JP2002141666A - Manufacturing method for multi-layered copper plate - Google Patents
Manufacturing method for multi-layered copper plateInfo
- Publication number
- JP2002141666A JP2002141666A JP2000333694A JP2000333694A JP2002141666A JP 2002141666 A JP2002141666 A JP 2002141666A JP 2000333694 A JP2000333694 A JP 2000333694A JP 2000333694 A JP2000333694 A JP 2000333694A JP 2002141666 A JP2002141666 A JP 2002141666A
- Authority
- JP
- Japan
- Prior art keywords
- copper
- copper foil
- hole
- weight
- tetrazole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- ing And Chemical Polishing (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、少なくとも2層以
上の銅の層を有する銅張板の非貫通孔周辺部に張り出し
た銅、例えば突出銅やバリ銅を効果的に除去する多層銅
張板の製造方法に関する。さらに詳しくは、炭酸ガスレ
ーザによる孔あけにおいて問題となる外層銅箔の突出銅
やバリ銅を特殊なエッチング液により効率的にエッチン
グ除去しファインパターンを形成することに関する。こ
の孔あけで得られた多層銅張板を用いたプリント配線板
は、小型の半導体プラスチックパッケージ用等として使
用される。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a multi-layer copper clad for effectively removing copper, for example, protruding copper and burr copper, protruding around the non-through hole of a copper clad plate having at least two copper layers. The present invention relates to a method for manufacturing a plate. More specifically, the present invention relates to forming a fine pattern by efficiently etching and removing a protruding copper or burr copper of an outer layer copper foil which is a problem in drilling by a carbon dioxide gas laser using a special etching solution. The printed wiring board using the multilayer copper-clad board obtained by the perforation is used for a small semiconductor plastic package or the like.
【0002】[0002]
【従来の技術】半導体プラスチックパッケージ等に用い
られる高密度のファイン回路形成においては、平面方向
の接続に加え立体方向の接続が行われている。近年、ま
すます立体方向接続用の非貫通孔(ブラインドビアホー
ル)は小径となり、孔径が0.15mm以下となってきてお
り、このような小径の孔では、従来のメカニカルドリル
孔あけに替えて炭酸ガスレーザ等により孔があけられて
いるが、孔周辺の外層銅箔部に突出銅やバリ銅が生成す
る。また、外層銅箔に、予め化学エッチング等によりあ
けた孔を介してレーザを照射し、樹脂層のみを加工して
小径孔を形成する方法(コンホーマルマスク法)におい
ても内層銅箔に到達するだけの弱い出力のレーザによる
孔あけでは外層銅箔の突出銅やバリ銅は生成しないもの
の、内層銅箔面上に多量のスミヤが生成するといった難
点があった。このため、スミヤ量を減らすことを目的と
して過剰の出力又は照射数で炭酸ガスレーザー加工を行
うが、この場合では、孔周辺の外層銅箔部の突出銅やバ
リ銅が生成する。孔の周辺部は次工程の銅めっきの下地
となるので、その品質はめっき品質に影響し、接続の信
頼性に直接関係するため、孔周辺部の品質は重要とな
る。特に孔周辺部の表面銅箔の突出銅やバリ銅は均一な
めっき層の形成を阻害し、回路の形成に不都合な空洞の
原因となる。このため従来、メカニカルな研磨や特開平
04-263488号公報等で開示されたエッチング液で処理す
る方法(SUEP法と呼ばれる)により突出銅やバリ銅が
除去されてきた。しかしながら、この種の従来の除去法
では、回路のファイン化の為の薄銅化は可能であるが孔
周辺部の突出銅やバリ銅を効率的に除去することは困難
であった。2. Description of the Related Art In forming a high-density fine circuit used for a semiconductor plastic package or the like, a three-dimensional connection is performed in addition to a planar connection. In recent years, non-through holes (blind via holes) for three-dimensional connections have become smaller and smaller than 0.15 mm in diameter. For such small holes, a carbon dioxide laser has been used in place of conventional mechanical drilling. A hole is formed by the above method, but protruding copper and burr copper are generated in an outer layer copper foil portion around the hole. In addition, the outer layer copper foil is irradiated with a laser through a hole previously formed by chemical etching or the like, and only the resin layer is processed to form a small-diameter hole (conformal mask method). Drilling by a laser with a weak output does not produce protruding copper or burr copper on the outer layer copper foil, but has a disadvantage that a large amount of smear is generated on the inner layer copper foil surface. For this reason, carbon dioxide laser processing is performed with an excessive output or irradiation number for the purpose of reducing the amount of smear, but in this case, protruding copper or burr copper of the outer layer copper foil portion around the hole is generated. Since the periphery of the hole becomes a base for copper plating in the next step, the quality of the hole affects the plating quality and is directly related to the reliability of the connection. Therefore, the quality of the periphery of the hole is important. In particular, protruding copper or burr copper on the surface copper foil around the hole hinders formation of a uniform plating layer, and causes a cavity that is inconvenient for forming a circuit. For this reason, conventionally, mechanical polishing or
Protruding copper and burr copper have been removed by a method of treating with an etchant (referred to as a SUEP method) disclosed in Japanese Patent Application Laid-Open No. 04-263488. However, with this type of conventional removal method, it is possible to reduce the thickness of copper for finer circuits, but it has been difficult to efficiently remove protruding copper and burr copper around the hole.
【0003】[0003]
【発明が解決しようとする課題】本発明は、以上の問題
点を解決した、多層銅張板に小径の非貫通孔を形成し、
該孔周辺部に張り出した銅を効率的に除去し、且つ外層
銅箔の一部をエッチングして薄銅化する多層銅張板の製
造方法を提供することを目的とする。SUMMARY OF THE INVENTION The present invention solves the above problems by forming a small-diameter non-through hole in a multilayer copper-clad board.
It is an object of the present invention to provide a method of manufacturing a multilayer copper-clad board in which copper overhanging around the hole is efficiently removed, and a part of the outer layer copper foil is etched to make the copper thinner.
【0004】[0004]
【課題を解決するための手段】本発明者らは、上記目的
を達成すべく、鋭意検討を重ねた結果、テトラゾ−ルお
よびテトラゾール誘導体のうちの少なくとも一種、並び
に必要に応じてフェニル尿素を含有させた過酸化水素と
硫酸からなるエッチング液を使用することにより、銅箔
の表面を平面的に均一にエッチングして薄銅化するとと
もに小径孔周辺部に張り出した銅を効率的に除去できる
ことを見出し、本発明を完成した。すなわち、2層以上
の銅の層および非貫通孔を有する多層銅張板を製造する
方法において、多層銅張板に非貫通孔をあけ、次いで該
孔周辺部に張り出した銅を、過酸化水素0.5〜10重
量%、硫酸1〜15重量%、テトラゾ−ルおよびテトラ
ゾール誘導体のうちの少なくとも一種が0.001〜1
重量%、並びに必要に応じてフェニル尿素0.005〜
0.5重量%を含有する水溶液を用いて除去することを
特徴とする多層銅張板の製造方法に関するものである。Means for Solving the Problems The present inventors have conducted intensive studies in order to achieve the above object, and as a result, they have found that they contain at least one of tetrazole and tetrazole derivatives and, if necessary, phenylurea. By using an etching solution consisting of hydrogen peroxide and sulfuric acid, the surface of the copper foil can be uniformly etched in a plane to reduce the thickness of the copper foil and efficiently remove the copper protruding around the small diameter holes. Heading, the present invention has been completed. That is, in a method of manufacturing a multilayer copper-clad board having two or more copper layers and a non-through hole, a non-through hole is formed in the multilayer copper-clad board, and then the copper projecting around the hole is replaced with hydrogen peroxide. 0.5 to 10% by weight, sulfuric acid 1 to 15% by weight, at least one of tetrazole and tetrazole derivative is 0.001 to 1%
% By weight, and optionally phenylurea 0.005 to 0.005%
The present invention relates to a method for producing a multilayer copper-clad board, which comprises removing using an aqueous solution containing 0.5% by weight.
【0005】[0005]
【発明の実施の形態】本発明で使用されるエッチング液
中の過酸化水素の濃度は、0.5〜10重量%である。
0.5重量%未満では実質的なエッチング速度が不足
し、10重量%を越すと、エッチング速度が速すぎて制
御が難しくなる。DESCRIPTION OF THE PREFERRED EMBODIMENTS The concentration of hydrogen peroxide in an etching solution used in the present invention is 0.5 to 10% by weight.
If it is less than 0.5% by weight, the substantial etching rate is insufficient, and if it exceeds 10% by weight, the etching rate is too fast to control.
【0006】硫酸の濃度は、1〜15重量%である。硫
酸含有量が1重量%未満となると銅箔の表面を平面的に
エッチングするとともに小径孔周辺部の突出銅やバリ銅
等を効率的に除去することが困難となる。また、15重
量%以上の硫酸の使用は銅を溶解して行く過程で生成し
た硫酸銅の溶解度低下をきたし硫酸銅結晶を析出する。The concentration of sulfuric acid is 1 to 15% by weight. If the sulfuric acid content is less than 1% by weight, it becomes difficult to etch the surface of the copper foil two-dimensionally and efficiently remove protruding copper, burr copper and the like around the small diameter hole. Also, the use of sulfuric acid in an amount of 15% by weight or more causes a decrease in the solubility of copper sulfate produced in the course of dissolving copper, and precipitates copper sulfate crystals.
【0007】テトラゾールおよびテトラゾール誘導体と
しては、1H-テトラゾール、5−アミノ−1H-テトラゾ
ール、5−アミノ−1−メチルテトラゾール、1−メチ
ルテトラゾール、2−メチルテトラゾール、5−メチル
−1H-テトラゾール、1−フェニルテトラゾール、5−
フェニル−1H−テトラゾールが使用される。特に5−
アミノ−1H−テトラゾ−ル(以下、単にアミノテトラ
ゾ−ルと記載)が好適に使用される。テトラゾ−ル類の
含有量は0.001〜1重量%、好ましくは0.01〜
1重量%である。The tetrazole and tetrazole derivative include 1H-tetrazole, 5-amino-1H-tetrazole, 5-amino-1-methyltetrazole, 1-methyltetrazole, 2-methyltetrazole, 5-methyl-1H-tetrazole, -Phenyltetrazole, 5-
Phenyl-1H-tetrazole is used. Especially 5-
Amino-1H-tetrazole (hereinafter simply referred to as aminotetrazole) is preferably used. The content of the tetrazole is 0.001 to 1% by weight, preferably 0.01 to 1%.
1% by weight.
【0008】本発明のエッチング液に使用するフェニル
尿素の含有量は、特に制限は無く状況に応じて適宜選択
されるが、通常は0.005〜1重量%、好ましくは
0.01〜0.3重量%である。含有量の増加とともに
過酸化水素の安定化効果と処理ムラの解消度合いが増す
が、通常の処理条件では0.3重量%までの含有量で十
分である。[0008] The content of phenylurea used in the etching solution of the present invention is not particularly limited and may be appropriately selected depending on the circumstances, but is usually 0.005 to 1% by weight, preferably 0.01 to 0. 3% by weight. As the content increases, the stabilizing effect of hydrogen peroxide and the degree of elimination of processing unevenness increase, but under normal processing conditions, a content of up to 0.3% by weight is sufficient.
【0009】本発明のエッチング液は、上記各成分を使
用時に定められた含有量になるようにそれぞれ別々に添
加しても良いが、予め配合することが可能である。従っ
て、濃厚液を調製した後、本発明で定めた含有量となる
ように水で希釈して使用するのが好都合である。前記水
としては、イオン交換水が望ましい。The etching solution of the present invention may be added separately to each of the above components so as to have the contents determined at the time of use, but may be mixed in advance. Therefore, it is convenient to prepare a concentrated solution and then dilute it with water so as to have the content specified in the present invention. As the water, ion-exchanged water is desirable.
【0010】本発明のエッチング液を用いて銅張板の孔
周辺の外層銅箔部に発生した突出銅やバリ銅をエッチン
グ除去する処理方法として、特に制限はないがスプレ−
エッチングマシンを使用したスプレ−法やエッチング槽
での揺動、ポンプ循環等による浸漬法など任意の方法で
処理すれば良い。また、エッチング速度は特に限定しな
いが一般的には0.02〜1.0μm/秒 で行う。目的とする
エッチング除去する外層の銅箔厚みは3〜7μmであ
り、同時に突出銅やバリ銅も除去するようにスプレー等
の圧力も調整する。処理の温度は特に制限はないが、2
0〜50℃、通常25〜40℃で処理すれば良い。処理
温度が高い方がエッチング速度も速くなるので、目的に
応じて設定すれば良い。孔周辺の外層銅箔部の突出銅や
バリ銅をエッチング除去する目安としては、外層銅箔よ
り高いエッチング速度でそれがエッチングされることを
念頭に、外層銅箔の厚さ残が通常3〜7μmとなるよう
にエッチングを実施するのが好ましい。孔周辺の外層銅
箔部の突出銅やバリ銅をエッチング除去した後、さらに
公知のエッチング法を用いて、外層銅箔の表面を平滑化
したり、厚さの微調整をすることも出来る。The processing method for etching and removing protruding copper and burr copper generated on the outer layer copper foil around the holes of the copper-clad plate using the etching solution of the present invention is not particularly limited, but is not limited to spraying.
The treatment may be performed by an arbitrary method such as a spray method using an etching machine, a swing in an etching tank, and a dipping method by pump circulation. The etching rate is not particularly limited, but is generally 0.02 to 1.0 μm / sec. The thickness of the copper foil of the outer layer to be removed by etching is 3 to 7 μm, and the pressure of the spray or the like is also adjusted so as to remove protruding copper and burr copper at the same time. The temperature of the treatment is not particularly limited.
The treatment may be performed at 0 to 50 ° C, usually 25 to 40 ° C. Since the higher the processing temperature, the higher the etching rate, it may be set according to the purpose. As a guideline for removing the protruding copper and burr copper in the outer layer copper foil portion around the hole, the remaining thickness of the outer layer copper foil is usually 3 to 3 in consideration that it is etched at a higher etching rate than the outer layer copper foil. It is preferable to perform etching so that the thickness becomes 7 μm. After the protruding copper and burr copper in the outer layer copper foil around the hole are removed by etching, the surface of the outer layer copper foil can be smoothed or the thickness can be finely adjusted by using a known etching method.
【0011】[0011]
【実施例】以下に本発明を実施例によって説明するが、
本発明は実施例によって制限されるものではない。EXAMPLES The present invention will be described below with reference to examples.
The present invention is not limited by the embodiments.
【0012】実施例1〜5および比較例1〜3 図1に、2層以上の銅の層(12μm厚)を有する銅張
板に、レーザシート使用法による炭酸ガスレーザによっ
て非貫通孔を形成する方法において、孔あけした銅張板
の表面の銅箔の一部をエッチングして薄銅化(5μm
厚)すると同時に孔周辺部の外層銅箔の突出銅やバリ銅
をエッチング除去する工程を示した。図1aは銅張多層
積層板の断面図である。 この多層積層板に図1bに示
すように炭酸ガスレーザにより非貫通孔が形成される。
外層と内層の銅箔の導通をとるために、この非貫通孔に
は後工程でめっきが施されるが、孔周辺部に突出銅やバ
リ銅があるこの図1bの状態では、孔内部の均一なめっ
き層の形成を阻害し回路の形成に不都合な空洞の原因と
なる。そこで図1cに示すように孔あけ後の回路基板を
表1に示した薬液を用いて、温度35℃で、エッチング
漕に浸漬した後、純水でリンスして乾燥した。しかる後
に孔周辺部の断面を光学顕微鏡および走査型電子顕微鏡
で観察し、図1cに示すように孔まわりの突出銅やバリ
銅が除去されているか否か、また外層銅箔が均一に薄銅
化されているか否かを観察した。また、比較例としてテ
トラゾール類を含まない薬液(比較例1〜3)について
も、同様に処理し顕微鏡観察した。この観察結果を、そ
れぞれ下記の判断基準に従って評価した。その結果を表
1に示した。<評価の判断基準> (突出銅およびバリ銅の除去性) ◎:完全に除去された、 ○:一部残存していた、×:
大部分残存していた (外層銅箔の均一な薄銅化) ◎:完全に均一、 ○:一部均一性に欠ける、×:均一
性に欠けるExamples 1 to 5 and Comparative Examples 1 to 3 In FIG. 1, non-through holes are formed in a copper clad board having two or more copper layers (12 μm thick) by a carbon dioxide laser using a laser sheet. In the method, a part of the copper foil on the surface of the perforated copper clad board is etched to make it thinner (5 μm
Thickness) and the step of etching and removing the protruding copper and burr copper of the outer layer copper foil around the hole. FIG. 1a is a sectional view of a copper-clad multilayer laminate. Non-through holes are formed in the multilayer laminate by a carbon dioxide gas laser as shown in FIG. 1b.
In order to establish conduction between the outer layer and the inner layer copper foil, the non-through hole is plated in a later step. However, in the state of FIG. The formation of a uniform plating layer is hindered, which causes an inconvenience in forming a circuit. Then, as shown in FIG. 1c, the circuit board after the drilling was immersed in an etching tank at a temperature of 35 ° C. using the chemicals shown in Table 1, and then rinsed with pure water and dried. Thereafter, the cross section of the periphery of the hole was observed with an optical microscope and a scanning electron microscope, and as shown in FIG. 1c, whether or not the protruding copper or burr copper around the hole was removed, and the outer layer copper foil was uniformly thin copper. It was observed whether or not it had been converted. As a comparative example, a chemical solution containing no tetrazole (Comparative Examples 1 to 3) was similarly treated and observed under a microscope. The observation results were evaluated according to the following criteria. The results are shown in Table 1. <Evaluation criteria> (Removability of protruding copper and burr copper) :: Completely removed, :: Partially remaining, ×:
Most remained (uniform thinning of outer layer copper foil) :: Completely uniform, :: Partial lack of uniformity, ×: Lack of uniformity
【0013】[0013]
【表1】 [Table 1]
【0014】実施例6、比較例4、5 ファインパターンの形成能を評価した。12μm厚の銅
箔を実装した4層積層板を過酸化水素2重量%、硫酸7
重量%、アミノテトラゾール0.2重量%およびフェニ
ル尿素0.2重量%を含む水溶液からなるエッチング液
を用いて、35℃でスプレーエッチングにより、突出銅
やバリ銅の除去および外層銅箔を7μmエッチングして
薄銅化を施した。次に外層銅箔部に所望のライン・アン
ド・スペース(L(μm)/S(μm))からなる銅パターン
を作り、この上に15μmの銅めっきを施してファイン
パターンを作製した。表2に示した各種のL(μm)/S(μ
m)からなるファインパターンを各々20本作製しライン
が形成されたか否かを光学顕微鏡観察およびラインの導
通性の測定により判定した。比較のために比較例4とし
て添加剤としてプロパノールを含むエッチング液(過酸
化水素2重量%、硫酸7重量%およびプロパノール2重
量%)で処理した場合および比較例5としてエッチング
処理を施さずに12μm厚の外層銅箔をそのまま用いた
場合についても試験した。20本全てについてファイン
パターンが形成できた場合を◎、それより少ない場合を
×とし( )内に良品率を示した。結果を表2に示し
た。Example 6, Comparative Examples 4 and 5 The ability to form a fine pattern was evaluated. A four-layer laminate on which a 12-μm-thick copper foil is mounted is prepared by adding 2% by weight of hydrogen peroxide and 7% of sulfuric acid.
Using an etching solution comprising an aqueous solution containing 0.2% by weight of aminotetrazole and 0.2% by weight of phenylurea, removal of protruding copper and burr copper and etching of the outer layer copper foil by 7 μm by spray etching at 35 ° C. And thinned. Next, a copper pattern having a desired line and space (L (μm) / S (μm)) was formed on the outer layer copper foil portion, and a 15 μm copper plating was applied thereon to form a fine pattern. Various L (μm) / S (μ
20) Fine patterns each composed of m) were prepared, and whether or not lines were formed was determined by observation with an optical microscope and measurement of line conductivity. For comparison, Comparative Example 4 was treated with an etching solution containing propanol as an additive (2% by weight of hydrogen peroxide, 7% by weight of sulfuric acid and 2% by weight of propanol), and Comparative Example 5 was 12 μm without etching. The test was also performed when the thick outer copper foil was used as it was. The case where fine patterns were formed for all of the 20 samples was evaluated as ◎, and the case where the fine pattern was less than that was evaluated as ×, and the percentage of non-defective products is shown in parentheses. The results are shown in Table 2.
【0015】[0015]
【表2】 [Table 2]
【0016】実施例7、比較例6,7 接続信頼性を評価した。図2に示すように1000ホー
ル連続チエーンパターンを作製し試験した。すなわち、
内層に18μm厚の銅箔に1000ホール連続チエーン
パターン作製用のパターンを持った銅箔を、また外層に
12μm厚の銅箔を実装した4層積層板を用意した。次
に、レーザーシート(三菱瓦斯化学社製)を用いて外層
銅箔を炭酸ガスレーザーで加工する方法により、内層銅
のパターン部に合わせてブラインドビアホールを100
0孔あけた。その後、過酸化水素2重量%、硫酸7重量
%、アミノテトラゾール0.2重量%およびフェニル尿
素0.2重量%を含む水溶液からなるエッチング液を用
いて、35℃でスプレーエッチングにより、突出銅やバ
リ銅の除去および外層銅箔を7μmエッチング除去して
薄銅化を施した。次にデスミヤ処理により孔内部のスミ
ヤを除去した後、孔部および外層銅箔部に銅めっきを施
した。その後、外層銅箔にライン・アンド・スペース70
μmのパターンを作り、外層と内層の銅パターンが連続
的に接続してなる1000ホール連続チエーンパターン
を作製した。こうして作製した1000ホール連続チエ
ーンパターン付き積層板について、−55℃で30分保
持した後125℃で30分保持する操作を1000サイ
クル繰り返し、導通抵抗値を測定した。抵抗値の変化率
が±10%未満か否かにより接続信頼性を評価した。比
較のために比較例6として添加剤としてプロパノールを
含むエッチング液(過酸化水素2重量%、硫酸7重量%
およびプロパノール2重量%)で処理した場合および比
較例7としてエッチング処理を施さずに12μm厚の外
層銅箔をそのまま用いた場合についても試験した。抵抗
値の変化率が±10%未満であった場合を◎、それ以上
であった場合を×で示した。結果を表3に示した。Example 7, Comparative Examples 6 and 7 The connection reliability was evaluated. As shown in FIG. 2, a continuous 1000-hole chain pattern was prepared and tested. That is,
A copper foil having a pattern for producing a continuous 1000-hole chain pattern on a copper foil having a thickness of 18 μm on the inner layer and a four-layer laminate having a copper foil having a thickness of 12 μm on the outer layer were prepared. Next, by using a laser sheet (manufactured by Mitsubishi Gas Chemical Company) to process the outer layer copper foil with a carbon dioxide gas laser, a blind via hole was formed in accordance with the pattern portion of the inner layer copper.
0 holes were drilled. Then, using an etching solution comprising an aqueous solution containing 2% by weight of hydrogen peroxide, 7% by weight of sulfuric acid, 0.2% by weight of aminotetrazole and 0.2% by weight of phenylurea, spray-etching is performed at 35 ° C. on the protruding copper or Removal of burr copper and etching removal of the outer layer copper foil by 7 μm were performed to reduce the thickness of copper. Next, after the smear inside the hole was removed by desmear treatment, the hole and the outer layer copper foil were plated with copper. After that, line and space 70 is applied to the outer copper foil.
A 1000-hole continuous chain pattern in which an outer layer and an inner layer copper pattern were continuously connected was prepared. With respect to the thus-prepared laminate having a continuous 1000-hole chain pattern, the operation of holding at −55 ° C. for 30 minutes and then holding at 125 ° C. for 30 minutes was repeated 1000 cycles, and the conduction resistance was measured. The connection reliability was evaluated based on whether or not the rate of change of the resistance value was less than ± 10%. For comparison, as Comparative Example 6, an etching solution containing propanol as an additive (2% by weight of hydrogen peroxide, 7% by weight of sulfuric acid)
And 2% by weight of propanol) and Comparative Example 7 in which the outer layer copper foil having a thickness of 12 μm was used without etching. The case where the rate of change of the resistance value was less than ± 10% was indicated by ◎, and the case where the rate of change was more than ± 10%. The results are shown in Table 3.
【0017】[0017]
【表3】 [Table 3]
【0018】実施例8 銅箔の光沢面に炭酸ガスレーザーのエネルギー吸収効率
が良い表面処理を施された銅箔を外層銅箔として用いて
4層積層板を作製し、その表面処理面に、炭酸ガスレー
ザーを照射して孔をあけたプリント基板、および炭酸ガ
スレーザを用いたコンホーマルマスク法により孔あけし
たプリント基板につて評価した。先ず、実施例8とし
て、銅箔の光沢面に炭酸ガスレーザーのエネルギー吸収
効率が良い表面処理を施された銅箔を外層銅箔として用
いた4層積層板に、炭酸ガスレーザを照射して孔をあけ
たプリント基板について、上記実施例6で使用したエッ
チング液で同様に処理し、次にライン・アンド・スペー
ス30μmのファインパターンおよび1000ホール連
続チエーンパターンをそれぞれ作製し、ファインパター
ンの形成能および接続信頼性を評価した。ファインパタ
ーンの形成能および接続信頼性の試験結果の表示法は上
記の表2,3と同様に行った。結果を表4に示した。Example 8 A four-layer laminate was prepared by using, as an outer copper foil, a copper foil having a glossy surface of a copper foil subjected to a surface treatment having good energy absorption efficiency of a carbon dioxide laser as an outer copper foil. A printed circuit board with holes formed by irradiation with a carbon dioxide laser and a printed circuit board with holes formed by a conformal mask method using a carbon dioxide laser were evaluated. First, as Example 8, a four-layer laminate using a copper foil having a glossy surface of a copper foil having a surface treatment having good energy absorption efficiency of a carbon dioxide laser as an outer copper foil was irradiated with a carbon dioxide laser to form a hole. The printed circuit board having the opening was treated in the same manner with the etching solution used in Example 6 above, and then a fine pattern having a line and space of 30 μm and a continuous 1000-hole chain pattern were prepared. The connection reliability was evaluated. The method of displaying the test results of the ability to form a fine pattern and the connection reliability was performed in the same manner as in Tables 2 and 3 above. The results are shown in Table 4.
【0019】実施例9、比較例8,9,10 図3にコンホーマルマスク法による工程を示したが、図
3aに示したように、内層として、1000ホール連続
チエーンパターン作製用のパターンを持った18μm厚
の銅箔を持ち、予め化学エッチング法等により外層銅箔
に孔あけした4層積層板を用意した。次に、外層銅箔の
孔部を介して炭酸ガスレーザを照射して内層銅パターン
までの樹脂層を除去した(図3b)。図3aに示した4
層積層板に、過剰の照射数で炭酸ガスレーザー加工を行
い、大部分のスミヤを除去した(図3c)。しかしなが
ら、この炭酸ガスレーザの過剰の照射により外層銅箔の
周辺部に突出銅が生成した。この4層積層板について上
記の実施例6で使用したエッチング液で同様に処理し、
次にライン・アンド・スペース30μmのファインパタ
ーンおよび1000ホール連続チエーンパターンをそれ
ぞれ作製し、ファインパターンの形成能および接続信頼
性を評価した。比較のために比較例8として、光沢面に
炭酸ガスレーザーのエネルギー吸収効率が良い表面処理
を施された銅箔を、炭酸ガスレーザ法で孔あけしたブラ
インドバイアホールについて、添加剤としてプロパノー
ルを含むエッチング液(過酸化水素2重量%、硫酸7重
量%およびプロパノール2重量%)で処理した場合につ
いて試験した。比較例9は4層積層板(図3c)につい
て、添加剤としてプロパノールを含むエッチング液(過
酸化水素2重量%、硫酸7重量%およびプロパノール2
重量%)で処理した場合について試験した。また比較例
10として、図3bで示されるブラインドビアホールを形
成した4層積層板について実施例6と同じエッチング液
で同様に処理し、次にファインパターンの形成能および
接続信頼性を評価した。ファインパターンの形成能およ
び接続信頼性(1000サイクル)の試験結果の表示法
は上記の表2,3と同様に行った。結果を表4に示し
た。Example 9 and Comparative Examples 8, 9, and 10 FIG. 3 shows a process by a conformal mask method. As shown in FIG. 3A, a pattern for producing a 1000-hole continuous chain pattern is used as an inner layer. A four-layer laminate having the 18 μm-thick copper foil and having holes formed in the outer copper foil in advance by a chemical etching method or the like was prepared. Next, the resin layer up to the inner layer copper pattern was removed by irradiating a carbon dioxide gas laser through the hole of the outer layer copper foil (FIG. 3B). 4 shown in FIG.
The layered laminate was subjected to carbon dioxide laser processing with an excessive number of irradiations to remove most of the smear (FIG. 3c). However, protruding copper was generated in the peripheral portion of the outer layer copper foil due to the excessive irradiation of the carbon dioxide gas laser. This four-layer laminate was similarly treated with the etching solution used in Example 6 above,
Next, a 30 μm line-and-space fine pattern and a 1000-hole continuous chain pattern were prepared, and the ability to form the fine pattern and the connection reliability were evaluated. As a comparative example 8 for comparison, a copper foil having a glossy surface subjected to a surface treatment having good energy absorption efficiency of a carbon dioxide laser and a blind via hole formed by a carbon dioxide laser method was etched with propanol as an additive. The test was carried out with a liquid (2% by weight of hydrogen peroxide, 7% by weight of sulfuric acid and 2% by weight of propanol). Comparative Example 9 shows an etching solution containing propanol as an additive (2% by weight of hydrogen peroxide, 7% by weight of sulfuric acid, and 2% by weight of propanol 2) for a four-layer laminate (FIG. 3C).
% By weight). Comparative example
As No. 10, the four-layer laminate having the blind via holes shown in FIG. 3B was treated in the same manner with the same etchant as in Example 6, and then the fine pattern formation ability and connection reliability were evaluated. The method of displaying the test results of the fine pattern forming ability and connection reliability (1000 cycles) was the same as in Tables 2 and 3 above. The results are shown in Table 4.
【0020】[0020]
【表4】 [Table 4]
【0021】[0021]
【発明の効果】炭酸ガスレーザによって作成された非貫
通孔において、従来困難であった孔周辺の外層銅箔部に
生成した突出銅やバリ銅を、本発明のエッチング液を使
用することによって容易に除去することが可能となり、
導通特性を格段に向上させることが可能となった。According to the present invention, in the non-through hole made by the carbon dioxide laser, the protruding copper or burr copper generated in the outer layer copper foil portion around the hole, which has been conventionally difficult, can be easily removed by using the etching solution of the present invention. Can be removed,
It has become possible to significantly improve the conduction characteristics.
【図1】本発明の一実施形態の銅張板の非貫通孔の孔周
辺の外層銅箔部に生成した突出銅やバリ銅を効率的にエ
ッチング除去すると同時に、表面の銅箔の一部をもエッ
チングして薄銅化する工程を示す図であり、a:多層銅
張板作製、b:孔あけ、c:孔周辺の表面銅箔部に生成
した突出銅やバリ銅の除去および外層銅箔の厚さ方向の
一部エッチング、d:銅めっきにより小径孔を介して外
層銅箔と内層銅箔の導通をとる、各工程を示す。FIG. 1 is a diagram showing an embodiment of the present invention in which a copper-clad board according to an embodiment of the present invention efficiently removes protruding copper and burr copper generated in an outer layer copper foil portion around a non-through hole, and at the same time, a part of a surface copper foil. FIG. 3 is a view showing a step of thinning copper by etching also, a: preparation of a multilayer copper-clad board, b: drilling, c: removal of protruding copper and burr copper generated on the surface copper foil portion around the hole and outer layer. Each step of partial etching in the thickness direction of the copper foil and d: conducting the conduction between the outer copper foil and the inner copper foil through the small-diameter hole by copper plating are shown.
【図2】1000ホール連続チェーンパターンの接続を
示す断面図である。FIG. 2 is a sectional view showing connection of a 1000-hole continuous chain pattern.
【図3】コンホーマルマスク法による孔あけの工程を示
す断面図であり、a:外層銅箔に予めエッチング法で孔
をあけた4層積層板、b:レーザー照射による孔あけ、
c:レーザー過剰照射による孔あけの各工程を示す。FIG. 3 is a cross-sectional view showing a step of forming a hole by a conformal mask method, wherein a: a four-layer laminate in which holes are formed in an outer copper foil in advance by an etching method, b: a hole formed by laser irradiation;
c: Each step of drilling by excessive laser irradiation is shown.
1 外層銅箔 1a 薄膜化外層銅箔 2 内層銅箔 3 非貫通孔 3’ 化学エッチングによりあけた孔 4 突出銅、バリ銅 5 絶縁樹脂層 6 本発明のエッチング液 7 銅 8 スミア L レーザー照射 Reference Signs List 1 outer layer copper foil 1a thinner outer layer copper foil 2 inner layer copper foil 3 non-through hole 3 'hole drilled by chemical etching 4 protruding copper, burr copper 5 insulating resin layer 6 etching solution of the present invention 7 copper 8 smear L laser irradiation
フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H05K 3/42 610 H05K 3/42 610A (72)発明者 外赤 隆二 茨城県つくば市和台22番地 三菱瓦斯化学 株式会社総合研究所内 (72)発明者 石原 福三郎 東京都千代田区岩本町1丁目2番18号 菱 江化学株式会社内 (72)発明者 川村 利光 東京都千代田区岩本町1丁目2番18号 菱 江化学株式会社内 Fターム(参考) 4K057 WA11 WB04 WE03 WE25 WF01 WN01 5E317 AA24 BB01 BB12 CC53 CD01 CD32 GG11 5E343 AA07 BB24 BB67 DD76 EE02 EE13 GG13 5E346 AA43 CC32 CC58 DD12 FF03 GG15 GG22 Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat II (Reference) H05K 3/42 610 H05K 3/42 610A (72) Inventor Ryuji Soga Red 22 Wadai, Tsukuba, Ibaraki Pref. Mitsubishi Gas Chemical Co., Ltd. (72) Inventor Fukusaburo Ishihara 1-2-18, Iwamotocho, Chiyoda-ku, Tokyo Ryoko Chemical Co., Ltd. (72) Inventor Toshimitsu Kawamura 1-2-18, Iwamotocho, Chiyoda-ku, Tokyo Ryuji 4K057 WA11 WB04 WE03 WE25 WF01 WN01 5E317 AA24 BB01 BB12 CC53 CD01 CD32 GG11 5E343 AA07 BB24 BB67 DD76 EE02 EE13 GG13 5E346 AA43 CC32 CC58 DD12 FF03 GG15 GG22
Claims (3)
多層銅張板を製造する方法において、多層銅張板に非貫
通孔をあけ、次いで該孔周辺部に張り出した銅を、過酸
化水素0.5〜10重量%、硫酸1〜15重量%、テト
ラゾ−ルおよびテトラゾール誘導体のうちの少なくとも
一種が0.001〜1重量%、並びに必要に応じてフェ
ニル尿素0.005〜0.5重量%を含有する水溶液を
用いて除去することを特徴とする多層銅張板の製造方
法。1. A method for producing a multilayer copper-clad board having two or more copper layers and a non-through hole, comprising the steps of: forming a non-through hole in the multilayer copper-clad board; 0.5 to 10% by weight of hydrogen peroxide, 1 to 15% by weight of sulfuric acid, 0.001 to 1% by weight of at least one of tetrazole and tetrazole derivatives, and 0.005 to 0% of phenylurea as required. A method for producing a multilayer copper-clad board, comprising removing using an aqueous solution containing 0.5% by weight.
体が1H-テトラゾール、5−アミノー1H-テトラゾー
ル、5−アミノ−1−メチルテトラゾール、1−メチル
テトラゾール、2−メチルテトラゾール、5−メチル−
1H-テトラゾール、1−フェニルテトラゾール、5−フ
ェニル−1H−テトラゾールである請求項1記載の多層
銅張板の製造方法。2. The method of claim 1, wherein the tetrazole and the tetrazole derivative are 1H-tetrazole, 5-amino-1H-tetrazole, 5-amino-1-methyltetrazole, 1-methyltetrazole, 2-methyltetrazole, 5-methyl-
The method for producing a multilayer copper-clad board according to claim 1, which is 1H-tetrazole, 1-phenyltetrazole, or 5-phenyl-1H-tetrazole.
れたものである請求項1記載の多層銅張板の製造方法。3. The method for producing a multilayer copper-clad board according to claim 1, wherein said non-through holes are formed by a carbon dioxide gas laser.
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Cited By (3)
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---|---|---|---|---|
JP2009076844A (en) * | 2007-08-28 | 2009-04-09 | Mec Kk | Manufacturing method of printed wiring board |
WO2013015322A1 (en) * | 2011-07-26 | 2013-01-31 | 三菱瓦斯化学株式会社 | Etchant for copper/molybdenum-based multilayer thin film |
CN108624884A (en) * | 2017-03-17 | 2018-10-09 | 昆山市板明电子科技有限公司 | The PCB surface conditioning agents and surface treatment method for removing brown layer and the outstanding copper of blind hole |
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JPH0222887A (en) * | 1988-07-12 | 1990-01-25 | Mitsubishi Gas Chem Co Inc | Manufacture of thin copper foil clad circuit board |
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JPH11346059A (en) * | 1998-06-02 | 1999-12-14 | Mitsubishi Gas Chem Co Inc | Printed circuit board with reliable via hole |
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JPH01292890A (en) * | 1988-05-20 | 1989-11-27 | Mitsubishi Gas Chem Co Inc | Manufacture of thin-copper-clad circuit substrate |
JPH0222887A (en) * | 1988-07-12 | 1990-01-25 | Mitsubishi Gas Chem Co Inc | Manufacture of thin copper foil clad circuit board |
JPH1129883A (en) * | 1997-07-08 | 1999-02-02 | Mec Kk | Microetching agent for copper and copper alloy |
JPH11346059A (en) * | 1998-06-02 | 1999-12-14 | Mitsubishi Gas Chem Co Inc | Printed circuit board with reliable via hole |
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JP2009076844A (en) * | 2007-08-28 | 2009-04-09 | Mec Kk | Manufacturing method of printed wiring board |
WO2013015322A1 (en) * | 2011-07-26 | 2013-01-31 | 三菱瓦斯化学株式会社 | Etchant for copper/molybdenum-based multilayer thin film |
US9365770B2 (en) | 2011-07-26 | 2016-06-14 | Mitsubishi Gas Chemical Company, Inc. | Etching solution for copper/molybdenum-based multilayer thin film |
CN108624884A (en) * | 2017-03-17 | 2018-10-09 | 昆山市板明电子科技有限公司 | The PCB surface conditioning agents and surface treatment method for removing brown layer and the outstanding copper of blind hole |
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