JPH0222887A - Manufacture of thin copper foil clad circuit board - Google Patents
Manufacture of thin copper foil clad circuit boardInfo
- Publication number
- JPH0222887A JPH0222887A JP63171734A JP17173488A JPH0222887A JP H0222887 A JPH0222887 A JP H0222887A JP 63171734 A JP63171734 A JP 63171734A JP 17173488 A JP17173488 A JP 17173488A JP H0222887 A JPH0222887 A JP H0222887A
- Authority
- JP
- Japan
- Prior art keywords
- copper foil
- copper
- thickness
- etching
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims abstract description 91
- 239000011889 copper foil Substances 0.000 title claims abstract description 59
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 15
- 238000005530 etching Methods 0.000 claims abstract description 73
- 239000010949 copper Substances 0.000 claims abstract description 34
- 229910052802 copper Inorganic materials 0.000 claims abstract description 32
- 238000000034 method Methods 0.000 claims description 28
- 239000000615 nonconductor Substances 0.000 claims description 5
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 abstract description 26
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 abstract description 22
- 239000007921 spray Substances 0.000 abstract description 13
- 239000003795 chemical substances by application Substances 0.000 abstract description 6
- FBAFATDZDUQKNH-UHFFFAOYSA-M iron chloride Chemical compound [Cl-].[Fe] FBAFATDZDUQKNH-UHFFFAOYSA-M 0.000 abstract description 3
- 229920001225 polyester resin Polymers 0.000 abstract description 3
- 239000004645 polyester resin Substances 0.000 abstract description 3
- 239000003989 dielectric material Substances 0.000 abstract 2
- 230000001419 dependent effect Effects 0.000 abstract 1
- 239000006185 dispersion Substances 0.000 abstract 1
- 239000000243 solution Substances 0.000 description 27
- 229920005989 resin Polymers 0.000 description 11
- 239000011347 resin Substances 0.000 description 11
- 239000007864 aqueous solution Substances 0.000 description 9
- 239000011888 foil Substances 0.000 description 9
- 229910052782 aluminium Inorganic materials 0.000 description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 8
- -1 etc. Polymers 0.000 description 8
- 230000000052 comparative effect Effects 0.000 description 6
- 239000011521 glass Substances 0.000 description 6
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 6
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 230000003449 preventive effect Effects 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 4
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 4
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 4
- 238000000465 moulding Methods 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 239000002253 acid Substances 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 150000001298 alcohols Chemical class 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- JRKICGRDRMAZLK-UHFFFAOYSA-L peroxydisulfate Chemical compound [O-]S(=O)(=O)OOS([O-])(=O)=O JRKICGRDRMAZLK-UHFFFAOYSA-L 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000005406 washing Methods 0.000 description 3
- 230000037303 wrinkles Effects 0.000 description 3
- LUBJCRLGQSPQNN-UHFFFAOYSA-N 1-Phenylurea Chemical compound NC(=O)NC1=CC=CC=C1 LUBJCRLGQSPQNN-UHFFFAOYSA-N 0.000 description 2
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonia chloride Chemical compound [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 235000019270 ammonium chloride Nutrition 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000003475 lamination Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000006386 neutralization reaction Methods 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 230000003014 reinforcing effect Effects 0.000 description 2
- 239000003381 stabilizer Substances 0.000 description 2
- 229920005992 thermoplastic resin Polymers 0.000 description 2
- OEPOKWHJYJXUGD-UHFFFAOYSA-N 2-(3-phenylmethoxyphenyl)-1,3-thiazole-4-carbaldehyde Chemical compound O=CC1=CSC(C=2C=C(OCC=3C=CC=CC=3)C=CC=2)=N1 OEPOKWHJYJXUGD-UHFFFAOYSA-N 0.000 description 1
- ULRPISSMEBPJLN-UHFFFAOYSA-N 2h-tetrazol-5-amine Chemical compound NC1=NN=NN1 ULRPISSMEBPJLN-UHFFFAOYSA-N 0.000 description 1
- ALYNCZNDIQEVRV-UHFFFAOYSA-N 4-aminobenzoic acid Chemical compound NC1=CC=C(C(O)=O)C=C1 ALYNCZNDIQEVRV-UHFFFAOYSA-N 0.000 description 1
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- 229910021592 Copper(II) chloride Inorganic materials 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000002313 adhesive film Substances 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229960004050 aminobenzoic acid Drugs 0.000 description 1
- 239000004760 aramid Substances 0.000 description 1
- 229920003235 aromatic polyamide Polymers 0.000 description 1
- 150000003851 azoles Chemical class 0.000 description 1
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 1
- 239000012964 benzotriazole Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- DQXBYHZEEUGOBF-UHFFFAOYSA-N but-3-enoic acid;ethene Chemical compound C=C.OC(=O)CC=C DQXBYHZEEUGOBF-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000005536 corrosion prevention Methods 0.000 description 1
- 229960003280 cupric chloride Drugs 0.000 description 1
- 150000001923 cyclic compounds Chemical class 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
- 239000012895 dilution Substances 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229920006351 engineering plastic Polymers 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000005038 ethylene vinyl acetate Substances 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000007888 film coating Substances 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 235000011187 glycerol Nutrition 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000002075 main ingredient Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000012188 paraffin wax Substances 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 1
- 229920002589 poly(vinylethylene) polymer Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- UKLNMMHNWFDKNT-UHFFFAOYSA-M sodium chlorite Chemical compound [Na+].[O-]Cl=O UKLNMMHNWFDKNT-UHFFFAOYSA-M 0.000 description 1
- 239000011550 stock solution Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 1
- 239000001993 wax Substances 0.000 description 1
Landscapes
- Manufacturing Of Printed Circuit Boards (AREA)
- Laminated Bodies (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、電子部品を実装するプリント配線板製造用の
銅箔と電気絶縁体とより製造された銅箔張積層板、銅張
フィルム、銅張シートなどの銅箔張回路基板や補強され
た銅箔であって、厚みが数−〜2Q )a 、所望厚み
に対する厚みのバラツキが±1.0p以下である薄銅箔
張回路基板の製造法である。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a copper foil-clad laminate, a copper-clad film, and a copper foil-clad laminate manufactured from copper foil and an electrical insulator for manufacturing printed wiring boards on which electronic components are mounted. A copper foil-clad circuit board such as a copper-clad sheet or a reinforced copper foil, the thickness of which is several -~2Q)a, and the thickness variation with respect to the desired thickness is ±1.0p or less. It is a manufacturing method.
