JPH0247442Y2 - - Google Patents

Info

Publication number
JPH0247442Y2
JPH0247442Y2 JP7795684U JP7795684U JPH0247442Y2 JP H0247442 Y2 JPH0247442 Y2 JP H0247442Y2 JP 7795684 U JP7795684 U JP 7795684U JP 7795684 U JP7795684 U JP 7795684U JP H0247442 Y2 JPH0247442 Y2 JP H0247442Y2
Authority
JP
Japan
Prior art keywords
thin
lead
optical fiber
leads
suction head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7795684U
Other languages
English (en)
Japanese (ja)
Other versions
JPS60189808U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7795684U priority Critical patent/JPS60189808U/ja
Publication of JPS60189808U publication Critical patent/JPS60189808U/ja
Application granted granted Critical
Publication of JPH0247442Y2 publication Critical patent/JPH0247442Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP7795684U 1984-05-29 1984-05-29 薄形icのリ−ド曲がり検査装置 Granted JPS60189808U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7795684U JPS60189808U (ja) 1984-05-29 1984-05-29 薄形icのリ−ド曲がり検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7795684U JPS60189808U (ja) 1984-05-29 1984-05-29 薄形icのリ−ド曲がり検査装置

Publications (2)

Publication Number Publication Date
JPS60189808U JPS60189808U (ja) 1985-12-16
JPH0247442Y2 true JPH0247442Y2 (enrdf_load_stackoverflow) 1990-12-13

Family

ID=30621495

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7795684U Granted JPS60189808U (ja) 1984-05-29 1984-05-29 薄形icのリ−ド曲がり検査装置

Country Status (1)

Country Link
JP (1) JPS60189808U (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS60189808U (ja) 1985-12-16

Similar Documents

Publication Publication Date Title
CN111257321B (zh) 线缆检测设备
KR970010122B1 (ko) 기판외관검사장치
TWI413206B (zh) A center of the wafer detection method and a recording medium on which the method is recorded
CN111999314B (zh) 一种自动检查柔性pcb加工过程中变形的装置及其方法
TWI232929B (en) Image-based inspection system including positioning compensation for non-planar targets
US6590221B2 (en) On-line measuring system for measuring substrate thickness and the method thereof
TW201915443A (zh) 基於影像尺的定位量測系統
CN1581457A (zh) 基于双目机器视觉的球栅阵列半导体器件品质检测系统
JPH0247442Y2 (enrdf_load_stackoverflow)
CN205538709U (zh) 多引脚元件针脚的视觉检测装置
JPH08285785A (ja) はんだ付け良否検査装置
JPS63191007A (ja) ネジの検査測定方法
US5774227A (en) Anomally detection machine for fabricated parts formed on a carrier strip and method of use
JPH0247443Y2 (enrdf_load_stackoverflow)
JPS63109307A (ja) チツプ部品の装着検査装置
CN214276811U (zh) 一种手持式缝隙测量仪
JPH10261900A (ja) 実装部品の検査方法
CN211373503U (zh) 检测装置
USRE43925E1 (en) Three dimensional profile inspecting apparatus
JPS6312241B2 (enrdf_load_stackoverflow)
JPH10311705A (ja) 画像入力装置
CN1570560A (zh) 印刷电路板孔径孔数检测cis图像获取方法
JP3062255B2 (ja) 回路基板検査装置における被検査回路基板の基準位置検出方法
JPH03100424A (ja) 指示計自動読み取り装置
JP2900564B2 (ja) 部品吸着検出装置