JPH0293964A - Test system for data processor - Google Patents

Abstract

PURPOSE:To shorten the execution time of the whole test by directly setting up and optional I/O operation state in a hardware just prior to the execution of a test and executing the test in accordance with the set I/O operation state. CONSTITUTION:An I/O operation state S1 and an I/O starting timing P1 for a test are obtained by setting up necessary information in hardware control information 204. Namely, these test conditions are directly formed without executing any I/O start and timing adjustment. Thereby, it is unnecessary to execute I/O start for setting up the I/O operation state and the adjustment of I/O start timing P1 by test program processing as usually and the test conditions can be set up without executing the I/O start. Thus, an I/O operation test based upon complex I/O operation state and timing can be rapidly and easily executed.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a test method for data processing equipment, and in particular, a test method suitable for efficiently conducting tests. When a software is developed, the debugging method becomes a problem, but when input/output operations are involved, pseudo input/output is a method for debugging without depending on the hardware, that is, without waiting for the hardware to be realized. Device(
A method using the I10 simulator (commonly referred to as the I10 simulator) has been established. As an example of this technology, as described in Japanese Patent Application Laid-Open No. 61-239335, the operation in response to an input/output activation request from a data processing device is simulated to a state that is quite close to the actual input/output operation. However, the purpose of these pseudo input/output devices is to simulate only the operation in response to an input/output activation when the data processing device executes the input/output activation.

However, in testing the input/output operation of a system consisting of general data processing equipment and input/output devices, the input/output operation status is determined as a condition for the test prior to starting the input/output for testing. Setting the timing of input/output activation for configuration and testing is an important element. The purpose of pseudo input/output devices is to simulate actual input/output operations, but they also have the function of setting the input/output operation status, which is an important element for testing, and adjusting the input/output startup timing for testing. There is no, therefore, no input/output activation to create the test conditions.

It must be run in a separate and independent form from that for testing. In addition, the input/output activation timing for setting the input/output operating state for testing needs to be adjusted by internal processing in the central processing unit, but these are the data processing equipment, input/output equipment, etc. that make up the system. It is easily affected by the physical characteristics of the device, and the more complex the input/output operating state and input/output activation timing as conditions for testing, the more difficult it becomes to set and adjust them. Furthermore, at the same time, the time required to set the input/output operating conditions as test conditions and adjust the input/output start timing takes a large part of the time required for the entire test. The problem was that it was too long.

A conventional test method will be explained using FIGS. 4 and 5, and an example of the overall configuration and overall operation of the test system will be explained using FIG. 2.

The test system shown in FIG. 2 includes a data processing device 100,
Consisting of an input/output device 110, a data processing device 100
is the central processing unit 1o1. It is composed of a storage device 104, hardware control information for input/output operations (hereinafter abbreviated as hardware control information) 105, and an input/output processing device 109. The hardware control information 105 includes command control data 106, input/output operation state control data 1o7. It consists of operation result report control data 108, which consists of more detailed data as shown in the figure.

Next, the operation of the test system shown in FIG. 2 will be explained.

The test program 102 is executed in the central processing bag [101], and from the input/output control logic 103, which is a component of the central processing bag [101], the hardware control information 105 for the input/output operation necessary for the input/output operation The address of the turnout device and the command code are set as the relevant information. The device address 106A and instruction code 106B are extracted by the input/output processing device 109 as information necessary for input/output operations set in the hardware control information 105.

The input/output operation is started, and the execution command address is read from the storage device 104 as data necessary for the input/output operation and stored in the execution command address 106C. Thereafter, input/output operations are performed based on this information.

With the start of the input/output operation, the input/output operation status is changed to input/output operation status control data 107, which indicates the input/output processing unit operation status control data 107A.
, input/output device operating state control data 107B indicating the operating state of the input/output device is stored and updated. The completion of the input/output operation is reported from the input/output processing unit 109 to the central processing unit 1tlo1 using operation result report control data 108. The operation result report control data 108 is an interrupt code 108A.

