を塗布して、基体外周面に感光層を形成することにより製造される。感光層を形成する際、基体に油成分、異物等が付着していると、該塗布液中に基体が浸漬されることにより、塗布液が汚染され、塗布液が劣化して所定の性質を有する感光層を形成することができなくなる。
【0003】
このため、感光性物質を含有する塗布液が基体外周面に塗布される前に、その基体を洗浄する必要がある。このような基体の洗浄方法としては、溶剤、準水系洗浄剤、水系洗浄剤、純水を用いて洗浄する方法があるが、現在は、オゾン層破壊や地球温暖化、大気汚染等の環境問題及び人体にも悪影響を及ぼすことから塩素系溶剤の削減ないし全廃の方向に移行しており、水系洗浄剤または純水を用いて基体を洗浄する方向に移行している。
【0004】
電子写真感光体用アルミニウム円筒基体(以下、基体)は、その表面を切削加工、しごき加工あるいは冷間引抜き加工などにより加工した物が使われている。しかし、切削加工にて加工した基体の表面には周方向の切削目に沿ってワイヤー状の微細なバリ等が発生している。また、塑性加工にて加工した基体の表面にはササクレやアルミカスの付着等により、長さ方向に沿って微細な欠陥が存在している。
【0005】
このような起上がり状の凸状欠陥を除去する方法としては、弾性部材を該円筒基体の表面に押し付けて除去する方法がある。しかし、この方法においてもすべてのバリを除去することはできない。
【0006】
基体に付着した油分の洗浄方法としては、洗浄液中において超音波発振器にて超音波を照射させて洗浄する方法が一般的である。しごき加工あるいは冷間引抜き加工などにより得た基体表面には、加工時に使用される高粘度油が付着している。この高粘度油は、超音波を照射する方法では、完全に除去することができない。
【0007】
また、超音波発振器による超音波照射は前記記載の切削加工のバリ、塑性加工のササクレ等を起上がらせて、起上がり状の凸状欠陥としてしまう。超音波発振器による超音波照射による上記記載の切削加工のバリ、塑性加工のササクレ等の起上がり状の凸状欠陥を防止する方法として、超音波照射時間と超音波出力を調整して起上がり状の凸状欠陥を防止する方法がる。しかし、この方法においてもすべての起上がり状の凸状欠陥を防止することはできない。
【0008】
【発明が解決しようとする課題】
切削加工,塑性加工された基体を洗浄するにあたり、それぞれ上記のような問題が未解決となっている。また、切削加工、塑性加工された基体の表面状態は異なり、それぞれの用途に合った洗浄ラインが必要とされている。さらに、近年、プリンター、デジタル複写機などレーザー光のような単波長光を像露光光とする電子写真装置に鏡面管を使用すると画像にモアレが発生するため、基体の表面はある程度の粗面が必要とされている。
【0009】
従来、切削バイトを工夫することにより、切削時に所定の粗面を得る方法が知られているが、この様に切削バイトを工夫して切削した場合には、円筒基体の表面には周方向の切削目に沿ってワイヤー状の微細なバリ等や該円筒基体を塑性加工にて加工した際に発生した表面のササクレやアルミカスの付着等により長さ方向に沿って微細な欠陥が発生してしまい、該円筒基体に塗工を行うと、電極集中が発生してしまう。また、塑性加工された基体表面に付着した高粘度油を完全に除去しなければ、均一な感光層を形成することができない。
【0010】
本発明の目的は、上記の様な切削加工・塑性加工品のそれぞれの欠点を同一ラインで一気に改良することで、欠陥の無い電子写真感光体用アルミニウム円筒基体の洗浄方法を提供することである。また、生産する基体が切り替わっても洗浄設備の切替が不要であるなど生産効率の良い電子写真感光体用アルミニウム円筒基体の洗浄方法を提供することである。
【0011】
【課題を解決するための手段】
本発明の上記課題は、下記の手段により解決される。
すなわち、本発明は、第一に、切削加工または塑性加工で得られた電子写真感光体用基体を同一ラインで洗浄可能な基体洗浄方法であって、洗浄液とともにブラシによって基体を洗浄する接触洗浄工程と、該接触洗浄工程の後に、超音波振動が付与された水系洗浄液中に基体を浸漬して該基体を洗浄する超音波洗浄からなる洗浄工程と、該洗浄工程の後に、水または純水を使用して基体に付着した水系洗剤成分を除去するすすぎ工程と、該すすぎ工程の後に、温純水中に基体を浸漬して加熱した後に該基体を温純水中から引き上げて基体に付着した温純水を乾燥させる乾燥工程からなる電子写真感光体用基体の洗浄方法を主要な特徴とする。
【0012】
第二に、上記第一のブラシによる接触洗浄工程において、ブラシをワークの内・外周面に接触させて回転させるに際し、回転方向は外面ブラシと基体は同一方向に、内面ブラシは外面ブラシと基体と反対方向とする電子写真感光体用基体の洗浄方法を特徴とする。
【0013】
第三に、上記第一または第二のブラシによる接触洗浄工程で、ブラシをワークの内・外周面に接触させて回転させるに際し、周速を10m/分以上50m/分以下とする電子写真感光体用基体の洗浄方法を特徴とする。
【0014】
第四に、上記第一の超音波洗浄工程の超音波周波数が100kHz以上とする電子写真感光体用基体の洗浄方法を特徴とする。
【0015】
第五に、上記第四の洗浄工程の超音波照射時間が30秒以上120秒以内である電子写真感光体用基体の洗浄方法を特徴とする。
【0016】
第六に、上記第一の洗浄工程のすすぎ工程において、水または純水を基体にシャワーした後、水または純水中に基体を浸漬させ気泡を接触させる電子写真感光体用基体の洗浄方法を特徴とする。
【0017】
第七に、上記第一または第六のすすぎ工程のシャワーにおいて、基体の内外面ともにシャワーを噴射する際の圧力を0.2MPa以上1.5MPa以下とする電子写真感光体用基体の洗浄方法を特徴とする。