銅箔張回路基板の製造法は、銅箔と絶縁体とを重ね通常
積層成形等によって製造され、用いる銅箔としては、電
解法による厚み105虜、770−135−118p1
12JJなどが量産され、ア“ルミニウム箔等の担体上
に形成された5uM、 97aなどの銅箔も作られて
いる。又、圧延法による銅箔があるが、製造法との関係
から薄くなるほど高価なものとなり実質的には35−以
下の厚さの箔は実用化されていない。Copper foil-clad circuit boards are manufactured by laminating copper foil and insulators, usually by lamination molding, etc. The copper foil used is 105cm thick, 770-135-118p1 by electrolytic method.
12JJ etc. are mass-produced, and copper foils such as 5uM and 97A formed on carriers such as aluminum foils are also made.Also, there are copper foils made by the rolling method, but due to the manufacturing method, the thinner the It is expensive, and foils with a thickness of 35 mm or less have not been put into practical use.
このような銅箔を積層成形に用いる場合、その厚みが1
8虜より薄いと皺になりやすく、銅箔を絶縁体と重ね合
わせる作業が極めて困難となるので殆ど実用化されてい
ない。またアルミニウム箔等の担体上に形成された銅箔
は、この点を改善したものであるが高価であり、更に銅
箔によるプリント配線を形成する前に担体であるアルミ
ニウム箔等の除去工程が必要という問題があった。When such copper foil is used for laminated molding, its thickness is 1
If it is thinner than 8mm, it tends to wrinkle easily and the work of overlapping the copper foil with the insulator becomes extremely difficult, so it is rarely put into practical use. Copper foil formed on a carrier such as aluminum foil improves this point, but is expensive and requires a step to remove the carrier, such as aluminum foil, before forming printed wiring using copper foil. There was a problem.
また、プリント配線板加工工程におい”ご塩化銅や塩化
鉄などのエツチング液にて銅箔張回路基板を予備エツチ
ングして銅箔を研磨した後、プリント配線板の製造工程
に用いる方法が知られていたが、予備エツチングによる
銅箔の除去量を多くしたり、或いは1m角などの大面積
をエツチングして、薄銅張回路基板を製造することは出
来なかった。In addition, in the printed wiring board processing process, there is a known method in which a copper foil-clad circuit board is pre-etched with an etching solution such as copper chloride or iron chloride, the copper foil is polished, and then used in the printed wiring board manufacturing process. However, it has not been possible to manufacture a thin copper-clad circuit board by increasing the amount of copper foil removed by preliminary etching or by etching a large area such as 1 m square.
本発明は、大型回路基板として使用可能な薄銅箔張回路
基板を生産性よく製造する方法について鋭意検討した結
果、従来のエンチング法に比較して非常に遅い速度で銅
張回路基板の銅箔全面をエツチングして、もとの銅箔の
厚さの25〜90%を除去する方法によって厚み精度の
高い薄銅張回路基板が得られることを見出し、本発明に
到達した。As a result of intensive research into a method for manufacturing thin copper foil-clad circuit boards with high productivity that can be used as large-sized circuit boards, the present invention has developed a process for manufacturing copper foil on copper-clad circuit boards at a much slower speed than the conventional etching method. The inventors have discovered that a thin copper-clad circuit board with high thickness accuracy can be obtained by etching the entire surface and removing 25 to 90% of the original thickness of the copper foil, and have arrived at the present invention.
すなわち、本発明は、銅箔と電気絶縁体とより製造され
た銅箔張回路基板を銅エツチング液を用い、0.01〜
0.3虜/秒の速度で銅箔全面をエツチングして、もと
の銅箔の厚さの25〜90%を除去し、所望厚みに対し
て残存銅箔の厚みのバラツキが±1.Op以内とするこ
とを特徴とする薄銅箔張回路基板の製造法である。That is, in the present invention, a copper foil-clad circuit board manufactured from copper foil and an electrical insulator is etched using a copper etching solution of 0.01 to
The entire surface of the copper foil is etched at a rate of 0.3 mm/sec to remove 25-90% of the original copper foil thickness, and the thickness variation of the remaining copper foil is ±1. This is a method for manufacturing a thin copper foil-clad circuit board, characterized in that the thickness is within Op.
