JPH0245826Y2 - - Google Patents
Info
- Publication number
- JPH0245826Y2 JPH0245826Y2 JP11794083U JP11794083U JPH0245826Y2 JP H0245826 Y2 JPH0245826 Y2 JP H0245826Y2 JP 11794083 U JP11794083 U JP 11794083U JP 11794083 U JP11794083 U JP 11794083U JP H0245826 Y2 JPH0245826 Y2 JP H0245826Y2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- probe
- contact
- output
- divider circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 32
- 239000000523 sample Substances 0.000 claims description 26
- 238000004804 winding Methods 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 3
- 238000012790 confirmation Methods 0.000 description 11
- 230000003321 amplification Effects 0.000 description 5
- 238000003199 nucleic acid amplification method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000007257 malfunction Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
Landscapes
- Testing Relating To Insulation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11794083U JPS6025978U (ja) | 1983-07-28 | 1983-07-28 | 耐電圧試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11794083U JPS6025978U (ja) | 1983-07-28 | 1983-07-28 | 耐電圧試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6025978U JPS6025978U (ja) | 1985-02-21 |
| JPH0245826Y2 true JPH0245826Y2 (enrdf_load_html_response) | 1990-12-04 |
Family
ID=30271289
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11794083U Granted JPS6025978U (ja) | 1983-07-28 | 1983-07-28 | 耐電圧試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6025978U (enrdf_load_html_response) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0635186Y2 (ja) * | 1988-06-03 | 1994-09-14 | シャープ株式会社 | 電子機器の耐圧試験装置 |
| JP5291860B2 (ja) * | 2005-12-26 | 2013-09-18 | 日置電機株式会社 | 絶縁耐電圧試験装置 |
-
1983
- 1983-07-28 JP JP11794083U patent/JPS6025978U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6025978U (ja) | 1985-02-21 |
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