【0018】
第八に、上記第一、第六または第七のすすぎ工程のシャワーにおいて、基体1本当たりのシャワー流量が1L以上3L以下とする電子写真感光体用基体の洗浄方法を特徴とする。
【0019】
第九に、上記第六の洗浄工程の気泡を発生させるすすぎ工程で、気泡源として圧縮空気、ブロワーエアー,ポンプエアーを使用する電子写真感光体用基体の洗浄方法を特徴とする。
【0020】
第十に、上記第六または第九のすすぎ工程の気泡の大きさは、φ5mm以上φ100mm以下の大きさである電子写真感光体用基体の洗浄方法を特徴とする。
【0021】
第十一に、上記第一、第九または第十のすすぎ工程のエアー流量が、60NL/min以上80NL/min以下である電子写真感光体用基体の洗浄方法を特徴とする。
【0022】
第十二に、上記第一の洗浄工程における乾燥工程において、純水温度を70℃以上95℃以下とする電子写真感光体用基体の洗浄方法を特徴とする。
【0023】
第十三に、上記第一または第十二の乾燥工程において、温純水の比抵抗が1MΩ・cmより小さい電子写真感光体用基体の洗浄方法を特徴とする。
【0024】
第十四に、上記第一、第十二または第十三の乾燥工程において、温純水中からの基体の引き上げ速度を20mm/sec 以下とする電子写真感光体用基体の洗浄方法を特徴とする。
【0025】
【発明の実施の形態】
以下に本発明を詳細に説明する。
本発明は、切削加工、しごき加工あるいは冷間引抜き加工などにより得た電子写真感光体用基体を同一ラインで感光層の塗膜欠陥を招くことなく洗浄できる電子写真感光体用基体の洗浄方法である。
以下に本発明の実施例について図面に基づき説明する。まず、ブラシによる接触洗浄11が実施される。この接触洗浄11では、該基体の内・外周面に円柱状ブラシを接触させる。使用するブラシは、図2に示す様なブラシ形状を使用する。この時のブラシのパイルはナイロン製であり、パイル径は、起上がり状の凸状欠陥の除去のしやすさ、該円筒基体表面への傷の付きにくさを考慮し、パイル径はφ0.2mmを使用する。
【0026】
該ブラシを取り付ける洗浄装置は、該ブラシ及び該円筒基体を回転させる機構を持っている洗浄装置を使用する。まず、該洗浄装置に設置された内面洗浄用ブラシ(図2−a)に、保持具(図2−b)により保持された該円筒基体を降下させて挿入する。基体を保持したまま、保治具を回転させることにより該円筒基体が回転する。内面洗浄用ブラシはこれと反対に回転させる。これにより該円筒基体と内面用ブラシが接周する。その状態で、回転させた外面用ブラシ(図2−c)を該円筒基体外面に接周させる。この際の該ブラシと該円筒基体との回転方向を同一方向とすることにより、該円筒基体と該ブラシとの接点部分は互いに反対方向の動きとなり、凸状欠陥を除去する能力、及び該円筒基体表面に付着した油汚れ、異物等を除去する能力が向上し、良好である。これ以外の回転方向の組み合わせであると、洗浄効率が低下する。
【0027】
また該円筒基体と該ブラシの回転速度は、該円筒基体と該ブラシの接触面の周速にて規定する。該円筒基体と該ブラシとの接触面の周速は、10m/分以上50m/分以下が好ましい。10m/分以下であると、起上がり状の凸状欠陥の除去がしにくくなる。また、50m/分以上であると、電子写真感光体用アルミニウム円筒基体の表面への傷が付きやすくなる。今回は、40m/分で実験した。
【0028】
本実験では、上記記載の洗浄機にて洗浄を行う際、該円筒基体と前記記載のブラシとの間に高粘度油を洗浄する目的でケロシンを使用したが、特にこれに限定することはない。上記の様にブラシを該円筒基体に接周させることにより、該円筒基体表面の切削加工にて周方向の切削目に沿ったワイヤー状の微細なバリや塑性加工にて発生したササクレやアルミカスの付着等により発生した長さ方向に沿った微細な欠陥などの起上がり状の凸状欠陥、高粘度油を除去することができる。
【0029】
次の超音波洗浄工程12では、基体を水系洗浄液中に浸漬させ、超音波を照射する。この超音波洗浄では、基体に残留したケロシンを完全に除去する。まず、超音波発振器の周波数であるが、該円筒基体表面の起上がり状の凸状欠陥を防止するためには、高周波の超音波を使用する。具体的には、100KHz以上の周波数の超音波発振器を使用する。100KHz未満であると、該円筒基体表面の切削加工にて周方向の切削目に沿ったワイヤー状の微細なバリや塑性加工にて発生したササクレやアルミカスの付着等により発生した長さ方向に沿った微細な欠陥などが、超音波によりたたかれ、起上がり状の凸状欠陥となってしまう。超音波の照射方式は特に限定されるものではない。今回の実験では、133KHzの超音波を採用した。
【0030】
100KHz以上の超音波を用いて洗浄する場合、洗浄時間は30秒以上120秒以内が必要となる。今回の実験では、60秒を採用した。
【0031】
次のシャワー洗浄工程13では、水を基体の内周面および外周面に0.2MPa以上〜1.5MPa以下の圧力で噴射する。0.2MPa以下では、すすぎ力が小さく,1.5MPa以上になるとすすぎ力が変わらず水の無駄となり、排水処理量も増えるため、前記範囲が好ましい。今回の実験では、1MPaを採用した。
【0032】
この工程では、前工程で付着した水系洗浄液の大半を洗い流す。次のバブリング洗浄工程14だけでも水系洗浄液を完全に落とすことは可能であるが、この水は活性炭等で処理しなければ排水できない。よって処理水が増えるため、ランニングコストが高くなる。ゆえに、少流量の水で効率的にすすぎが実施できる水シャワー洗浄を実施する。
【0033】
