JPS5772082A - Device for testing logic circuit - Google Patents

Device for testing logic circuit

Info

Publication number
JPS5772082A
JPS5772082A JP55148989A JP14898980A JPS5772082A JP S5772082 A JPS5772082 A JP S5772082A JP 55148989 A JP55148989 A JP 55148989A JP 14898980 A JP14898980 A JP 14898980A JP S5772082 A JPS5772082 A JP S5772082A
Authority
JP
Japan
Prior art keywords
output signal
signal
high speed
output
under test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55148989A
Other languages
English (en)
Japanese (ja)
Other versions
JPH026027B2 (enrdf_load_stackoverflow
Inventor
Masato Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55148989A priority Critical patent/JPS5772082A/ja
Publication of JPS5772082A publication Critical patent/JPS5772082A/ja
Publication of JPH026027B2 publication Critical patent/JPH026027B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55148989A 1980-10-24 1980-10-24 Device for testing logic circuit Granted JPS5772082A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55148989A JPS5772082A (en) 1980-10-24 1980-10-24 Device for testing logic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55148989A JPS5772082A (en) 1980-10-24 1980-10-24 Device for testing logic circuit

Publications (2)

Publication Number Publication Date
JPS5772082A true JPS5772082A (en) 1982-05-06
JPH026027B2 JPH026027B2 (enrdf_load_stackoverflow) 1990-02-07

Family

ID=15465207

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55148989A Granted JPS5772082A (en) 1980-10-24 1980-10-24 Device for testing logic circuit

Country Status (1)

Country Link
JP (1) JPS5772082A (enrdf_load_stackoverflow)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5413241A (en) * 1977-07-01 1979-01-31 Takeda Riken Ind Co Ltd Ic tester
JPS553456U (enrdf_load_stackoverflow) * 1978-06-21 1980-01-10

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5413241A (en) * 1977-07-01 1979-01-31 Takeda Riken Ind Co Ltd Ic tester
JPS553456U (enrdf_load_stackoverflow) * 1978-06-21 1980-01-10

Also Published As

Publication number Publication date
JPH026027B2 (enrdf_load_stackoverflow) 1990-02-07

Similar Documents

Publication Publication Date Title
KR890004450B1 (ko) 검사 벡터 인덱싱 방법 및 장치
KR950033511A (ko) 장치의 경계-탐색 포트를 사용해서 그 장치를 부분 · 탐색 검사하는 방법
GB1291522A (en) Apparatus and method for testing logic circuits
KR900005472A (ko) 검사 버퍼/레지스터
GB1498125A (en) Digital circuit module test system
GB1523060A (en) Printed circuit board tester
JPS5772082A (en) Device for testing logic circuit
DE69030209D1 (de) Durch Ereigniss befähigte Prüfarchitektur für integrierte Schaltungen
GB1121324A (en) An improved method of testing dynamic response
KR900008788B1 (ko) 테이터 회로를 구비한 반도체 집적회로장치
KR900005474A (ko) 개량된 검사 회로
JPS6447973A (en) Device tester
JPS578858A (en) Integrated circuit package
JPS57169683A (en) Measuring device for electric current consumption
JPS57169684A (en) Testing system for integrated circuit element
JPS5750666A (en) Testing device for function of circuit
SU382983A1 (ru) Автоматическое устройство для испытаний
JP2944307B2 (ja) Ａ／ｄコンバータの非直線性の検査方法
JPS562045A (en) Inspection unit for random logic circuit
SU725048A1 (ru) Устройство дл измерени динамических параметров микросхем
RU2020498C1 (ru) Устройство контроля контактирования интегральных схем
JPS57111714A (en) Integrated circuit
JPS5760414A (en) Automatic testing device of electric power source
JPS5855873A (ja) Ｉｃテスタ
KR930009149B1 (ko) 소자 검사장치용 디지탈 ic 로직레벨 발생회로