JPH026027B2 - - Google Patents

Info

Publication number
JPH026027B2
JPH026027B2 JP55148989A JP14898980A JPH026027B2 JP H026027 B2 JPH026027 B2 JP H026027B2 JP 55148989 A JP55148989 A JP 55148989A JP 14898980 A JP14898980 A JP 14898980A JP H026027 B2 JPH026027 B2 JP H026027B2
Authority
JP
Japan
Prior art keywords
signal
output signal
voltage level
tester
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55148989A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5772082A (en
Inventor
Masato Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55148989A priority Critical patent/JPS5772082A/ja
Publication of JPS5772082A publication Critical patent/JPS5772082A/ja
Publication of JPH026027B2 publication Critical patent/JPH026027B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55148989A 1980-10-24 1980-10-24 Device for testing logic circuit Granted JPS5772082A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55148989A JPS5772082A (en) 1980-10-24 1980-10-24 Device for testing logic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55148989A JPS5772082A (en) 1980-10-24 1980-10-24 Device for testing logic circuit

Publications (2)

Publication Number Publication Date
JPS5772082A JPS5772082A (en) 1982-05-06
JPH026027B2 true JPH026027B2 (enrdf_load_stackoverflow) 1990-02-07

Family

ID=15465207

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55148989A Granted JPS5772082A (en) 1980-10-24 1980-10-24 Device for testing logic circuit

Country Status (1)

Country Link
JP (1) JPS5772082A (enrdf_load_stackoverflow)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5413241A (en) * 1977-07-01 1979-01-31 Takeda Riken Ind Co Ltd Ic tester
JPS6030879Y2 (ja) * 1978-06-21 1985-09-14 信吾 西垣 前置波形記憶装置

Also Published As

Publication number Publication date
JPS5772082A (en) 1982-05-06

Similar Documents

Publication Publication Date Title
US4139147A (en) Asynchronous digital circuit testing and diagnosing system
KR100724115B1 (ko) Ａｔｅ 타이밍 측정 유닛 및 방법
US6510534B1 (en) Method and apparatus for testing high performance circuits
US4495642A (en) Timing analyzer with combination transition and duration trigger
US4107651A (en) Glitch detector
US4968902A (en) Unstable data recognition circuit for dual threshold synchronous data
JPH0736024B2 (ja) イベント列検出方法
JPH05215872A (ja) 不安定状態回避回路および不安定状態を回避する方法
JP3030642B2 (ja) 検出回路
JPH027530B2 (enrdf_load_stackoverflow)
US4613777A (en) Binary signal comparator using two d flip-flops for precise triggering
JPH026027B2 (enrdf_load_stackoverflow)
JPH02226077A (ja) Ｌｓｓｄ集積回路チップのａｃパフォーマンス・レベル試験装置
US3531727A (en) Sampling rate selector
US8008935B1 (en) Tester and a method for testing an integrated circuit
KR900008788B1 (ko) 테이터 회로를 구비한 반도체 집적회로장치
US5831455A (en) Polarity detector
JP4657216B2 (ja) 波形整形回路及びこの波形整形回路を備えた半導体試験装置
JP3058130B2 (ja) 高速半導体集積回路装置のテスト回路
JP2598710B2 (ja) Ｉｃの入力スレショルド測定装置
US6697755B2 (en) Test apparatus
JPH0673227B2 (ja) 磁気デイスク特性測定装置
JPS5883433A (ja) 論理レベル検出器
JP2846383B2 (ja) 集積回路試験装置
JPH04340482A (ja) Ｉｃ試験装置のデバイス動作電流測定回路