次のバブリング洗浄工程14では、基体を純水中に浸漬させ、ワークの下方からエアーを噴射させる。このエアーは、従来の工場圧縮空気やブロワーによる空気やダイヤフラムポンプによる空気が良い。テストの結果この気泡の大きさは、φ5mm以上φ100mm以下の範囲が好ましいことが判っている。今回の実験では、下記の条件で行った。
・気泡の大きさ:φ30mm
・エアーの流量:70NL/min
これにより、基体に付着した水系洗浄剤を完全に除去することができた。
【0034】
次の温純水乾燥15では、加熱した純水中に基体を浸漬させ、ドラムが純水温度まで加熱された後に、基体を一定速度で引き上げる。これにより、基体の外周面に付着している純水が蒸発して、水切りされる。この時の純水温度は70℃以上95℃以下が好ましい。70℃以下の場合、基体表面に乾燥シミができることが確認されている。
【0035】
比抵抗が1MΩ・cmより大きな温純水に基体を浸漬させた場合、基体表面に水酸化被膜ができやすくなる。これは、感光層を形成した際の電気的特性に影響を与えてしまうため、好ましくない。また、温純水中からの基体の引き上げ速度が20mm/sec 以上である場合、基体に付着する水が多く、乾燥しにくくなる。今回の実験では、下記の条件で行った。
・温純水温度:80℃
・温純水比抵抗:0.6MΩ・cm
・基体引き上げ速度:10mm/sec
【0036】
【発明の効果】
以上のように、請求項1の発明は、切削加工または塑性加工で得られた電子写真感光体用基体を同一ラインで洗浄可能な基体洗浄方法であって、ブラシによる接触洗浄工程、超音波洗浄工程、水系洗剤成分を除去するすすぎ工程、温純水乾燥工程からなることから、得られた基体上に感光層を塗布することにより、均一で欠陥の無い感光層を形成することができる。
【0037】
請求項2の発明は、上記洗浄方法において、ブラシをワークの内・外周面に接触させて回転させるに際し、回転方向は外面ブラシと基体は同一方向に、内面ブラシは外面ブラシと基体と反対方向とすることから、該円筒基体と該ブラシとの接点部分は互いに反対方向の動きとなり、凸状欠陥を除去する能力、該円筒基体表面に付着した油汚れ、異物等を除去する能力が一段と向上する。これ以外の回転方向の組み合わせであると洗浄効率が低下する。
【0038】
請求項3の発明は、上記洗浄方法において、ブラシをワークの内・外周面に接触させて回転させるに際し、周速を10m/分以上50m/分以下とすることから、起上がり状の凸状欠陥の除去がしやすく、かつまた、円筒基体表面への傷が付きにくい。
【0039】
請求項4の発明は、上記洗浄方法において、洗浄工程の超音波周波数が100kHz以上とすることから、周方向のワイヤー状の微細なバリや基体の長さ方向の微細な欠陥などが超音波でたたかれ、起上がり状の凸状欠陥となってしまうことが防げる。
【0040】
請求項5の発明は、上記洗浄方法において、洗浄工程の超音波照射時間が30秒以上120秒以内あることから、100KHz以上の超音波により良好な洗浄を行うことができる。
【0041】
請求項6の発明は、上記洗浄方法において、水または純水を基体にシャワーした後、水または純水中に基体を浸漬させ気泡を接触させることから、前工程で付着した水系洗浄液を十分に落とすことができる。
【0042】
請求項7の発明は、上記すすぎ工程のシャワーにおいて、基体の内外面にシャワーを噴射する際の圧力を0.2MPa以上1.5MPa以下とすることから、すすぎ力が小さくならず、かつまた、水を無駄にしない。
【0043】
請求項8の発明は、上記すすぎ工程のシャワーにおける基体1本当たりのシャワー流量が1L以上3L以下とすることから、適量、かつ、有効なすすぎができる。
【0044】
請求項9の発明は、上記気泡を発生させるすすぎ工程で、気泡源として圧縮空気、ブロワーエアー、ポンプエアーを使用することから、ワークの下方からエアーを噴射させるのに非常に有効である。
【0045】
請求項10の発明は、上記気泡の大きさは、φ5mm以上φ100mm以下の大きさであることから、基体に付着した水系洗浄剤の除去が優れている。
【0046】
請求項11の発明は、上記すすぎ工程のエアー流量が60NL/min以上80NL/min以下であることから、基体に付着した水系洗浄剤の除去が優れている。
【0047】
請求項12の発明は、上記乾燥工程における純水温度を70℃以上95℃以下とすることから、基体表面に乾燥シミを作らず、基体の外周面に付着している純水を良好に水切りすることができる。
【0048】
請求項13の発明は、上記乾燥工程における温純水の比抵抗が1MΩ・cmより小さいことから、基体表面にできやすい水酸化被膜の生成を防止でき、感光層電気的特性に悪影響を与えない。
【0049】
請求項14の発明は、上記乾燥工程における温純水中からの基体の引き上げ速度を20mm/sec以下とすることから、基体に付着する水を多くせず、乾燥しにくくさせない。
【図面の簡単な説明】
【図1】本発明の洗浄方法における洗浄槽の構成(工程)を示す図。
【図2】ブラシの形状を示す図。
【図3】接触洗浄機による基体の洗浄状態を示す図。
【符号の説明】
11 ブラシによる接触洗浄工程
12 超音波洗浄工程
13 シャワー洗浄工程
14 バブリング洗浄工程
15 温純水乾燥工程
a 内面洗浄ブラシ
b 保持具
c 外面用ブラシ
d 円筒基体
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a substrate cleaning method for cleaning a substrate before forming a photosensitive layer on the surface of an aluminum cylindrical substrate for an electrophotographic photoreceptor.
