JPH0311436B2 - - Google Patents

Info

Publication number
JPH0311436B2
JPH0311436B2 JP56104011A JP10401181A JPH0311436B2 JP H0311436 B2 JPH0311436 B2 JP H0311436B2 JP 56104011 A JP56104011 A JP 56104011A JP 10401181 A JP10401181 A JP 10401181A JP H0311436 B2 JPH0311436 B2 JP H0311436B2
Authority
JP
Japan
Prior art keywords
data
pattern
memory
clock
bit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56104011A
Other languages
English (en)
Japanese (ja)
Other versions
JPS586478A (ja
Inventor
Shizuo Kamikura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56104011A priority Critical patent/JPS586478A/ja
Publication of JPS586478A publication Critical patent/JPS586478A/ja
Publication of JPH0311436B2 publication Critical patent/JPH0311436B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP56104011A 1981-07-03 1981-07-03 パタ−ン発生器 Granted JPS586478A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56104011A JPS586478A (ja) 1981-07-03 1981-07-03 パタ−ン発生器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56104011A JPS586478A (ja) 1981-07-03 1981-07-03 パタ−ン発生器

Publications (2)

Publication Number Publication Date
JPS586478A JPS586478A (ja) 1983-01-14
JPH0311436B2 true JPH0311436B2 (enrdf_load_stackoverflow) 1991-02-15

Family

ID=14369320

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56104011A Granted JPS586478A (ja) 1981-07-03 1981-07-03 パタ−ン発生器

Country Status (1)

Country Link
JP (1) JPS586478A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS586478A (ja) 1983-01-14

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