JPH0233926Y2 - - Google Patents
Info
- Publication number
- JPH0233926Y2 JPH0233926Y2 JP1983164009U JP16400983U JPH0233926Y2 JP H0233926 Y2 JPH0233926 Y2 JP H0233926Y2 JP 1983164009 U JP1983164009 U JP 1983164009U JP 16400983 U JP16400983 U JP 16400983U JP H0233926 Y2 JPH0233926 Y2 JP H0233926Y2
- Authority
- JP
- Japan
- Prior art keywords
- upper apron
- apron
- side frame
- front surface
- bolt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Bending Of Plates, Rods, And Pipes (AREA)
Priority Applications (11)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16400983U JPS6071425U (ja) | 1983-10-25 | 1983-10-25 | プレス機械における上部エプロンの取付構造 |
US06/651,754 US4672831A (en) | 1983-09-21 | 1984-09-18 | Bending press |
CA000463543A CA1255201A (en) | 1983-09-21 | 1984-09-19 | Bending press |
AU33331/84A AU573758B2 (en) | 1983-09-21 | 1984-09-20 | Brake press |
GB08423802A GB2147836B (en) | 1983-09-21 | 1984-09-20 | Be |
CH4514/84A CH666202A5 (de) | 1983-09-21 | 1984-09-20 | Biegepresse. |
DE3434470A DE3434470C2 (de) | 1983-09-21 | 1984-09-20 | Biegepresse |
KR1019840005790A KR890002647B1 (ko) | 1983-09-21 | 1984-09-21 | 벤딩 프레스 |
IT8422759A IT1176751B (it) | 1983-09-21 | 1984-09-21 | Pressa per piegare pezzi metallici in forma di foglio |
FR848414556A FR2552015B1 (fr) | 1983-09-21 | 1984-09-21 | Presse a cintrage |
SE8404750A SE464281B (sv) | 1983-09-21 | 1984-09-21 | Bockningspress |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16400983U JPS6071425U (ja) | 1983-10-25 | 1983-10-25 | プレス機械における上部エプロンの取付構造 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6071425U JPS6071425U (ja) | 1985-05-20 |
JPH0233926Y2 true JPH0233926Y2 (en, 2012) | 1990-09-12 |
Family
ID=30359691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16400983U Granted JPS6071425U (ja) | 1983-09-21 | 1983-10-25 | プレス機械における上部エプロンの取付構造 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6071425U (en, 2012) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5345170A (en) | 1992-06-11 | 1994-09-06 | Cascade Microtech, Inc. | Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
US6380751B2 (en) | 1992-06-11 | 2002-04-30 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
US5561377A (en) | 1995-04-14 | 1996-10-01 | Cascade Microtech, Inc. | System for evaluating probing networks |
US6232789B1 (en) | 1997-05-28 | 2001-05-15 | Cascade Microtech, Inc. | Probe holder for low current measurements |
US5914613A (en) | 1996-08-08 | 1999-06-22 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
US6002263A (en) | 1997-06-06 | 1999-12-14 | Cascade Microtech, Inc. | Probe station having inner and outer shielding |
US6578264B1 (en) | 1999-06-04 | 2003-06-17 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
US6445202B1 (en) | 1999-06-30 | 2002-09-03 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
US6838890B2 (en) | 2000-02-25 | 2005-01-04 | Cascade Microtech, Inc. | Membrane probing system |
US6965226B2 (en) | 2000-09-05 | 2005-11-15 | Cascade Microtech, Inc. | Chuck for holding a device under test |
US6914423B2 (en) | 2000-09-05 | 2005-07-05 | Cascade Microtech, Inc. | Probe station |
DE10143173A1 (de) | 2000-12-04 | 2002-06-06 | Cascade Microtech Inc | Wafersonde |
US7355420B2 (en) | 2001-08-21 | 2008-04-08 | Cascade Microtech, Inc. | Membrane probing system |
US6836135B2 (en) | 2001-08-31 | 2004-12-28 | Cascade Microtech, Inc. | Optical testing device |
US6777964B2 (en) | 2002-01-25 | 2004-08-17 | Cascade Microtech, Inc. | Probe station |
AU2003233659A1 (en) | 2002-05-23 | 2003-12-12 | Cascade Microtech, Inc. | Probe for testing a device under test |
US6847219B1 (en) | 2002-11-08 | 2005-01-25 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
US6724205B1 (en) | 2002-11-13 | 2004-04-20 | Cascade Microtech, Inc. | Probe for combined signals |
US7250779B2 (en) | 2002-11-25 | 2007-07-31 | Cascade Microtech, Inc. | Probe station with low inductance path |
US6861856B2 (en) | 2002-12-13 | 2005-03-01 | Cascade Microtech, Inc. | Guarded tub enclosure |
US7221172B2 (en) | 2003-05-06 | 2007-05-22 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
US7492172B2 (en) | 2003-05-23 | 2009-02-17 | Cascade Microtech, Inc. | Chuck for holding a device under test |
US7057404B2 (en) | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
US7176705B2 (en) | 2004-06-07 | 2007-02-13 | Cascade Microtech, Inc. | Thermal optical chuck |
US7368927B2 (en) | 2004-07-07 | 2008-05-06 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
EP1932003A2 (en) | 2005-06-13 | 2008-06-18 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
DE202007018733U1 (de) | 2006-06-09 | 2009-03-26 | Cascade Microtech, Inc., Beaverton | Messfühler für differentielle Signale mit integrierter Symmetrieschaltung |
US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1554143A (en) * | 1975-06-26 | 1979-10-17 | Plastona Waddington Ltd John | Plastics sheet material and articles produced therefrom |
-
1983
- 1983-10-25 JP JP16400983U patent/JPS6071425U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6071425U (ja) | 1985-05-20 |
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