[0002]
[Prior art]
An electrophotographic photosensitive member is produced by applying a coating solution containing a photosensitive substance on the outer peripheral surface of a conductive cylindrical substrate to form a photosensitive layer on the outer peripheral surface of the substrate. When the photosensitive layer is formed, if an oil component, foreign matter or the like adheres to the substrate, the substrate is immersed in the coating solution, thereby contaminating the coating solution and deteriorating the coating solution. It becomes impossible to form the photosensitive layer.
[0003]
For this reason, it is necessary to wash the substrate before the coating liquid containing the photosensitive substance is applied to the outer peripheral surface of the substrate. Such substrate cleaning methods include cleaning methods using solvents, semi-aqueous cleaning agents, aqueous cleaning agents, and pure water, but currently there are environmental problems such as ozone layer destruction, global warming, and air pollution. In addition, since it has an adverse effect on the human body, it has shifted to the reduction or elimination of chlorinated solvents, and has shifted to the direction of cleaning the substrate using an aqueous cleaning agent or pure water.
[0004]
An aluminum cylindrical substrate (hereinafter referred to as “substrate”) for an electrophotographic photosensitive member is obtained by processing its surface by cutting, ironing, or cold drawing. However, fine wire-like burrs and the like are generated on the surface of the substrate processed by the cutting process along the circumferential cut line. In addition, fine defects exist along the length direction on the surface of the substrate processed by plastic processing due to adhesion of crust and aluminum residue.
[0005]
As a method of removing such a raised convex defect, there is a method of removing the elastic member by pressing it against the surface of the cylindrical substrate. However, even this method cannot remove all burrs.
[0006]
As a method of cleaning the oil adhering to the substrate, a method of cleaning by irradiating ultrasonic waves with an ultrasonic oscillator in a cleaning liquid is common. A high-viscosity oil used during processing adheres to the surface of the substrate obtained by ironing or cold drawing. This high viscosity oil cannot be completely removed by the method of irradiating ultrasonic waves.
[0007]
Further, the ultrasonic irradiation by the ultrasonic oscillator raises the above-described cutting burrs, plastic working crumbs, and the like, resulting in raised convex defects. As a method of preventing raised convex defects such as burrs in cutting and rusting in plastic working due to ultrasonic irradiation by an ultrasonic oscillator, the rising state is adjusted by adjusting the ultrasonic irradiation time and ultrasonic output. There is a method for preventing the convex defect. However, even this method cannot prevent all the raised convex defects.
[0008]
[Problems to be solved by the invention]
The above-mentioned problems have not been solved in cleaning the substrate that has been cut and plastic processed. Further, the surface state of the substrate subjected to cutting and plastic processing is different, and a cleaning line suitable for each application is required. Further, in recent years, when a mirror tube is used in an electrophotographic apparatus that uses single-wavelength light such as laser light as image exposure light, such as a printer or a digital copying machine, moire is generated in the image. is needed.
[0009]
Conventionally, a method of obtaining a predetermined rough surface at the time of cutting by devising a cutting bite is known. However, when the cutting bite is devised and cut in this way, the surface of the cylindrical base body has a circumferential direction. Fine defects along the length direction are generated due to adhesion of fine burrs, etc., in the form of wires along the cut lines, and surface crusts and aluminum debris generated when the cylindrical substrate is processed by plastic working. When coating is performed on the cylindrical substrate, electrode concentration occurs. In addition, a uniform photosensitive layer cannot be formed unless the high-viscosity oil adhering to the surface of the substrate subjected to plastic processing is completely removed.
[0010]
An object of the present invention is to provide a method for cleaning an aluminum cylindrical substrate for an electrophotographic photosensitive member free from defects by improving each defect of the above-described cutting / plastic processing product at once in the same line. . Another object of the present invention is to provide a method for cleaning an aluminum cylindrical substrate for an electrophotographic photosensitive member with high production efficiency, such as no need to switch cleaning equipment even when the substrate to be produced is switched.
