JPH04369044A - Testing device for computer - Google Patents

Abstract

PURPOSE:To form a testing drive pattern without executing simulation or compiler by emulating a computer to be tested. CONSTITUTION:A memory 3 storing an emulating program is connected to a microcomputer 5, the microcomputer 5 is allowed to execute the emulating program based upon a signal outputted from a testing device body 2, prescribed output data from the microcomputer 5 are inputted to the body 2, a drive pattern is formed based upon output data from the body 2, the microcomputer 5 is driven based upon the drive pattern, and the output data of the microcomputer are compared with reference data in the body 2 to test the output data.

Description

[Detailed description of the invention]

0001

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test device for evaluating and analyzing microcomputers.

0002

[Background Art] When testing a microcomputer, a drive pattern is input from a test device to the microcomputer to drive the microcomputer, and the output data from the microcomputer at that time is imported into the test device, and a standard prepared in advance is used. Compare with the data,
It detects the presence or absence of errors and outputs them as test results.

0003

[Problems to be Solved by the Invention] By the way, the drive pattern for operating a microcomputer is usually determined by performing various simulations on the microcomputer based on the circuit connection data that constitutes the microcomputer, or by running a compiler. Created based on data. For this reason, preparations for testing such as creating an execution program for simulation and preparing circuit connection data for the microcomputer are troublesome, such as requiring a long time.

The present invention was made in view of the above circumstances, and its purpose is to easily generate a drive pattern and use it to execute a test without running a simulation or a compiler. Our goal is to provide computer testing equipment that is capable of

[0005]

[Means for Solving the Problems] A computer testing device according to the present invention includes a second memory for storing a program for emulating a computer to be tested, and a second memory for storing a program for emulating a computer to be tested; The apparatus includes means for emulating, and means for generating a drive pattern based on output data from the computer to be tested at that time and storing it in a first memory.

[0006]

[Operation] In the present invention, since the computer to be tested can be driven by the emulation program stored in the second memory by the emulation means, the drive pattern is based on the data obtained at that time. can be generated, making it possible to test the computer without running simulation or compilation.

[0007]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be specifically described below with reference to drawings showing embodiments thereof. FIG. 1 is a block diagram of a computer test device according to the present invention, and FIG. 2 is a block diagram showing a test device main body 2, an emulation program memory 3, a microcomputer 5, and a switch group 4 that connects and disconnects these. In the figure, 1 indicates a test device, and 5 indicates a microcomputer to be tested.

The test device 1 includes a test device main body 2, a memory 3 for an emulation program which is a second memory, and a switch group 4 arranged in a matrix.The test device main body 2 controls the switch group 4 to perform emulation. It is possible to connect and disconnect between the program memory 3 and the microcomputer 5 to be tested, and between these and the test device main body 2.

That is, the emulation program memory 3
address line 3a, data line 3b, control signal line 3c
and each address line 5a, data line 5b, and control signal line 5c of the microcomputer 5, and each address line 5a, data line 5b,
Control signal line 5c and address line 2a of test device main body 2
, the data line 2b, and the control signal line 2c are selectively connected and disconnected, respectively. 2d, 5d
Both are reference clock signal lines.

The test device main body 2 has an emulation function for the microcomputer 5 to be tested in addition to the original test function. During emulation, the test device main body 2 stimulates the control signal line 5c and reference clock signal line 5d of the microcomputer 5 to be tested to operate the microcomputer 5 to be tested.
A memory area at a designated address in the memory 3 is accessed via the control signal line 5c, data is written to this memory area, and data is read from this memory area. During this emulation, the address data, control data,
Other data etc. are taken into the test device main body 2 via the switch group 4.

