JPH0285374U - - Google Patents

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Publication number
JPH0285374U
JPH0285374U JP16482888U JP16482888U JPH0285374U JP H0285374 U JPH0285374 U JP H0285374U JP 16482888 U JP16482888 U JP 16482888U JP 16482888 U JP16482888 U JP 16482888U JP H0285374 U JPH0285374 U JP H0285374U
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JP
Japan
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failure
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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JP16482888U
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English (en)
Japanese (ja)
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Priority to JP16482888U priority Critical patent/JPH0285374U/ja
Publication of JPH0285374U publication Critical patent/JPH0285374U/ja
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP16482888U 1988-12-20 1988-12-20 Pending JPH0285374U (cg-RX-API-DMAC7.html)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16482888U JPH0285374U (cg-RX-API-DMAC7.html) 1988-12-20 1988-12-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16482888U JPH0285374U (cg-RX-API-DMAC7.html) 1988-12-20 1988-12-20

Publications (1)

Publication Number Publication Date
JPH0285374U true JPH0285374U (cg-RX-API-DMAC7.html) 1990-07-04

Family

ID=31450769

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16482888U Pending JPH0285374U (cg-RX-API-DMAC7.html) 1988-12-20 1988-12-20

Country Status (1)

Country Link
JP (1) JPH0285374U (cg-RX-API-DMAC7.html)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55124077A (en) * 1979-03-16 1980-09-24 Nec Corp Semiconductor wafer electric characteristic testing apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55124077A (en) * 1979-03-16 1980-09-24 Nec Corp Semiconductor wafer electric characteristic testing apparatus

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