[0011]
[Means for Solving the Problems]
The above-described problems of the present invention are solved by the following means.
That is, the present invention is, firstly, a substrate cleaning method capable of cleaning an electrophotographic photoreceptor substrate obtained by cutting or plastic processing on the same line, and a contact cleaning step of cleaning the substrate with a brush together with a cleaning liquid. And after the contact cleaning step, a cleaning step comprising ultrasonic cleaning in which the substrate is cleaned by immersing the substrate in an aqueous cleaning solution to which ultrasonic vibration is applied, and water or pure water is added after the cleaning step. A rinsing step for removing the aqueous detergent component attached to the substrate by using, and after the rinsing step, the substrate is immersed in warm pure water and heated, and then the substrate is lifted from the warm pure water to dry the warm pure water adhered to the substrate. The main feature is a method for cleaning a substrate for an electrophotographic photoreceptor comprising a drying step.
[0012]
Second, in the contact cleaning process using the first brush, when the brush is brought into contact with the inner and outer peripheral surfaces of the workpiece and rotated, the outer brush and the base are rotated in the same direction, and the inner brush is the outer brush and the base. And a method of cleaning the substrate for an electrophotographic photoreceptor in the opposite direction.
[0013]
Third, in the contact cleaning step using the first or second brush, when rotating the brush while contacting the inner and outer peripheral surfaces of the workpiece, the peripheral speed is set to 10 m / min to 50 m / min. It is characterized by a method for cleaning a body substrate.
[0014]
Fourth, the electrophotographic photoreceptor substrate cleaning method is characterized in that the ultrasonic frequency in the first ultrasonic cleaning step is 100 kHz or more.
[0015]
Fifth, the method for cleaning a substrate for an electrophotographic photoreceptor, wherein the ultrasonic irradiation time in the fourth cleaning step is 30 seconds or more and 120 seconds or less.
[0016]
Sixth, there is provided a method for cleaning a substrate for an electrophotographic photosensitive member, wherein in the rinsing step of the first cleaning step, water or pure water is showered on the substrate, and then the substrate is immersed in water or pure water to contact bubbles. Features.
[0017]
Seventhly, in the shower of the first or sixth rinsing step, there is provided a method for cleaning a substrate for an electrophotographic photosensitive member, wherein the pressure when spraying the shower on both the inner and outer surfaces of the substrate is 0.2 MPa or more and 1.5 MPa or less. Features.
[0018]
Eighth, the electrophotographic photosensitive member substrate cleaning method is characterized in that the shower flow rate per substrate in the first, sixth or seventh rinsing step is 1 L or more and 3 L or less.
[0019]
Ninth, the rinsing step of generating bubbles in the sixth cleaning step is characterized by a method for cleaning an electrophotographic photosensitive member substrate using compressed air, blower air, or pump air as a bubble source.
[0020]
Tenth, the method of cleaning a substrate for an electrophotographic photosensitive member, wherein the size of the bubbles in the sixth or ninth rinsing step is φ5 mm or more and φ100 mm or less.
[0021]
Eleventh, the electrophotographic photoreceptor substrate cleaning method is characterized in that the air flow rate in the first, ninth, or tenth rinsing step is 60 NL / min or more and 80 NL / min or less.
[0022]
Twelfth, the electrophotographic photosensitive member substrate cleaning method is characterized in that, in the drying step in the first cleaning step, the pure water temperature is 70 ° C. or higher and 95 ° C. or lower.
[0023]
Thirteenthly, in the first or twelfth drying step, a method for cleaning an electrophotographic photoreceptor substrate having a specific resistance of warm pure water of less than 1 MΩ · cm is characterized.
[0024]
Fourteenth, it is characterized in that in the first, twelfth or thirteenth drying step, the substrate for electrophotographic photosensitive member is cleaned at a speed of lifting the substrate from warm pure water of 20 mm / sec or less.
[0025]
DETAILED DESCRIPTION OF THE INVENTION
The present invention is described in detail below.
The present invention relates to a method for cleaning an electrophotographic photoreceptor substrate that can clean an electrophotographic photoreceptor substrate obtained by cutting, ironing, or cold drawing without causing coating film defects in the photosensitive layer on the same line. is there.
Embodiments of the present invention will be described below with reference to the drawings. First, contact cleaning 11 using a brush is performed. In this contact cleaning 11, a cylindrical brush is brought into contact with the inner and outer peripheral surfaces of the substrate. The brush used has a brush shape as shown in FIG. The pile of the brush at this time was made of nylon, and the pile diameter was set to φ0. 0 in consideration of easy removal of raised convex defects and the difficulty of scratching the cylindrical substrate surface. Use 2 mm.
[0026]
The cleaning device to which the brush is attached uses a cleaning device having a mechanism for rotating the brush and the cylindrical substrate. First, the cylindrical substrate held by the holder (FIG. 2-b) is lowered and inserted into the inner surface cleaning brush (FIG. 2-a) installed in the cleaning apparatus. The cylindrical base is rotated by rotating the holding jig while holding the base. The inner surface cleaning brush is rotated in the opposite direction. As a result, the cylindrical base and the inner surface brush contact each other. In this state, the rotated outer surface brush (FIG. 2-c) is brought into contact with the outer surface of the cylindrical substrate. At this time, by making the rotation direction of the brush and the cylindrical base body the same direction, the contact portions of the cylindrical base body and the brush move in opposite directions, and the ability to remove convex defects, and the cylinder The ability to remove oil stains and foreign matters adhering to the substrate surface is improved and good. If the rotation direction is other than this, the cleaning efficiency is lowered.