以下、本発明の構成について説明する。The configuration of the present invention will be explained below.
本発明の銅箔と電気絶縁体とより製造された銅箔張回路
基板は、特に限定はなく電子、電気材料用として用いら
れている種々の市販品等いずれも使用可能であるが、本
発明の製造法を適用する場合、通常、公称厚みが18−
以上の銅箔を用いた片面或いは両面銅張のフィルム、シ
ート、繊維強化絶縁樹脂積層板、金属芯積層板、内層に
プリント配線網を形成した多層シールド板などである。The copper foil-clad circuit board manufactured from the copper foil and electrical insulator of the present invention is not particularly limited, and various commercially available products used for electronic and electrical materials can be used, but the present invention When applying the manufacturing method, the nominal thickness is usually 18-
These include single-sided or double-sided copper-clad films and sheets using the above-described copper foil, fiber-reinforced insulating resin laminates, metal core laminates, and multilayer shield plates with a printed wiring network formed on the inner layer.
電気絶縁体層は、ポリイミド樹脂、ポリエステル樹脂等
のフィルムやシート、熱硬化性樹脂や耐熱性の熱可塑性
樹脂とガラス(Eガラス、Dガラス、Sガラス、石英ガ
ラス(クォーツ)その他)、セラミックス類(アルミナ
、窒化硼素、その他)、全芳香族ポリアミド、ポリイミ
ド、セミカーボン、フッ素樹脂、その他の耐熱性エンジ
ニアリングプラスチックなどを一種或いは二種以上適宜
併用してなる繊維、チョップなどを用いた多孔質フィル
ム或いはシート状の補強基材とを組み合わせてなるプリ
プレグを用いて製造されるもの、又は、鉄、アルミニウ
ム板等に絶縁性の接着剤や接着フィルムを被覆してなる
ものなどである。また、通常の銅張積層板は積層成形の
圧力により、銅箔表面が補強基材の凹凸を一部反映して
例えばガラス織布基材の場合約40−ピツチで4uM程
度のうねりを持ったものとなるが、このうねりを機械的
に精密研磨して取ったものを使用することもできる。The electrical insulator layer is made of films or sheets made of polyimide resin, polyester resin, etc., thermosetting resin or heat-resistant thermoplastic resin, glass (E glass, D glass, S glass, quartz glass, etc.), ceramics. (alumina, boron nitride, etc.), fully aromatic polyamide, polyimide, semi-carbon, fluororesin, other heat-resistant engineering plastics, etc. Porous film using fibers, chopped, etc. Alternatively, it may be manufactured using a prepreg combined with a sheet-shaped reinforcing base material, or it may be manufactured by coating an iron, aluminum plate, etc. with an insulating adhesive or adhesive film. In addition, due to the pressure of lamination molding, the surface of the copper foil in ordinary copper-clad laminates partly reflects the unevenness of the reinforcing base material, and for example, in the case of a glass woven base material, it has a waviness of about 4 μM at about 40-pitch. However, it is also possible to use a material whose undulations have been precisely polished mechanically.
本発明の銅エツチング液は、過酸化水素/硫酸、過硫酸
塩、塩化銅又は塩化鉄などを主剤とする水溶液であって
、通常のエツチングに用いられるエツチング液に比較し
てエツチング成分の濃度を低く保つ方法、温度を低く保
つ方法又は銅箔面上の供給エツチング液の接触量(スプ
レー法の場合にはスプレー圧力)を少なくする方法等並
びにこれらを適宜組み合わせることによってエツチング
速度を低下させ 0.旧〜0.3p/秒の範囲、より好
ましくは0.03〜0.20虜/秒の範囲のエツチング
速度として使用するものである。エツチング速度が0.
3un/秒より速いと僅かなエツチング処理時間の差に
よりエツチングが進行するので、所望の厚みとの公差が
大きくなるばかりでなく、厚みの場所によるバラツキが
大きくなる傾向があり、所定の銅箔厚みに対するバラツ
キ幅を±1.Op以内にすることが困難となるので好ま
しくない。また、エツチング速度が0.01J!XA/
秒より遅い場合には、エツチングに時間がかかり実用的
でない。The copper etching solution of the present invention is an aqueous solution containing hydrogen peroxide/sulfuric acid, persulfate, copper chloride, iron chloride, etc. as a main ingredient, and has a lower concentration of etching components than etching solutions used for ordinary etching. The etching speed can be lowered by keeping the etching temperature low, by keeping the temperature low, by reducing the contact amount of the supplied etching liquid on the copper foil surface (spray pressure in the case of a spray method), or by appropriately combining these methods. Etching rates are used in the range of 1 to 0.3 p/sec, more preferably in the range of 0.03 to 0.20 p/sec. Etching speed is 0.
If the etching speed is faster than 3 un/sec, etching progresses due to a slight difference in etching processing time, which not only increases the tolerance from the desired thickness, but also tends to increase the variation in thickness depending on the location. The variation width is ±1. This is not preferable because it becomes difficult to keep it within Op. Also, the etching speed is 0.01J! XA/
If it is slower than seconds, etching takes a long time and is not practical.
上記において、エツチング速度を遅くする方法としては
、濃度、温度又は銅箔面上のエツチング液の接触量(ス
プレー法の場合にはスプレー圧力或いはスプレーノズル
数)を低くするものであるが、温度を低くすること、エ
ツチング液の薬剤濃度を低くすること又はこれらを組み
合わせることが好適である。In the above, methods for slowing down the etching speed include lowering the concentration, temperature, or amount of contact of the etching solution on the copper foil surface (spray pressure or number of spray nozzles in the case of a spray method). It is preferable to lower the chemical concentration of the etching solution, or to use a combination thereof.
このような条件を満足する具体的な例としてはエツチン
グ液として過酸化水素/硫酸系を用いる場合、過酸化水
素の濃度は2〜4w/v%、硫酸の濃度は3〜7w/v
%で温度25〜50℃、銅濃度30〜60g/lが好適
である。この過酸化水素/硫酸系のエツチング剤には、
過酸化水素の安定剤、銅の溶解促進剤などの添加剤を加
える方法は好ましいものである。このような添加剤とし
てはメタノール、エタノール、プロパツール、ブタノー
ルなどの1価アルコール;エチレングリコール、プロピ
レングリコール、フタンジオール、ペンクンジオールな
どの2価のアルコール;グリセリン、ペンタエリスリト
ールなどの3価以上のアルコール;ポリエチレングリコ
ールなどのグリコールエーテル類;アミノ安息香酸、ア
ミノテトラゾール、フェニル尿素などの含窒素有機環状
化合物類などが例示され、通常0.1〜5%の範囲から
適宜選択される。A specific example of satisfying these conditions is when a hydrogen peroxide/sulfuric acid system is used as the etching solution, the concentration of hydrogen peroxide is 2 to 4 w/v%, and the concentration of sulfuric acid is 3 to 7 w/v.
%, a temperature of 25 to 50°C and a copper concentration of 30 to 60 g/l are suitable. This hydrogen peroxide/sulfuric acid based etching agent has
A method of adding additives such as a hydrogen peroxide stabilizer and a copper dissolution promoter is preferred. Such additives include monohydric alcohols such as methanol, ethanol, propatool, and butanol; dihydric alcohols such as ethylene glycol, propylene glycol, phthanediol, and pencundiol; and trihydric or higher alcohols such as glycerin and pentaerythritol. ; Glycol ethers such as polyethylene glycol; Nitrogen-containing organic cyclic compounds such as aminobenzoic acid, aminotetrazole, and phenylurea, and the like, and the amount is usually appropriately selected from the range of 0.1 to 5%.
CuCl2を主剤とする塩化第二銅エツチング液の場合
には例えばCuCI2・2t1201.42!bとII
cI(20°8e゛)Q、 5galを溶解して水溶液
1gal としたもの(CuCI。・2820170g
#!、HCI 19w/v%の水溶液)程度(7)1度
以下とした水溶液を用い、温度30〜40℃で行う方法
が例示される。In the case of a cupric chloride etching solution based on CuCl2, for example, CuCI2.2t1201.42! b and II
cI (20°8e゛) Q, 5gal dissolved to make 1gal aqueous solution (CuCI.・2820170g
#! , an aqueous solution containing HCI 19 w/v %) (7) An example is a method in which the temperature is 30 to 40° C. using an aqueous solution with a temperature of 1 degree or less.
Nf140H,NH4Cl、 Cu、 NaClO2,
NH4NO3などを含む水溶液の所謂「アルカリエツチ
ング液」の場合には例えばN)1.OH3mol/j!
、 NaCl0□10mol#!、NH4Cl 1
mol/ l 、 NH4HCO31mol/ l 、
N)14NO31mol/ I!程度の濃度以下と
し、水溶液中のCu濃度を10 lb/gal (74
,89gム0以下、温度 30〜45℃に保つ方法、又
は通常の液濃度としてエツチング温度を20〜30℃程
度にする方法が例示される。Nf140H, NH4Cl, Cu, NaClO2,
In the case of a so-called "alkaline etching solution" which is an aqueous solution containing NH4NO3, etc., for example, N)1. OH3mol/j!
, NaCl0□10mol#! , NH4Cl 1
mol/l, NH4HCO31 mol/l,
N) 14NO31mol/I! The concentration of Cu in the aqueous solution is 10 lb/gal (74
, 89 g or less and a temperature of 30 to 45 DEG C., or a method of keeping the etching temperature at about 20 to 30 DEG C. as a normal solution concentration.
(NH4) 2S20+1を主剤とする過硫酸塩エツチ
ング液の場合には例えば(NH4) zstO@21t
l/gal (240g/ (1)程度の濃度以下とし
た水溶液を用い、20〜35℃の温度で行う方法が例示
される。In the case of a persulfate etching solution based on (NH4)2S20+1, for example, (NH4)zstO@21t
An example is a method using an aqueous solution having a concentration of about 1/gal (240 g/(1) or less) at a temperature of 20 to 35°C.
塩化第二鉄を主剤とするエツチング液の場合、40°B
e’の塩化第二鉄液に、35%MCI 20〜1vo
1%加えた液又はこれを水で希釈した液を用い、20〜
35℃で行う方法が例示される。In the case of etching liquid based on ferric chloride, 40°B
e' ferric chloride solution, 35% MCI 20-1vo
Using a 1% solution or a solution diluted with water, 20~
An example is a method performed at 35°C.
クロム酸/硫酸エツチング液の場合には例えばCr0a
240g/ j2、Na2SO440,5g/L+2
so4(96%)180g#!程度の濃度以下とした水
溶液を用いる方法が例示される。In the case of chromic acid/sulfuric acid etching solution, for example Cr0a
240g/j2, Na2SO440,5g/L+2
so4 (96%) 180g#! An example is a method using an aqueous solution with a concentration below a certain level.
しかしながら例えばアルカリエツチング液では、液の安
定性が悪いという欠点があり、過硫酸塩エツチング液で
はエツチングされた銅が水溶液から析出し易い欠点があ
り、塩化第二鉄エツチング液では溶解銅濃度の変化によ
りエツチング速度が大きく変化する欠点があり、更にク
ロム酸/硫酸エツチング液の場合、積層板の樹脂を侵す
という欠点があるので、本発明においては過酸化水素/
硫酸系のエツチング液が液管理の点や公害などの点から
最も好ましい。However, for example, alkaline etching solutions have the disadvantage of poor stability, persulfate etching solutions have the disadvantage that etched copper tends to precipitate from the aqueous solution, and ferric chloride etching solutions have the disadvantage of varying dissolved copper concentration. In the present invention, hydrogen peroxide/sulfuric acid etching solution has the disadvantage that the etching rate changes greatly, and in the case of chromic acid/sulfuric acid etching solution, it corrodes the resin of the laminate.
A sulfuric acid-based etching solution is most preferred from the viewpoint of solution management and pollution.
本発明の製造法におけるエツチング方法としては通常ス
プレーエツチングを行うのが適当であり、水平或いは垂
直にして行う。エツチングにより所定厚みの銅箔とする
ためには、エツチング液によって、所定のエツチング条
件下におけるエツチング速度を測定して、エツチング時
間を設定する方法を使用する。例えば、両面に同一厚み
の銅箔を張った両面銅張板を用い、これを水平において
両面を同時に同一の厚みにするには、上下両面のエツチ
ング速度が同一となるようにスプレー圧等をコントロー
ルしてエツチング速度を揃え、所定時間エツチングする
方法による。又、垂直に立てて行う方法は上記に例示し
た所謂アルカリエツチングなどの方法においては作業環
境の問題が生じるので行うことはできないが、過酸化水
素/硫酸系の場合、同一スプレー圧力で両面を同時に同
一速度でエツチングでき、水平に置く場合のように上下
面間のエツチング速度の差を補正する必要がないことか
ら好適な方法の一つである。さらに、従来のエツチング
マシンは、通常、一定速度で移動する積層板の面に対し
てノズルの噴射方向を出来るだけ垂直とする方法が取ら
れているが、本発明の場合には積層板表面に均一にスプ
レーされればよく、30°〜50°程度傾けて使用する
こともできるものである。As the etching method in the manufacturing method of the present invention, spray etching is usually suitable and is carried out horizontally or vertically. In order to obtain a copper foil of a predetermined thickness by etching, a method is used in which the etching rate is measured under predetermined etching conditions using an etching solution and the etching time is set. For example, if you use a double-sided copper-clad board with copper foil of the same thickness on both sides, and you want to make both sides horizontally the same thickness at the same time, control the spray pressure etc. so that the etching speed on both the top and bottom is the same. The etching process is performed by adjusting the etching speed and etching for a predetermined period of time. In addition, methods such as the so-called alkaline etching mentioned above cannot be carried out vertically because they cause problems in the working environment, but in the case of hydrogen peroxide/sulfuric acid, both sides can be etched at the same time with the same spray pressure. This is one of the preferred methods because etching can be performed at the same speed and there is no need to correct the difference in etching speed between the upper and lower surfaces, unlike when the substrate is placed horizontally. Furthermore, in conventional etching machines, the jetting direction of the nozzle is normally set as perpendicular to the surface of the laminate plate that moves at a constant speed, but in the case of the present invention, the etching direction is perpendicular to the surface of the laminate plate, which moves at a constant speed. It is sufficient if the spray is uniformly applied, and it can also be used at an angle of about 30° to 50°.
上記に詳細に説明した方法によりエツチング速度を0.
05〜0.3pの速度で銅箔全面をエツチングして残存
銅箔の厚みバラツキを所定厚みの±l。The etching rate was reduced to 0.0 by the method detailed above.
The entire surface of the copper foil is etched at a rate of 0.05~0.3p to reduce the thickness variation of the remaining copper foil to ±1 of the predetermined thickness.
Opとし、その後のプリント配線製造工程における高密
度の配線の形成を可能とする。例えば厚さ9AEm〜3
p程度の薄銅張板は、公称厚さ±18−(1/202)
の銅箔を使用した銅張積層板をエツチングすることによ
り容易に高厚み精度で製造され、しかも元の銅張積層板
の接着力はそのまま生かされたものとできるものである
。また、厚さ12ρ〜20m程度の銅張板は、公称厚さ
±35E11(10Z)の銅箔を使用した銅張積層板を
エツチングすることにより同様に製造される。This enables the formation of high-density wiring in the subsequent printed wiring manufacturing process. For example, thickness 9AEm~3
The nominal thickness of thin copper clad plate of about P is ±18-(1/202)
By etching a copper-clad laminate using copper foil, it can be easily manufactured with high thickness accuracy, and the adhesive strength of the original copper-clad laminate can be utilized as is. Further, a copper clad board having a thickness of approximately 12 ρ to 20 m is similarly manufactured by etching a copper clad laminate using copper foil having a nominal thickness of ±35E11 (10Z).
上記したエツチング剤で処理した積層板の銅箔面は清浄
化した後、適宜乾燥し、銅箔面の保護のために防錆剤の
塗布や剥離可能な樹脂による被覆を行う。After cleaning the copper foil surface of the laminate treated with the etching agent described above, it is dried as appropriate, and a rust preventive agent or a peelable resin coating is applied to protect the copper foil surface.
ここに清浄化とは、中和、酸洗浄、水洗、湯洗などの公
知の不純物の除去法でよく、用いた銅エツチング液の安
定剤その他の成分を考慮して適宜選択するが、通常は中
和−・酸洗浄→(防錆或いは保護膜被覆)を行うのが好
ましい。Here, cleaning may be any known impurity removal method such as neutralization, acid washing, water washing, hot water washing, etc., and is selected appropriately taking into consideration the stabilizer and other components of the copper etching solution used, but usually It is preferable to carry out neutralization - acid cleaning -> (corrosion prevention or protective film coating).
適宜乾燥した後、本発明の防錆剤或いは剥離可能な樹脂
により銅箔面を保護する。防錆剤としては公知の銅の防
錆剤が挙げられ、ベンゾトリアゾールなどのアゾール化
合物が挙げられ、これに界面活性剤等を適宜併用したも
のが例示される。又、剥離可能な樹脂としては、ポリエ
チレン、ポリプロピレン、エチレン−プロピレン樹脂、
エチレン−酢酸ビニル樹脂、塩化ビニリデン、ポリアク
リレート共重合体、1,2−ポリブタジェン樹脂、ポリ
エステル樹脂、その他の熱可塑性樹脂製のフィルム類や
フォトレジストフィルム;パラフィンワックス、ポリエ
チレンワックス、ロジン、低分子量ポリスチレンなどの
汎用溶媒溶解性の樹脂類;フォトレジスト樹脂液などが
例示され、洗浄された銅箔面に直接圧着などしても良い
し、前記の防錆処理した面にさらに圧着などして銅箔面
を被覆する。After drying appropriately, the copper foil surface is protected with the rust preventive agent or peelable resin of the present invention. Examples of the rust preventive include known copper rust preventives, azole compounds such as benzotriazole, and those in which a surfactant or the like is appropriately used in combination. Also, examples of removable resins include polyethylene, polypropylene, ethylene-propylene resin,
Ethylene-vinyl acetate resin, vinylidene chloride, polyacrylate copolymer, 1,2-polybutadiene resin, polyester resin, other thermoplastic resin films and photoresist films; paraffin wax, polyethylene wax, rosin, low molecular weight polystyrene general-purpose solvent-soluble resins such as; examples include photoresist resin liquid, etc., and may be directly pressure-bonded to the cleaned copper foil surface, or further pressure-bonded to the rust-preventing surface as described above. Cover the surface.
以下、実施例、比較例により本発明を具体的に説明する
。なお、エツチングした銅箔の厚みは、うず電流方式で
測定した。Hereinafter, the present invention will be specifically explained with reference to Examples and Comparative Examples. The thickness of the etched copper foil was measured using an eddy current method.
実施例1
1020 X 1020 mmで板厚1.6mm、公称
IBp銅箔〈日鉱グールド社、TC箔)を両面に張った
ガラス布基材エポキシ樹脂積層板を水平スプレーエツチ
ングマシンを用い、過酸化水素/硫酸エツチング液(三
菱瓦斯化学■製、FES−6000、LOz□7.78
w/v%、H2SO1・11.7w/v%)の3倍希釈
液を用い、下記条件でエツチングした。Example 1 A glass cloth-based epoxy resin laminate measuring 1020 x 1020 mm and having a thickness of 1.6 mm and coated with nominal IBp copper foil (Nikko Gould Co., Ltd., TC foil) on both sides was etched with hydrogen peroxide using a horizontal spray etching machine. / Sulfuric acid etching solution (manufactured by Mitsubishi Gas Chemical ■, FES-6000, LOz□7.78
Etching was carried out under the following conditions using a 3-fold dilution of H2SO1.11.7w/v%).
一気1表
ついで、中和→酸洗浄−水洗した後、水溶性の防錆剤(
例えば、C,B、ブライト (三菱瓦斯化学■製)、コ
ロミンCB (花王アトラス0菊製など)を用いて、防
錆処理をして、渦電流式膜厚計(電測工業■製、グーメ
ス渦電流式膜厚計、型式O3−1)で銅箔の厚みを測定
することにより、第1表に記載の薄銅張板を連続して1
0枚製造した。After applying one layer at a time, neutralize, wash with acid, and wash with water, apply a water-soluble rust preventive agent (
For example, use C, B, Bright (manufactured by Mitsubishi Gas Chemical ■), Colomin CB (manufactured by Kao Atlas 0 Kiku, etc.) to prevent rust, and apply an eddy current film thickness meter (manufactured by Densoku Kogyo ■, Goomes). By measuring the thickness of the copper foil with an eddy current film thickness meter, model O3-1), one continuous thin copper clad plate listed in Table 1 was measured.
0 sheets were manufactured.
比較例1
実施例1において、エツチング液としてFES−600
0の原液を用い、エツチング条件を下記とする他は同様
とした。結果を第1表に示した。Comparative Example 1 In Example 1, FES-600 was used as the etching solution.
The etching conditions were the same except that a stock solution of No. 0 was used and the etching conditions were as follows. The results are shown in Table 1.
比較例2
公称厚さ9虜の片面接着処理電解銅箔を用いて実施例と
同様の両面板10枚を、40kg/cnf、170℃2
時間の積層成形条件で製造した。9p銅箔を皺の発生な
しに取り扱うことは困難を極め、積層成形品の30%に
皺が発生した。得られた両面板の測定結果を第2表に示
した。Comparative Example 2 Ten double-sided boards similar to those in the example were fabricated using single-sided adhesive treated electrolytic copper foil with a nominal thickness of 9 mm, 40 kg/cnf, 170°C2
Manufactured under laminated molding conditions for hours. It was extremely difficult to handle 9p copper foil without wrinkles, and wrinkles occurred in 30% of the laminated molded products. The measurement results of the obtained double-sided board are shown in Table 2.
比較例3
厚さ40−のアルミニウム箔に公称厚さ9Atmの銅メ
ツキ並びにメツキ面を凹凸処理した箔を使用して比較例
2と同様にして両面板を製造した後、アルミニウム箔を
エツチング除去した。得られた両面板の測定結果を第2
表に示した。Comparative Example 3 A double-sided board was manufactured in the same manner as in Comparative Example 2 using a 40-thick aluminum foil plated with copper of a nominal thickness of 9 Atm and a foil whose plated surface was roughened, and then the aluminum foil was removed by etching. . The measurement results of the double-sided board obtained are
Shown in the table.
・エツチングAN Ll、 t)、3/ SeC第2
表
実施例2
400X300 mmの実施例1と同様の両面銅張積層
板を水平スプレーエツチングマシンを用い、塩化第二鉄
エノチンダ液(FeC135,8(1,3b%HCI
1.211水3.Ojりを用い、温度 25℃、エツチ
ング速度 0.25/SeC,、スプレー圧力(上面1
.0kg/cnf、 下面0.8 kg / ctd
、 )で行う他は同様にして銅箔の平均厚み9.0At
B、厚み範囲8.1〜9.9−の薄銅張板を得た。・Etching AN Ll, t), 3/SeC 2nd
Table Example 2 A 400 x 300 mm double-sided copper-clad laminate similar to Example 1 was etched using a horizontal spray etching machine and etched with ferric chloride enochinda solution (FeC135,8 (1,3b% HCI).
1.211 water 3. Temperature: 25℃, etching rate: 0.25/SeC, spray pressure (upper surface 1
.. 0kg/cnf, bottom surface 0.8 kg/ctd
, ) in the same manner except that the average thickness of the copper foil was 9.0 At.
B. A thin copper clad plate having a thickness range of 8.1 to 9.9 mm was obtained.
以上、発明の詳細な説明および実施例、比較例から明瞭
な如く、本発明の製造法によれば、従来のアルミクラッ
ド銅箔を用いた場合と同等以上の銅箔厚み精度を有する
薄銅張積層板が容易に製造され、しかも、銅箔の剥離強
度においても優れたものであることが理解される。As is clear from the detailed description of the invention, Examples, and Comparative Examples, the manufacturing method of the present invention enables thin copper clad copper foils to have thickness accuracy equivalent to or higher than that using conventional aluminum clad copper foils. It is understood that the laminate is easily manufactured and has excellent peel strength of copper foil.
この結果、従来は高価なアルミニウム箔等の担体上に形
成された5ρ、9虜などの銅箔を使用する方法によって
しか製造出来なかった薄銅張積層板を精度よく安価に容
易に製造することが可能となるものであることが理解さ
れ、その産業上の意義は極めて大きいものである。As a result, thin copper-clad laminates, which could conventionally only be manufactured using methods using copper foils such as 5ρ and 9μ formed on carriers such as expensive aluminum foils, can be manufactured accurately, inexpensively, and easily. It is understood that this makes it possible, and its industrial significance is extremely large.
特許出願人 三菱瓦斯化学株式会社Patent applicant: Mitsubishi Gas Chemical Co., Ltd.
Claims (1)
銅エッチング液を用い、0.01〜0.3μm/秒の速
度で銅箔全面をエッチングして、もとの銅箔の厚さの2
5〜90%を除去し、所望厚みに対して残存銅箔の厚み
のバラツキが±1.0μm以内とすることを特徴とする
薄銅箔張回路基板の製造法。A copper foil-clad circuit board made of copper foil and an electrical insulator is etched over the entire surface of the copper foil at a rate of 0.01 to 0.3 μm/sec using a copper etching solution to restore the original thickness of the copper foil. Sano 2
A method for manufacturing a thin copper foil-clad circuit board, characterized in that 5 to 90% of the copper foil is removed and the variation in thickness of the remaining copper foil is within ±1.0 μm with respect to a desired thickness.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63171734A JP2947415B2 (en) | 1988-07-12 | 1988-07-12 | Manufacturing method of thin copper foil-clad circuit board |
DE68923904T DE68923904T2 (en) | 1988-05-20 | 1989-05-18 | Method for producing a substrate for circuit boards laminated with a thin copper foil. |
EP89108934A EP0342669B1 (en) | 1988-05-20 | 1989-05-18 | Method for preparing thin copper foil-clad substrate for circuit boards |
US07/354,954 US4917758A (en) | 1988-05-20 | 1989-05-19 | Method for preparing thin copper foil-clad substrate for circuit boards |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63171734A JP2947415B2 (en) | 1988-07-12 | 1988-07-12 | Manufacturing method of thin copper foil-clad circuit board |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0222887A true JPH0222887A (en) | 1990-01-25 |
JP2947415B2 JP2947415B2 (en) | 1999-09-13 |
Family
ID=15928695
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63171734A Expired - Fee Related JP2947415B2 (en) | 1988-05-20 | 1988-07-12 | Manufacturing method of thin copper foil-clad circuit board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2947415B2 (en) |
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Publication number | Priority date | Publication date | Assignee | Title |
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US5316402A (en) * | 1991-12-13 | 1994-05-31 | Tombow Pencil Co., Ltd. | Penholder cap |
US5462379A (en) * | 1993-08-31 | 1995-10-31 | Sailor Pen Co., Ltd. | Applicator having cap which pressurizes and seals inner space |
JP2002141666A (en) * | 2000-10-31 | 2002-05-17 | Mitsubishi Gas Chem Co Inc | Manufacturing method for multi-layered copper plate |
JP2003078234A (en) * | 2001-08-31 | 2003-03-14 | Toppan Printing Co Ltd | Printed wiring board and its manufacturing method |
JP2005340785A (en) * | 2004-04-30 | 2005-12-08 | Hitachi Via Mechanics Ltd | Printed circuit board, processing method of printed circuit board, and manufacturing method of printed circuit board |
EP1667504A1 (en) * | 1998-09-14 | 2006-06-07 | Ibiden Co., Ltd. | Process for manufacturing a multilayer printed circuit board, and multilayer printed circuit board |
EP1835052A3 (en) * | 1998-09-14 | 2007-09-26 | Ibiden Co., Ltd. | Process for manufacturing a multilayer printed circuit board, and multilayer printed circuit board |
CN114351191A (en) * | 2022-01-12 | 2022-04-15 | 九江德福科技股份有限公司 | Copper foil surface density adjusting device and acting surface manufacturing method thereof |
Families Citing this family (1)
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KR102575861B1 (en) * | 2021-12-13 | 2023-09-11 | 주식회사 제이에스제이 | Method for manufacturing heavey copper printed circuit board |
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JPS5065868A (en) * | 1973-10-13 | 1975-06-03 | ||
JPS62200796A (en) * | 1986-02-27 | 1987-09-04 | イビデン株式会社 | Manufacture of extra-thin copper laminated board |
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5065868A (en) * | 1973-10-13 | 1975-06-03 | ||
JPS62200796A (en) * | 1986-02-27 | 1987-09-04 | イビデン株式会社 | Manufacture of extra-thin copper laminated board |
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US5316402A (en) * | 1991-12-13 | 1994-05-31 | Tombow Pencil Co., Ltd. | Penholder cap |
US5462379A (en) * | 1993-08-31 | 1995-10-31 | Sailor Pen Co., Ltd. | Applicator having cap which pressurizes and seals inner space |
US7827680B2 (en) | 1998-09-14 | 2010-11-09 | Ibiden Co., Ltd. | Electroplating process of electroplating an elecrically conductive sustrate |
EP1923489A2 (en) | 1998-09-14 | 2008-05-21 | Ibiden Co., Ltd. | A multilayer printed circuit board and a process for manufacturing the same |
US8065794B2 (en) | 1998-09-14 | 2011-11-29 | Ibiden Co., Ltd. | Printed wiring board and its manufacturing method |
EP1667504A1 (en) * | 1998-09-14 | 2006-06-07 | Ibiden Co., Ltd. | Process for manufacturing a multilayer printed circuit board, and multilayer printed circuit board |
US7230188B1 (en) | 1998-09-14 | 2007-06-12 | Ibiden Co., Ltd. | Printed wiring board and its manufacturing method |
EP1835052A3 (en) * | 1998-09-14 | 2007-09-26 | Ibiden Co., Ltd. | Process for manufacturing a multilayer printed circuit board, and multilayer printed circuit board |
EP1919266A2 (en) | 1998-09-14 | 2008-05-07 | Ibiden Co., Ltd. | Electroless plating solution, electroless plating process, and printed circuit board |
US7691189B2 (en) | 1998-09-14 | 2010-04-06 | Ibiden Co., Ltd. | Printed wiring board and its manufacturing method |
EP1923488A2 (en) | 1998-09-14 | 2008-05-21 | Ibiden Co., Ltd. | A process for manufacturing a multilayer printed circuit board |
JP2002141666A (en) * | 2000-10-31 | 2002-05-17 | Mitsubishi Gas Chem Co Inc | Manufacturing method for multi-layered copper plate |
JP2003078234A (en) * | 2001-08-31 | 2003-03-14 | Toppan Printing Co Ltd | Printed wiring board and its manufacturing method |
JP2005340785A (en) * | 2004-04-30 | 2005-12-08 | Hitachi Via Mechanics Ltd | Printed circuit board, processing method of printed circuit board, and manufacturing method of printed circuit board |
CN114351191A (en) * | 2022-01-12 | 2022-04-15 | 九江德福科技股份有限公司 | Copper foil surface density adjusting device and acting surface manufacturing method thereof |
CN114351191B (en) * | 2022-01-12 | 2023-09-12 | 九江德福科技股份有限公司 | Copper foil surface density adjusting device and acting surface manufacturing method thereof |
Also Published As
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