JPH0233350U - - Google Patents

Info

Publication number
JPH0233350U
JPH0233350U JP11307588U JP11307588U JPH0233350U JP H0233350 U JPH0233350 U JP H0233350U JP 11307588 U JP11307588 U JP 11307588U JP 11307588 U JP11307588 U JP 11307588U JP H0233350 U JPH0233350 U JP H0233350U
Authority
JP
Japan
Prior art keywords
vacuum
evacuation system
ray
standing wave
atmosphere
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11307588U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0714874Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988113075U priority Critical patent/JPH0714874Y2/ja
Publication of JPH0233350U publication Critical patent/JPH0233350U/ja
Application granted granted Critical
Publication of JPH0714874Y2 publication Critical patent/JPH0714874Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP1988113075U 1988-08-29 1988-08-29 真空用ｘ線定在波測定装置 Expired - Lifetime JPH0714874Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988113075U JPH0714874Y2 (ja) 1988-08-29 1988-08-29 真空用ｘ線定在波測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988113075U JPH0714874Y2 (ja) 1988-08-29 1988-08-29 真空用ｘ線定在波測定装置

Publications (2)

Publication Number Publication Date
JPH0233350U true JPH0233350U (enExample) 1990-03-02
JPH0714874Y2 JPH0714874Y2 (ja) 1995-04-10

Family

ID=31352594

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988113075U Expired - Lifetime JPH0714874Y2 (ja) 1988-08-29 1988-08-29 真空用ｘ線定在波測定装置

Country Status (1)

Country Link
JP (1) JPH0714874Y2 (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62226048A (ja) * 1986-03-28 1987-10-05 Toshiba Corp 結晶固体の分光分析方法
JPS63142811A (ja) * 1986-12-05 1988-06-15 Nec Corp 界面超構造の製造方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62226048A (ja) * 1986-03-28 1987-10-05 Toshiba Corp 結晶固体の分光分析方法
JPS63142811A (ja) * 1986-12-05 1988-06-15 Nec Corp 界面超構造の製造方法

Also Published As

Publication number Publication date
JPH0714874Y2 (ja) 1995-04-10

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