[0027]
The rotational speed of the cylindrical base and the brush is defined by the peripheral speed of the contact surface between the cylindrical base and the brush. The peripheral speed of the contact surface between the cylindrical substrate and the brush is preferably 10 m / min or more and 50 m / min or less. When it is 10 m / min or less, it becomes difficult to remove the raised convex defects. Further, if it is 50 m / min or more, the surface of the aluminum cylindrical substrate for an electrophotographic photoreceptor is likely to be damaged. This time, it experimented at 40 m / min.
[0028]
In this experiment, kerosene was used for the purpose of washing high-viscosity oil between the cylindrical base and the above-mentioned brush when washing with the above-described washing machine, but is not particularly limited thereto. . By bringing the brush into contact with the cylindrical base as described above, fine wire-like burrs along the circumferential cutting lines in the cutting process of the cylindrical base, and of the crumbs and aluminum scrap generated by plastic processing It is possible to remove raised convex defects such as fine defects along the length direction caused by adhesion or the like, and high-viscosity oil.
[0029]
In the next ultrasonic cleaning step 12, the substrate is immersed in an aqueous cleaning solution and irradiated with ultrasonic waves. In this ultrasonic cleaning, kerosene remaining on the substrate is completely removed. First, regarding the frequency of the ultrasonic oscillator, high-frequency ultrasonic waves are used to prevent rising convex defects on the surface of the cylindrical substrate. Specifically, an ultrasonic oscillator having a frequency of 100 KHz or more is used. When it is less than 100 KHz, along the length direction generated by the adhesion of the fine burrs in the wire shape along the circumferential cutting line in the cutting process of the cylindrical base body, the crumbs or the aluminum residue generated by the plastic processing, etc. A minute defect or the like is struck by an ultrasonic wave and becomes a raised convex defect. The ultrasonic irradiation method is not particularly limited. In this experiment, 133 KHz ultrasonic waves were used.
[0030]
When cleaning is performed using ultrasonic waves of 100 KHz or higher, the cleaning time is required to be 30 seconds or more and 120 seconds or less. In this experiment, 60 seconds was used.
[0031]
In the next shower cleaning step 13, water is sprayed to the inner peripheral surface and the outer peripheral surface of the substrate at a pressure of 0.2 MPa to 1.5 MPa. When the pressure is 0.2 MPa or less, the rinsing force is small. When the pressure is 1.5 MPa or more, the rinsing force is not changed and water is wasted, and the amount of waste water treatment is increased. In this experiment, 1 MPa was adopted.
[0032]
In this step, most of the aqueous cleaning liquid adhering to the previous step is washed away. Although it is possible to completely remove the aqueous cleaning solution only by the next bubbling cleaning step 14, this water cannot be drained unless it is treated with activated carbon or the like. Therefore, since the amount of treated water is increased, the running cost is increased. Therefore, water shower cleaning that can be efficiently rinsed with a small amount of water is performed.
[0033]
In the next bubbling cleaning step 14, the substrate is immersed in pure water and air is jetted from below the workpiece. This air may be conventional factory compressed air, air from a blower, or air from a diaphragm pump. As a result of the test, it has been found that the bubble size is preferably in the range of φ5 mm to φ100 mm. This experiment was performed under the following conditions.
・ Bubble size: φ30mm
・ Air flow rate: 70NL / min
As a result, the aqueous cleaning agent adhering to the substrate could be completely removed.
[0034]
In the next warm pure water drying 15, the substrate is immersed in heated pure water, and after the drum is heated to the pure water temperature, the substrate is pulled up at a constant speed. Thereby, the pure water adhering to the outer peripheral surface of the base body is evaporated and drained. The pure water temperature at this time is preferably 70 ° C. or higher and 95 ° C. or lower. In the case of 70 ° C. or lower, it has been confirmed that dry spots can be formed on the substrate surface.
[0035]
When the substrate is immersed in warm pure water having a specific resistance greater than 1 MΩ · cm, a hydroxide film is easily formed on the substrate surface. This is not preferable because it affects the electrical characteristics when the photosensitive layer is formed. In addition, when the pulling rate of the substrate from the warm pure water is 20 mm / sec or more, the amount of water adhering to the substrate is large and it becomes difficult to dry. This experiment was performed under the following conditions.
・ Warm pure water temperature: 80 ℃
・ Warm pure water resistivity: 0.6MΩ ・ cm
-Substrate pulling speed: 10 mm / sec
[0036]
【The invention's effect】
As described above, the invention of claim 1 is a substrate cleaning method capable of cleaning an electrophotographic photoreceptor substrate obtained by cutting or plastic processing on the same line, and includes a contact cleaning process using a brush, ultrasonic cleaning Since it comprises a process, a rinsing process for removing aqueous detergent components, and a warm pure water drying process, a uniform and defect-free photosensitive layer can be formed by applying the photosensitive layer on the obtained substrate.
