JPH0326480B2 - - Google Patents

Info

Publication number
JPH0326480B2
JPH0326480B2 JP56102807A JP10280781A JPH0326480B2 JP H0326480 B2 JPH0326480 B2 JP H0326480B2 JP 56102807 A JP56102807 A JP 56102807A JP 10280781 A JP10280781 A JP 10280781A JP H0326480 B2 JPH0326480 B2 JP H0326480B2
Authority
JP
Japan
Prior art keywords
address
memory
semiconductor memory
defective
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56102807A
Other languages
English (en)
Japanese (ja)
Other versions
JPS585681A (ja
Inventor
Keisuke Okada
Hideo Matsui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP56102807A priority Critical patent/JPS585681A/ja
Publication of JPS585681A publication Critical patent/JPS585681A/ja
Publication of JPH0326480B2 publication Critical patent/JPH0326480B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP56102807A 1981-06-30 1981-06-30 半導体メモリ試験装置 Granted JPS585681A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56102807A JPS585681A (ja) 1981-06-30 1981-06-30 半導体メモリ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56102807A JPS585681A (ja) 1981-06-30 1981-06-30 半導体メモリ試験装置

Publications (2)

Publication Number Publication Date
JPS585681A JPS585681A (ja) 1983-01-13
JPH0326480B2 true JPH0326480B2 (cs) 1991-04-10

Family

ID=14337319

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56102807A Granted JPS585681A (ja) 1981-06-30 1981-06-30 半導体メモリ試験装置

Country Status (1)

Country Link
JP (1) JPS585681A (cs)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62201629A (ja) * 1986-02-28 1987-09-05 Kao Corp 噴霧造粒方法
JPS63127499A (ja) * 1986-11-17 1988-05-31 Yamada Denon Kk メモリ素子検査装置
JPS63185000A (ja) * 1987-01-27 1988-07-30 Hitachi Electronics Eng Co Ltd メモリｉｃ検査装置
JP4929868B2 (ja) * 2006-06-19 2012-05-09 横河電機株式会社 半導体メモリ試験装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5673354A (en) * 1979-11-21 1981-06-18 Advantest Corp Testing device for ic

Also Published As

Publication number Publication date
JPS585681A (ja) 1983-01-13

Similar Documents

Publication Publication Date Title
US6483773B1 (en) Method for generating memory addresses for testing memory devices
US5233614A (en) Fault mapping apparatus for memory
US5424989A (en) Semiconductor memory device
US5796758A (en) Self-checking content-addressable memory and method of operation for detecting multiple selected word lines
US4833652A (en) Semiconductor memory device having a self-diagnosing function
US4456995A (en) Apparatus for high speed fault mapping of large memories
US4878220A (en) Semiconductor memory device
US3995261A (en) Reconfigurable memory
US3982111A (en) Memory diagnostic arrangement
GB2129585A (en) Memory system including a faulty rom array
JPS6059679B2 (ja) 作業用記憶領域内の欠陥場所を見付ける方法と装置
US3659088A (en) Method for indicating memory chip failure modes
US4384348A (en) Method for testing semiconductor memory device
KR100750416B1 (ko) 메모리 어레이 테스트 방법 및 메모리 기반 디바이스
KR100399449B1 (ko) 메모리 셀 장치 및 메모리 셀의 기능 테스트 방법
JPS63241791A (ja) 半導体記憶装置
JPH0326480B2 (cs)
US6560731B2 (en) Method for checking the functioning of memory cells of an integrated semiconductor memory
EP0096030B1 (en) Apparatus for high speed fault mapping of large memories
JPH05342113A (ja) 組み込み型システムのｒａｍの故障検出方法
JPS6132756B2 (cs)
KR900008638B1 (ko) 집적회로
JP3021577B2 (ja) Ｒａｍのテスト回路
KR100194419B1 (ko) 음성데이타용 메모리를 시스템 데이타용 메모리로서 이용하기위한회로및그방법
JPS59920B2 (ja) 半導体記憶装置