JPH0263185B2 - - Google Patents
Info
- Publication number
- JPH0263185B2 JPH0263185B2 JP59131716A JP13171684A JPH0263185B2 JP H0263185 B2 JPH0263185 B2 JP H0263185B2 JP 59131716 A JP59131716 A JP 59131716A JP 13171684 A JP13171684 A JP 13171684A JP H0263185 B2 JPH0263185 B2 JP H0263185B2
- Authority
- JP
- Japan
- Prior art keywords
- hole
- light
- image
- circuit
- light leakage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59131716A JPS619772A (ja) | 1984-06-25 | 1984-06-25 | スルホ−ル検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59131716A JPS619772A (ja) | 1984-06-25 | 1984-06-25 | スルホ−ル検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS619772A JPS619772A (ja) | 1986-01-17 |
| JPH0263185B2 true JPH0263185B2 (enExample) | 1990-12-27 |
Family
ID=15064528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59131716A Granted JPS619772A (ja) | 1984-06-25 | 1984-06-25 | スルホ−ル検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS619772A (enExample) |
-
1984
- 1984-06-25 JP JP59131716A patent/JPS619772A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS619772A (ja) | 1986-01-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR880002242A (ko) | 패턴 결함 검출방법및 장치 | |
| US5150423A (en) | Method of and device for inspecting pattern of printed circuit board | |
| JPH0263185B2 (enExample) | ||
| JP2942171B2 (ja) | プリント基板のパターン検査装置 | |
| JPH0437923B2 (enExample) | ||
| JP3827812B2 (ja) | 表面欠陥検査装置および表面欠陥検査方法 | |
| JPS6117049A (ja) | スル−ホ−ル検査装置 | |
| JP2503201B2 (ja) | スル−ホ−ル検査装置 | |
| JPH049251B2 (enExample) | ||
| JPS6319793Y2 (enExample) | ||
| Ando et al. | Automatic opitcal through hole inspection method for printed wiring boards using leakage light detection | |
| JPH0453253B2 (enExample) | ||
| JPH0690718B2 (ja) | 画像補正方法 | |
| JPH0721372A (ja) | 画像検出装置 | |
| JPH0516585B2 (enExample) | ||
| JPS5970947A (ja) | 印刷配線基板のパタ−ン検出方法 | |
| JPS62299705A (ja) | 実装部品検査装置 | |
| JP2000294139A (ja) | 周期性パターンの欠陥検査方法及び装置 | |
| JPS57208153A (en) | Inspecting method for defective aluminum pattern of semiconductor or the like | |
| JPH06265321A (ja) | 外観検査方法 | |
| JPH0619252B2 (ja) | 印刷配線基板のはんだ付検査装置 | |
| JPH04311053A (ja) | 欠陥判定器 | |
| JPS63122229A (ja) | 厚膜icのパタ−ン検査装置 | |
| JPS62237305A (ja) | パタ−ン欠陥検査方法 | |
| JPH02122246A (ja) | プリント配線基板のスルーホール検査装置 |