[0037]
According to a second aspect of the present invention, in the cleaning method, when the brush is brought into contact with the inner and outer peripheral surfaces of the workpiece and rotated, the outer brush and the base are rotated in the same direction, and the inner brush is opposite to the outer brush and the base. Therefore, the contact portion between the cylindrical base body and the brush moves in the opposite directions, and the ability to remove convex defects and the ability to remove oil stains and foreign matters adhering to the cylindrical base surface are further improved. To do. If the rotation direction is a combination other than this, the cleaning efficiency is lowered.
[0038]
According to the invention of claim 3, in the cleaning method, when the brush is brought into contact with the inner and outer peripheral surfaces of the workpiece and rotated, the peripheral speed is set to 10 m / min or more and 50 m / min or less. Defects can be easily removed and the surface of the cylindrical substrate is hardly damaged.
[0039]
Since the ultrasonic frequency of the cleaning step is 100 kHz or more in the above cleaning method, the fine wire-like burrs in the circumferential direction and the fine defects in the length direction of the substrate are ultrasonic. It can be prevented from being raised and becoming a raised convex defect.
[0040]
According to the fifth aspect of the present invention, since the ultrasonic irradiation time in the cleaning step is 30 seconds or more and 120 seconds or less in the cleaning method, good cleaning can be performed by ultrasonic waves of 100 KHz or more.
[0041]
In the cleaning method according to the sixth aspect of the present invention, since the substrate is immersed in water or pure water after the water or pure water is showered on the substrate and the bubbles are brought into contact with the substrate, the aqueous cleaning solution adhered in the previous step is sufficiently removed. Can be dropped.
[0042]
In the invention of claim 7, in the shower of the rinsing step, the pressure when spraying the shower onto the inner and outer surfaces of the base is 0.2 MPa or more and 1.5 MPa or less, so the rinsing force is not reduced, and Don't waste water.
[0043]
According to the eighth aspect of the present invention, since the shower flow rate per substrate in the shower in the rinsing step is 1 L or more and 3 L or less, an appropriate amount and effective rinsing can be performed.
[0044]
The invention of claim 9 is very effective for injecting air from below the workpiece because compressed air, blower air, and pump air are used as the bubble source in the rinsing step for generating the bubbles.
[0045]
In the invention of claim 10, since the size of the bubbles is not less than φ5 mm and not more than φ100 mm, the removal of the aqueous cleaning agent adhering to the substrate is excellent.
[0046]
According to the eleventh aspect of the invention, since the air flow rate in the rinsing step is 60 NL / min or more and 80 NL / min or less, the removal of the aqueous cleaning agent attached to the substrate is excellent.
[0047]
According to the twelfth aspect of the present invention, since the pure water temperature in the drying step is set to 70 ° C. or higher and 95 ° C. or lower, no dry spots are formed on the substrate surface, and the pure water adhering to the outer peripheral surface of the substrate is well drained. can do.
[0048]
According to the thirteenth aspect of the present invention, since the specific resistance of warm pure water in the drying step is smaller than 1 MΩ · cm, it is possible to prevent the formation of a hydroxide film that is easily formed on the surface of the substrate and does not adversely affect the electrical characteristics of the photosensitive layer.
[0049]
In the invention of claim 14, since the pulling speed of the substrate from the warm pure water in the drying step is 20 mm / sec or less, the amount of water adhering to the substrate is not increased and the drying is not made difficult.
[Brief description of the drawings]
FIG. 1 is a diagram showing a configuration (step) of a cleaning tank in a cleaning method of the present invention.
FIG. 2 is a diagram showing the shape of a brush.
FIG. 3 is a diagram showing a cleaning state of a substrate by a contact cleaning machine.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 11 Contact cleaning process with brush 12 Ultrasonic cleaning process 13 Shower cleaning process 14 Bubbling cleaning process 15 Warm pure water drying process a Inner surface cleaning brush b Holder c Outer surface brush d Cylindrical substrate

Claims (13)