Interrupt cause display data 108B, interrupt request data 10
8C and report data 108D.

FIG. 4 is a diagram showing a detailed operational example of the conventional test system having the test system configuration shown in FIG. 2.

The test system includes test program processing 401, hardware control information 404. Consists of an input/output processing device 405 and an input/output device 409, which performs test program processing 401
Information for activation is propagated to the input/output processing device 405 via the hardware control information 404 by input/output activation from the input/output processing device 405, and the input/output device 409 is operated under the control of the input/output processing device 405. .

Conventionally, test program processing 401 is composed of input/output operation state setting processing 402 and test execution processing 403,
The input/output operation state as an execution condition for the input/output activation 403A for testing is set by the process 402A, and the input/output activation timing is adjusted by the process 402B.

FIG. 5 shows the input/output operation state setting and timing adjustment in FIG. 4 based on the passage of time.

This conventional method is easily influenced by the physical characteristics of the devices constituting the system shown in FIG. 2, such as the data processing device 100° input/output bag [110].

All must be adjusted in process 402B.

For this reason, a problem arises in that the more complex the input/output operating states and input/output activation timings as conditions for testing become, the more difficult it becomes to adjust them. In addition, in order to set the input/output operation state, the input/output activation may be executed by the process 402A, and the input/output operation as the condition setting for the test is performed for the test required time T2 in the example of FIG. Status 1rBS2, time for setting input/output start timing P2. 2 occupies a large weight, resulting in a long execution time for the entire test, and this problem becomes more pronounced as the condition settings become more complex.

[Problem to be solved by the invention]

The above conventional technology relates to a pseudo input/output device whose sole purpose is to simulate input/output activation for testing as actual input/output device operation, and the means for test execution is based on actual input/output operations. When operating the device,
Nothing changed. For this reason, it is essential to execute input/output activation to set the input/output operation state required as a test condition prior to input/output activation for testing, and to adjust the input/output activation timing for testing. There was a problem in that adjustments had to be made as part of the test program processing.

The purpose of the present invention is to solve such conventional problems, eliminate the influence of physical characteristics of data processing devices and input/output devices on testing, and perform input/output without starting input/output for setting test conditions. It is an object of the present invention to provide a test method for a data processing device that allows setting the operating state and input/output start timing to an optimal state, and also enables shortening of the overall test execution time.

[Means to solve the problem]

In order to achieve the above object, the data processing device testing method of the present invention is a test method for testing input/output operations in a data processing device, in which an arbitrary input/output operation state is directly set in the hardware immediately before the test. , is characterized in that it tests against the set input/output operating state.

[Effect]

In the present invention, the input/output operation state and input/output activation timing for testing are realized by setting necessary information to hardware control information. In other words, by directly creating these test conditions without performing any input/output activation or timing adjustment, it is possible to test input/output activation and adjustment of input/output activation timing for the purpose of setting the input/output operating state as in the past. Since it does not need to be executed during program processing and test conditions can be set without starting input/output, input/output operation tests based on complex input/output operation status and timing can be performed quickly and easily. It becomes possible to execute.

〔Example〕

Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.

The overall configuration of this embodiment, that is, the overall configuration of the test system to which the present invention is applied, is the same as that shown in FIG. 2 in the explanation of the prior art, so please refer to the explanation of FIG. 2 for an explanation of the operation of the entire system. I want to be

FIG. 1 is a diagram for explaining a method according to an embodiment of the present invention, and shows an example of detailed operation on the test system in FIG. 2. Further, FIG. 3 shows the input/output operation states and timing settings in FIG. 2 based on the passage of time. Note that the test target device in this embodiment is a general input/output processing device or input/output device.

As shown in FIG. 1, the test system includes test program processing 200. Hardware control information 204, input/output processing device 205. It is configured by an input/output device 208, and the input/output status setting process 202 of the test program process 200 sends information for setting the input/output operating status S (timing adjustment) to the hardware control information 204 for testing purposes. The input/output operating state, which is the condition of
Create timing directly. By executing the input/output activation for the test by the test execution processing 203 with respect to this input/output operation state and timing.

