JPS5816553U - Ｘ線小角散乱測定装置用試料加熱装置 - Google Patents

Ｘ線小角散乱測定装置用試料加熱装置

Info

Publication number
JPS5816553U
JPS5816553U JP11057581U JP11057581U JPS5816553U JP S5816553 U JPS5816553 U JP S5816553U JP 11057581 U JP11057581 U JP 11057581U JP 11057581 U JP11057581 U JP 11057581U JP S5816553 U JPS5816553 U JP S5816553U
Authority
JP
Japan
Prior art keywords
scattering measurement
angle scattering
heating device
sample heating
measurement device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11057581U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0323563Y2 (ko
Inventor
繁 宗川
Original Assignee
理学電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 理学電機株式会社 filed Critical 理学電機株式会社
Priority to JP11057581U priority Critical patent/JPS5816553U/ja
Publication of JPS5816553U publication Critical patent/JPS5816553U/ja
Application granted granted Critical
Publication of JPH0323563Y2 publication Critical patent/JPH0323563Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP11057581U 1981-07-24 1981-07-24 Ｘ線小角散乱測定装置用試料加熱装置 Granted JPS5816553U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11057581U JPS5816553U (ja) 1981-07-24 1981-07-24 Ｘ線小角散乱測定装置用試料加熱装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11057581U JPS5816553U (ja) 1981-07-24 1981-07-24 Ｘ線小角散乱測定装置用試料加熱装置

Publications (2)

Publication Number Publication Date
JPS5816553U true JPS5816553U (ja) 1983-02-01
JPH0323563Y2 JPH0323563Y2 (ko) 1991-05-22

Family

ID=29904941

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11057581U Granted JPS5816553U (ja) 1981-07-24 1981-07-24 Ｘ線小角散乱測定装置用試料加熱装置

Country Status (1)

Country Link
JP (1) JPS5816553U (ko)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63125188A (ja) * 1986-11-10 1988-05-28 千代田化工建設株式会社 純水タンクのシ−ル装置
JPS63293452A (ja) * 1987-05-27 1988-11-30 Rigaku Denki Kk Ｘ線回折試料加熱装置
JPH02110853U (ko) * 1989-02-23 1990-09-05
JP2008542751A (ja) * 2005-05-31 2008-11-27 オスミック、インコーポレイテッド ２次元小角ｘ線散乱カメラ
JP2018013485A (ja) * 2016-07-20 2018-01-25 マルバーン パナリティカル ビー ヴィ Ｘ線分析のためのサンプルホルダ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS484530U (ko) * 1971-06-15 1973-01-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS484530U (ko) * 1971-06-15 1973-01-19

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63125188A (ja) * 1986-11-10 1988-05-28 千代田化工建設株式会社 純水タンクのシ−ル装置
JPH0419113B2 (ko) * 1986-11-10 1992-03-30 Choda Kako Kensetsu Kk
JPS63293452A (ja) * 1987-05-27 1988-11-30 Rigaku Denki Kk Ｘ線回折試料加熱装置
JPH02110853U (ko) * 1989-02-23 1990-09-05
JP2008542751A (ja) * 2005-05-31 2008-11-27 オスミック、インコーポレイテッド ２次元小角ｘ線散乱カメラ
JP2018013485A (ja) * 2016-07-20 2018-01-25 マルバーン パナリティカル ビー ヴィ Ｘ線分析のためのサンプルホルダ

Also Published As

Publication number Publication date
JPH0323563Y2 (ko) 1991-05-22

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