JPH0323563Y2 - - Google Patents

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Publication number
JPH0323563Y2
JPH0323563Y2 JP1981110575U JP11057581U JPH0323563Y2 JP H0323563 Y2 JPH0323563 Y2 JP H0323563Y2 JP 1981110575 U JP1981110575 U JP 1981110575U JP 11057581 U JP11057581 U JP 11057581U JP H0323563 Y2 JPH0323563 Y2 JP H0323563Y2
Authority
JP
Japan
Prior art keywords
sample
heater
ray
heaters
small
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981110575U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5816553U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11057581U priority Critical patent/JPS5816553U/ja
Publication of JPS5816553U publication Critical patent/JPS5816553U/ja
Application granted granted Critical
Publication of JPH0323563Y2 publication Critical patent/JPH0323563Y2/ja
Granted legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
JP11057581U 1981-07-24 1981-07-24 X線小角散乱測定装置用試料加熱装置 Granted JPS5816553U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11057581U JPS5816553U (ja) 1981-07-24 1981-07-24 X線小角散乱測定装置用試料加熱装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11057581U JPS5816553U (ja) 1981-07-24 1981-07-24 X線小角散乱測定装置用試料加熱装置

Publications (2)

Publication Number Publication Date
JPS5816553U JPS5816553U (ja) 1983-02-01
JPH0323563Y2 true JPH0323563Y2 (ko) 1991-05-22

Family

ID=29904941

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11057581U Granted JPS5816553U (ja) 1981-07-24 1981-07-24 X線小角散乱測定装置用試料加熱装置

Country Status (1)

Country Link
JP (1) JPS5816553U (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63125188A (ja) * 1986-11-10 1988-05-28 千代田化工建設株式会社 純水タンクのシ−ル装置
JPH081423B2 (ja) * 1987-05-27 1996-01-10 理学電機株式会社 X線回折試料加熱装置
JPH0743643Y2 (ja) * 1989-02-23 1995-10-09 理学電機株式会社 X線回折測定のための試料加熱装置
US7139366B1 (en) * 2005-05-31 2006-11-21 Osmic, Inc. Two-dimensional small angle x-ray scattering camera
US10359376B2 (en) * 2016-07-20 2019-07-23 Malvern Panalytical B.V. Sample holder for X-ray analysis

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS484530U (ko) * 1971-06-15 1973-01-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS484530U (ko) * 1971-06-15 1973-01-19

Also Published As

Publication number Publication date
JPS5816553U (ja) 1983-02-01

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