The input/output processing unit 205 directly generates input/output.

Execute input/output operations for operating state S and timing P. This input/output operation status tmS, the timing P is created by directly setting data in the hardware control information, but all the information shown in Figure 2 is the same as the actual input/output operation status. The input/output processing device 205 operates the input/output device 208 by receiving the input/output activation for the test of the process 203A of the test execution process 203, which does not change in any way.

The operation of this embodiment will be explained below with reference to the test system shown in FIG.

The process 202A of the test program process 200 sets the input/output operation status and timing setting data in the hardware control information 204. - In the case of casual input/output startup, the execution command address 106C, input/output processing device operating state control data 107A, and input/output device operating state control data 107B are not directly set by the central processing unit 101, but the processing In 202A, by directly setting this information as hardware control information via the interface 111, the input/output processing device 109 can operate as if it were in the input/output operation state and timing shown in FIG. The state is equivalent to when the input/output operation leading to P is executed.

By executing the input/output activation process 203A for testing in the test execution process 203 for such input/output operation status and timing, the process 403A after executing the input/output operation status setting process 402 in FIG. The state is equivalent to executing .

The test execution process is the same as before.

Since it is possible to obtain a result equivalent to actually performing input/output activation by the process 202A, the test condition setting time t shown in FIG. □ can be shortened compared to the test condition setting time jCz shown in FIG. This effect becomes greater as the input/output operating conditions and timing settings become more complex.1.工＜t、、、Tゆ'CT
The following relationship holds true. In addition, since the data for input/output operation status and timing settings are directly set in the hardware control information, the timing adjustment process 402B shown in FIG. 4 is unnecessary, and the data processing device constituting the test system It becomes possible to eliminate the influence of physical characteristics of input/output devices.

In this way, in the first embodiment, it is possible to set arbitrary input/output operation states and timings without relying on input/output activation and timing adjustment in test program processing, and to perform input/output operation tests. Therefore, the test procedure, which has traditionally been problematic due to subtle differences in timing, can be realized using a unified method. Furthermore, since the operating states of the input/output processing device and the input/output device can be defined in detail using the input/output operating state and timing setting data, it is possible to create any input/output operating state and timing.

Note that in this embodiment, the hardware control information is located between the central processing unit and the input/output processing unit, but this information is logical information, and is located between the central processing unit and the input/output processing unit. It is also possible to integrate it into a processing device. In addition, although this embodiment is shown as an example regarding input/output processing, if the data processing device has information for controlling hardware logic operations as seen in this example, it is limited to input/output operations. It's not something you do.

〔Effect of the invention〕

As described above, according to the present invention, the influence of the physical characteristics of data processing devices and input/output devices on testing can be eliminated, and input/output operation status can be determined without starting input/output for setting test conditions. Since the output start timing can be set to an optimal state, the overall test execution time can be shortened.

[Brief explanation of drawings]

Fig. 1 is a diagram for explaining a test method for a data processing device showing an embodiment of the present invention, Fig. 2 is an overall configuration diagram of a test system to which the present invention is applied, and Fig. 3 is a diagram illustrating the test system according to the present invention. The input/output operation status and timing settings in this embodiment are shown based on the passage of time. FIG. 4 is a diagram for explaining a conventional data processing device test method, and FIG. FIG. 3 is a diagram showing the output operation state and timing settings based on the passage of time. 200: Test program processing, 201: Input/output operating state timing setting data, 202: Input/output operating state setting processing, 203: Test execution processing. 204 hardware control information, 205: input/output processing device, 208: input/output device. Patent applicant: Hitachi, Ltd.

Claims (1)

[Claims] 1. In a test method for testing the input/output operation of a data processing device, it is recommended to directly set an arbitrary input/output operation state on the hardware immediately before the test, and then test against the set input/output operation state. Characteristic testing method for data processing equipment.