JPH0326480B2 - - Google Patents

Info

Publication number
JPH0326480B2
JPH0326480B2 JP56102807A JP10280781A JPH0326480B2 JP H0326480 B2 JPH0326480 B2 JP H0326480B2 JP 56102807 A JP56102807 A JP 56102807A JP 10280781 A JP10280781 A JP 10280781A JP H0326480 B2 JPH0326480 B2 JP H0326480B2
Authority
JP
Japan
Prior art keywords
address
memory
semiconductor memory
defective
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56102807A
Other languages
English (en)
Japanese (ja)
Other versions
JPS585681A (ja
Inventor
Keisuke Okada
Hideo Matsui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP56102807A priority Critical patent/JPS585681A/ja
Publication of JPS585681A publication Critical patent/JPS585681A/ja
Publication of JPH0326480B2 publication Critical patent/JPH0326480B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP56102807A 1981-06-30 1981-06-30 半導体メモリ試験装置 Granted JPS585681A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56102807A JPS585681A (ja) 1981-06-30 1981-06-30 半導体メモリ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56102807A JPS585681A (ja) 1981-06-30 1981-06-30 半導体メモリ試験装置

Publications (2)

Publication Number Publication Date
JPS585681A JPS585681A (ja) 1983-01-13
JPH0326480B2 true JPH0326480B2 (enrdf_load_html_response) 1991-04-10

Family

ID=14337319

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56102807A Granted JPS585681A (ja) 1981-06-30 1981-06-30 半導体メモリ試験装置

Country Status (1)

Country Link
JP (1) JPS585681A (enrdf_load_html_response)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62201629A (ja) * 1986-02-28 1987-09-05 Kao Corp 噴霧造粒方法
JPS63127499A (ja) * 1986-11-17 1988-05-31 Yamada Denon Kk メモリ素子検査装置
JPS63185000A (ja) * 1987-01-27 1988-07-30 Hitachi Electronics Eng Co Ltd メモリｉｃ検査装置
JP4929868B2 (ja) * 2006-06-19 2012-05-09 横河電機株式会社 半導体メモリ試験装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5673354A (en) * 1979-11-21 1981-06-18 Advantest Corp Testing device for ic

Also Published As

Publication number Publication date
JPS585681A (ja) 1983-01-13

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