JPH0257643B2 - - Google Patents

Info

Publication number
JPH0257643B2
JPH0257643B2 JP19010884A JP19010884A JPH0257643B2 JP H0257643 B2 JPH0257643 B2 JP H0257643B2 JP 19010884 A JP19010884 A JP 19010884A JP 19010884 A JP19010884 A JP 19010884A JP H0257643 B2 JPH0257643 B2 JP H0257643B2
Authority
JP
Japan
Prior art keywords
measured
measurement light
light
scanning
counters
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP19010884A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6166907A (ja
Inventor
Sadamitsu Nishihara
Yoshiharu Kuwabara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Priority to JP19010884A priority Critical patent/JPS6166907A/ja
Publication of JPS6166907A publication Critical patent/JPS6166907A/ja
Publication of JPH0257643B2 publication Critical patent/JPH0257643B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP19010884A 1984-09-10 1984-09-10 光学測定装置 Granted JPS6166907A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19010884A JPS6166907A (ja) 1984-09-10 1984-09-10 光学測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19010884A JPS6166907A (ja) 1984-09-10 1984-09-10 光学測定装置

Publications (2)

Publication Number Publication Date
JPS6166907A JPS6166907A (ja) 1986-04-05
JPH0257643B2 true JPH0257643B2 (it) 1990-12-05

Family

ID=16252506

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19010884A Granted JPS6166907A (ja) 1984-09-10 1984-09-10 光学測定装置

Country Status (1)

Country Link
JP (1) JPS6166907A (it)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4812568B2 (ja) * 2006-09-07 2011-11-09 株式会社ミツトヨ 光学式測定装置、光学式測定方法、及び光学式測定処理プログラム

Also Published As

Publication number Publication date
JPS6166907A (ja) 1986-04-05

Similar Documents

Publication Publication Date Title
JPH0257642B2 (it)
CA1061538A (en) Optical apparatus for measuring article dimension by means of a light beam
US6201604B1 (en) System for the measurement of the cut length of moving articles
US4097160A (en) Method for inspecting object defection by light beam
KR102194321B1 (ko) 연속 측정 가능한 분광 타원계
JPH0257643B2 (it)
JPS58179302A (ja) 光電式測定方法および装置
EP0243961B1 (en) Film thickness measuring device
US3941980A (en) Scanning photoelectric microscope
JPH0371044B2 (it)
JP2000258146A (ja) 放射線厚さ測定装置
JP2667501B2 (ja) レーザ距離測定装置
JP3050996B2 (ja) 光ビーム形状測定装置
JPH0312241B2 (it)
JPS6365885B2 (it)
JPS58218604A (ja) 光電式測長方法および装置
JPH0234363B2 (it)
JPH0716963Y2 (ja) 光学式走査型測定装置
SU945644A1 (ru) Способ измерени угловых мер и устройство дл его осуществлени
JPH09210639A (ja) 外径測定装置
JPS598163Y2 (ja) 端縁位置検出装置
JPS61293641A (ja) 真空溶解による連続鋳造設備のレベル測定装置
JPS58103603A (ja) 非接触型測長装置
JPH09138115A (ja) 走査型光学式寸法測定装置
JPS59226802A (ja) 光学式測定機器におけるエツジ検出装置