JPH0325229Y2 - - Google Patents
Info
- Publication number
- JPH0325229Y2 JPH0325229Y2 JP8149085U JP8149085U JPH0325229Y2 JP H0325229 Y2 JPH0325229 Y2 JP H0325229Y2 JP 8149085 U JP8149085 U JP 8149085U JP 8149085 U JP8149085 U JP 8149085U JP H0325229 Y2 JPH0325229 Y2 JP H0325229Y2
- Authority
- JP
- Japan
- Prior art keywords
- diagnostic
- clock
- data
- circuit
- external input
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000010354 integration Effects 0.000 claims description 34
- 230000004044 response Effects 0.000 claims description 3
- 238000003745 diagnosis Methods 0.000 description 10
- 239000000872 buffer Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 3
- 238000012935 Averaging Methods 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000004092 self-diagnosis Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8149085U JPH0325229Y2 (US06330241-20011211-M00004.png) | 1985-05-30 | 1985-05-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8149085U JPH0325229Y2 (US06330241-20011211-M00004.png) | 1985-05-30 | 1985-05-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61196345U JPS61196345U (US06330241-20011211-M00004.png) | 1986-12-08 |
JPH0325229Y2 true JPH0325229Y2 (US06330241-20011211-M00004.png) | 1991-05-31 |
Family
ID=30628320
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8149085U Expired JPH0325229Y2 (US06330241-20011211-M00004.png) | 1985-05-30 | 1985-05-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0325229Y2 (US06330241-20011211-M00004.png) |
-
1985
- 1985-05-30 JP JP8149085U patent/JPH0325229Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS61196345U (US06330241-20011211-M00004.png) | 1986-12-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS62186629A (ja) | 情報授受システム | |
US4926425A (en) | System for testing digital circuits | |
US4692691A (en) | Test system for keyboard interface circuit | |
JPH0325229Y2 (US06330241-20011211-M00004.png) | ||
JP3380329B2 (ja) | ディジタルデータ調停装置 | |
JPS63503481A (ja) | マルチモードカウンタ回路網 | |
US4982403A (en) | Electrical circuit testing device and circuit comprising the said device | |
JPS61155874A (ja) | 大規模集積回路の故障検出方法およびそのための装置 | |
US6445205B1 (en) | Method of testing integrated circuits | |
US5513187A (en) | Process for testing integrated circuits with at least one logic circuit and testable integrated circuit | |
JP3090053B2 (ja) | 回路データ用モニタ装置 | |
JP2877505B2 (ja) | Lsi実装ボード及びデータ処理装置 | |
JPS61286770A (ja) | 故障診断装置 | |
JPS6379121A (ja) | クロツク分配システム | |
JPS6144342B2 (US06330241-20011211-M00004.png) | ||
JPS6225211B2 (US06330241-20011211-M00004.png) | ||
JP3125950B2 (ja) | 特定用途向け集積回路 | |
JP2815041B2 (ja) | Lsi内部状態確認回路 | |
JPH054041Y2 (US06330241-20011211-M00004.png) | ||
JPH0746123B2 (ja) | 集積回路の試験方式 | |
JPH0748192B2 (ja) | 記憶装置 | |
JPS63310211A (ja) | クロック障害検出回路 | |
JPH0477685A (ja) | Lsiテストモニタ回路 | |
JPH0289300A (ja) | 半導体メモリ素子 | |
JPS63281539A (ja) | 誤りデ−タ発生回路 |