FIG. 3 is a block diagram showing details of the test device main body 2. In the figure, 11 is a first memory for drive patterns, 13 is a switch, and 15 is a third memory for reference data. It shows. At the start of emulation, the switch 13 is set to OFF, and the emulation program memory 3, which is the second memory, is set to OFF.
The emulation program is stored in the first
, drive pattern memory 11 which is the second memory,
There are still drive patterns in the reference data memory 15.
The reference data is not stored. Test target microcomputer 5 during emulation
The output data is stored as reference data in the reference data memory 15 through the comparator 14. When the emulation is completed, necessary data is extracted from the data stored in the reference data memory 15 and stored as a drive pattern in the drive pattern memory 11 via the bus 16. Next, during an actual test on the microcomputer 5 to be tested, the switch 13 is turned on, and the drive pattern stored in the drive pattern memory 11 is taken out by the driver 12 during the test and sent to the microcomputer 5 via the switch 13 and switch group 4. It is output and is used to drive it.

Address data, control data, and other data output from the microcomputer 5 while being driven according to this drive pattern are input to the comparator 14 in the test apparatus main body 2 via the switch group 4. Reference data is inputted to this comparator 14 from the reference data memory 15 described above.
The comparator 14 compares this reference data with the microcomputer 5.
The comparison result is output to the display device 6 or the like as a test result.

The operation of the apparatus of the present invention will be explained separately during emulation and during testing, with reference to the flowchart shown in FIG. (Emulation process) First, an emulation program for driving the microcomputer 5 to be tested is input into the emulation program memory 3 in the test device 1 (step S1). The switch group 4 is controlled by the test device main body 2, and the address line 3a, data line 3b, control signal line 3c of the memory 3 of the emulation program, the address line 5a, data line 5b of the microcomputer 5,
and the control signal line 5c (step S2).
As described above, the test device main body 2 supplies the reference clock signal and control signal to the microcomputer 5 to operate the microcomputer 5 and execute the emulation program (step S3).

While the microcomputer 5 is running, its address data, control data, and other data are taken into the test device main body 2 under the control of the switch group 4 and stored in the reference data memory 15 via the comparator 14. (Step S4). It is determined whether or not the emulation for the microcomputer 5 has been completed (step S5), and if it has not been completed, the process returns to step S3, and when it has been completed, the test device main body 2 controls the switch group 4, and the emulation for the microcomputer 5 and the microcomputer 5 are controlled. The emulation memory 3 is separated (step S6). This ends the emulation process.

(Test process) Next, turn on the switch 13 in the test device main body 2, take out the drive pattern from the drive pattern memory 11 with the driver 12, and input it to the microcomputer 5 via the switch 13 and the switch group 4. Then (step S7), the microcomputer 5 is driven based on the drive pattern. Address data, control data, and other data output from the microcomputer 5 while the microcomputer is being driven according to the drive pattern are taken into the comparator 14 via the switch group 4, and compared with reference data from the reference data memory 15. Step S8), determines whether there is a difference between the two, in other words, whether there is an operational error, and outputs the test result to an external display device 6, etc. (
Step S9).

[0016]

As described above, in the device of the present invention, a computer is emulated based on the emulation program stored in the second memory, and reference data and drive patterns are generated based on the output data from the computer at that time. Since the drive pattern is generated and tested by driving the microcomputer using this drive pattern, there is no need to simulate the microcomputer or run a compiler on the software program in order to obtain the drive pattern. The present invention has excellent effects such as being able to test microcomputers easily, quickly, and accurately.

[Brief explanation of the drawing]

FIG. 1 is a block diagram of a computer test device according to the present invention.

FIG. 2 is an explanatory diagram showing the switch group of FIG. 1 and the connection relationship therewith.

FIG. 3 is a block diagram showing details of the test device main body.

FIG. 4 is a flowchart showing the processing steps of the apparatus of the present invention.

[Explanation of symbols]

1 Test device 2 Test device main body 3 Emulation program memory 4 Switch group 5 Microcomputer 11 Drive pattern memory 12 Driver 14 Comparator 15 Reference data memory 16 Bus

Claims (1)

[Claims] Claim 1: Drive a test target computer with a drive pattern stored in a first memory,
A computer testing device that compares predetermined output data of the computer under test with predetermined reference data includes a second memory in which a program for emulating the computer under test is stored; The present invention includes means for emulating a test target computer according to an emulation program, and means for generating a drive pattern based on data output from the test target computer during emulation and storing it in the first memory. A computer test device featuring: