JPS5413241A - Ic tester - Google Patents

Ic tester

Info

Publication number
JPS5413241A
JPS5413241A JP7883077A JP7883077A JPS5413241A JP S5413241 A JPS5413241 A JP S5413241A JP 7883077 A JP7883077 A JP 7883077A JP 7883077 A JP7883077 A JP 7883077A JP S5413241 A JPS5413241 A JP S5413241A
Authority
JP
Japan
Prior art keywords
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7883077A
Other languages
Japanese (ja)
Inventor
Nariaki Futagami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Takeda Riken Industries Co Ltd filed Critical Takeda Riken Industries Co Ltd
Priority to JP7883077A priority Critical patent/JPS5413241A/en
Publication of JPS5413241A publication Critical patent/JPS5413241A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP7883077A 1977-07-01 1977-07-01 Ic tester Pending JPS5413241A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7883077A JPS5413241A (en) 1977-07-01 1977-07-01 Ic tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7883077A JPS5413241A (en) 1977-07-01 1977-07-01 Ic tester

Publications (1)

Publication Number Publication Date
JPS5413241A true JPS5413241A (en) 1979-01-31

Family

ID=13672737

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7883077A Pending JPS5413241A (en) 1977-07-01 1977-07-01 Ic tester

Country Status (1)

Country Link
JP (1) JPS5413241A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55118155A (en) * 1979-03-02 1980-09-10 Chiyou Lsi Gijutsu Kenkyu Kumiai Test method and its device for logic circuit
JPS55166882U (en) * 1979-05-17 1980-12-01
JPS5772082A (en) * 1980-10-24 1982-05-06 Fujitsu Ltd Device for testing logic circuit
JPH04102081A (en) * 1990-08-21 1992-04-03 Toshiba Corp Integrated circuit inspection device
JP2005114598A (en) * 2003-10-09 2005-04-28 Oki Electric Ind Co Ltd Adjustment method for strobe timing, and function test device of semiconductor device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5142905A (en) * 1974-10-11 1976-04-12 Denryoku Chuo Kenkyujo

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5142905A (en) * 1974-10-11 1976-04-12 Denryoku Chuo Kenkyujo

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55118155A (en) * 1979-03-02 1980-09-10 Chiyou Lsi Gijutsu Kenkyu Kumiai Test method and its device for logic circuit
JPS55166882U (en) * 1979-05-17 1980-12-01
JPS5772082A (en) * 1980-10-24 1982-05-06 Fujitsu Ltd Device for testing logic circuit
JPH026027B2 (en) * 1980-10-24 1990-02-07 Fujitsu Ltd
JPH04102081A (en) * 1990-08-21 1992-04-03 Toshiba Corp Integrated circuit inspection device
JP2005114598A (en) * 2003-10-09 2005-04-28 Oki Electric Ind Co Ltd Adjustment method for strobe timing, and function test device of semiconductor device
JP4564250B2 (en) * 2003-10-09 2010-10-20 Ｏｋｉセミコンダクタ株式会社 Function test method of semiconductor device

Similar Documents

Publication Publication Date Title
JPS5443089A (en) Xxray tester
JPS5465085A (en) Pin tester
ZA783654B (en) Test device
JPS53139397A (en) Viginal probe
JPS5466087A (en) Ic structure
JPS5483494A (en) Hardness tester
JPS53137683A (en) Ic
JPS5422885A (en) Balance tester
JPS5390778A (en) Ic
JPS5441088A (en) Ic
JPS53143974A (en) Inspecting device
JPS5487467A (en) Ic
JPS53105382A (en) Tester
JPS53101984A (en) Semiconductor tester
JPS5413241A (en) Ic tester
JPS5473278A (en) Tester
JPS53104859A (en) Ic inserting mechanism
JPS5478987A (en) Ic logic
JPS5488164A (en) Time measuring device
JPS5476175A (en) Parts tester
JPS544001A (en) Testing circuit
JPS5413231A (en) Memory tester
JPS5412657A (en) Ic tester
JPS5390774A (en) Ic
GB2003301B (en) Testing apparatus