切削加工または塑性加工で得られた電子写真感光体用基体を同一ラインで洗浄可能な基体洗浄方法であって、洗浄液とともにブラシによって基体を洗浄する接触洗浄工程と、該接触洗浄工程の後に、超音波振動が付与された水系洗浄液中に基体を浸漬して該基体を洗浄する超音波洗浄からなる洗浄工程と、該洗浄工程の後に、水または純水を該基体にシャワーした後、水または純水中に該基体を浸漬させ気泡を接触させ、該基体に付着した水系洗剤成分を除去するすすぎ工程と、該すすぎ工程の後に、温純水中に基体を浸漬して加熱した後に該基体を温純水中から引き上げて基体に付着した温純水を乾燥させる乾燥工程からなることを特徴とする電子写真感光体用基体の洗浄方法。A substrate cleaning method capable of cleaning an electrophotographic photoreceptor substrate obtained by cutting or plastic processing on the same line, a contact cleaning step of cleaning the substrate with a brush together with a cleaning liquid, and after the contact cleaning step, A cleaning step comprising ultrasonic cleaning in which the substrate is immersed in an aqueous cleaning solution to which sonic vibration is applied, and cleaning the substrate; after the cleaning step, water or pure water is showered on the substrate; contacting the cell is immersed base body in water, and rinsing step for removing the water-based detergent component adhering to the substrate, said rinse after step, warm pure water to said substrate after heating by immersing the substrate in hot deionized water A method of cleaning a substrate for an electrophotographic photoreceptor, comprising a drying step of drying hot pure water that has been pulled up from the substrate and adhered to the substrate. 請求項1記載の電子写真感光体用基体の洗浄方法において、ブラシをワークの内・外周面に接触させて回転させるに際し、回転方向は外面ブラシと基体は同一方向に、内面ブラシは外面ブラシと基体と反対方向とすることを特徴とする電子写真感光体用基体の洗浄方法。  2. The method for cleaning a substrate for an electrophotographic photoreceptor according to claim 1, wherein when rotating the brush in contact with the inner and outer peripheral surfaces of the workpiece, the outer brush and the substrate are rotated in the same direction, and the inner brush is the outer brush. A method for cleaning a substrate for an electrophotographic photosensitive member, characterized in that the direction is opposite to the substrate. 請求項1または2記載の電子写真感光体用基体の洗浄方法において、ブラシをワークの内・外周面に接触させて回転させるに際し、周速を10m/分以上50m/分以下とすることを特徴とする電子写真感光体用基体の洗浄方法。  3. The method for cleaning a substrate for an electrophotographic photosensitive member according to claim 1 or 2, wherein the peripheral speed is set to 10 m / min or more and 50 m / min or less when the brush is rotated while contacting the inner / outer peripheral surface of the workpiece. A method for cleaning a substrate for an electrophotographic photosensitive member. 請求項1記載の電子写真感光体用基体の洗浄方法において、超音波洗浄工程における超音波周波数が100kHz以上とすることを特徴とする電子写真感光体用基体の洗浄方法。  2. The method for cleaning a substrate for an electrophotographic photosensitive member according to claim 1, wherein the ultrasonic frequency in the ultrasonic cleaning step is 100 kHz or more. 請求項4記載の電子写真感光体用基体の洗浄方法において、超音波照射時間が30秒以上120秒以内であることを特徴とする電子写真感光体用基体の洗浄方法。  5. The method for cleaning an electrophotographic photosensitive member substrate according to claim 4, wherein the ultrasonic irradiation time is 30 seconds or more and 120 seconds or less. 請求項1から5のいずれか記載の電子写真感光体用基体の洗浄方法において、すすぎ工程で、基体の内外面にシャワーを噴射する際の圧力を0.2MPa以上1.5MPa以下とすることを特徴とする電子写真感光体用基体の製造方法。6. The method for cleaning a substrate for an electrophotographic photosensitive member according to claim 1, wherein, in the rinsing step, a pressure when spraying a shower on the inner and outer surfaces of the substrate is 0.2 MPa or more and 1.5 MPa or less. A method for producing a substrate for an electrophotographic photosensitive member. 請求項1から6のいずれか記載の電子写真感光体用基体の洗浄方法において、すすぎ工程で、基体1本当たりのシャワー流量が1L以上3L以下とすることを特徴とする電子写真感光体用基体の洗浄方法。7. The method for cleaning an electrophotographic photoreceptor substrate according to claim 1, wherein a shower flow rate per substrate is 1 L or more and 3 L or less in the rinsing step. Cleaning method. 請求項6記載の電子写真感光体用基体の洗浄方法において、気泡源として圧縮空気、ブロワーエアー、またはポンプエアーを使用することを特徴とする電子写真感光体用基体の洗浄方法。7. The method for cleaning an electrophotographic photosensitive member substrate according to claim 6, wherein compressed air, blower air, or pump air is used as a bubble source. 請求項6から8のいずれか記載の電子写真感光体用基体の洗浄方法において、気泡の大きさは、φ5mm以上φ100mm以下の大きさであることを特徴とする電子写真感光体用基体の洗浄方法。9. The method for cleaning an electrophotographic photosensitive member substrate according to claim 6, wherein the size of the bubbles is not less than φ5 mm and not more than φ100 mm. . 請求項6から9のいずれか記載の電子写真感光体用基体の洗浄方法において、エアー流量が、60NL/min以上80NL/min以下であることを特徴とする電子写真感光体用基体の洗浄方法。10. The method for cleaning an electrophotographic photosensitive member substrate according to claim 6, wherein an air flow rate is 60 NL / min or more and 80 NL / min or less. 請求項1記載の電子写真感光体用基体の洗浄方法において、乾燥工程における純水温度を70℃以上95℃以下とすることを特徴とする電子写真感光体用基体の洗浄方法。2. The method for cleaning a substrate for an electrophotographic photosensitive member according to claim 1, wherein the temperature of pure water in the drying step is 70 ° C. or higher and 95 ° C. or lower. 請求項1から11のいずれか記載の電子写真感光体用基体の洗浄方法において、乾燥工程における温純水の比抵抗が1MΩ・cmより小さいことを特徴とする電子写真感光体基体の洗浄方法。12. The method for cleaning an electrophotographic photosensitive member substrate according to claim 1, wherein the specific resistance of warm pure water in the drying step is less than 1 MΩ · cm. 請求項1から12のいずれか記載の電子写真感光体用基体の洗浄方法において、乾燥工程における温純水中からの基体の引き上げ速度を20mm/sec以下とすることを特徴とする電子写真感光体用基体の洗浄方法。13. The electrophotographic photosensitive member substrate according to claim 1, wherein the substrate is pulled up from warm pure water in the drying step at a rate of 20 mm / sec or less. Cleaning method.
JP2000384451A 2000-12-18 2000-12-18 Method for cleaning substrate for electrophotographic photosensitive member Expired - Fee Related JP4043189B2 (en)

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