JP2003258182A - Method for roughening metal foil and roughened metal foil - Google Patents

Method for roughening metal foil and roughened metal foil

Info

Publication number
JP2003258182A
JP2003258182A JP2002052973A JP2002052973A JP2003258182A JP 2003258182 A JP2003258182 A JP 2003258182A JP 2002052973 A JP2002052973 A JP 2002052973A JP 2002052973 A JP2002052973 A JP 2002052973A JP 2003258182 A JP2003258182 A JP 2003258182A
Authority
JP
Japan
Prior art keywords
metal foil
foil
treatment
copper
roughening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002052973A
Other languages
Japanese (ja)
Inventor
Kiyotaka Nakaya
清隆 中矢
Masahiko Yamada
雅彦 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Denkai Co Ltd
Original Assignee
Nippon Denkai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Denkai Co Ltd filed Critical Nippon Denkai Co Ltd
Priority to JP2002052973A priority Critical patent/JP2003258182A/en
Publication of JP2003258182A publication Critical patent/JP2003258182A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

<P>PROBLEM TO BE SOLVED: To provide a roughening method for performing a stable processing in thin foil of not larger than 10 μm, copper foil and copper alloy foil of not smaller than 100 μm and 42 alloy used for a lead frame. <P>SOLUTION: In the roughening method of metal foil, metal foil is irradiated with a laser beam to unevenness of 0.5 to 10 μm, whose surface roughness is 10 point average roughness, is formed. The roughened metal foil is obtained by the roughening method mentioned. A rust prevention layer is disposed on the surface of metal foil and has a coupling agent processing layer on the surface. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、表面粗さが10点平均
粗さで0.5から10μmの凹凸を形成することを特徴
とする金属箔の粗化方法と、該方法により製造された粗
化金属箔に関する。
FIELD OF THE INVENTION The present invention relates to a method for roughening a metal foil, which is characterized by forming irregularities having a surface roughness of 10 to 10 μm in average roughness of 0.5 to 10 μm and a method for producing the same. It relates to a roughened metal foil.

【0002】[0002]

【従来の技術】電子工業で広汎に使用される金属箔と樹
脂との複合体においては、信頼性を確保するために界面
における接着強度がきわめて重要である。たとえば、プ
リント配線板に用いられる銅箔では、微細な銅配線が基
材樹脂から脱落することを防止するために、粗化粒子と
称される微細な銅粒子を銅箔表面に形成して銅箔と基材
樹脂間の接着力を向上させている。粗化粒子の形成は、
通常、硫酸銅水溶液に銅箔を浸漬し、電気分解により銅
を析出させることで行われる。半導体パッケージにおい
ては、リードフレームと封止剤樹脂との界面から外気が
進入して半導体素子が劣化することを防止するため、リ
ードフレーム表面を粗化することが行われている。リー
ドフレームとしてはニッケルと鉄の合金である42アロ
イのほか、近年では各種の圧延銅合金も使用されてい
る。粗化はエッチングにより行われるのが一般である
が、各種の金属粒子を形成することも試みられている。
2. Description of the Related Art In a composite of a metal foil and a resin widely used in the electronic industry, the adhesive strength at the interface is extremely important for ensuring reliability. For example, in a copper foil used for a printed wiring board, in order to prevent the fine copper wiring from falling off the base resin, fine copper particles called roughening particles are formed on the copper foil surface to form a copper foil. It improves the adhesion between the foil and the base resin. The formation of roughened particles is
Usually, it is carried out by immersing a copper foil in an aqueous solution of copper sulfate and depositing copper by electrolysis. In a semiconductor package, the surface of the lead frame is roughened in order to prevent external air from entering the interface between the lead frame and the sealant resin and deteriorating the semiconductor element. As the lead frame, in addition to 42 alloy which is an alloy of nickel and iron, various rolled copper alloys have been used in recent years. Roughening is generally performed by etching, but attempts have also been made to form various metal particles.

【0003】[0003]

【発明が解決しようとする課題】従来の硫酸銅水溶液を
用いた粗化方法では、所定の粗化形状を実現するために
は複雑な多段階の処理を行なう必要があり、厚さが10
μm以下の銅箔ではシワが発生しやすいなどの問題があ
る。また、粗化粒子は比較的大きく、高さも不同である
ため、基材樹脂に入り込んだ粗化粒子をエッチングで完
全に除去することが困難であるなどの問題がある。一
方、電力制御や放熱性を重視した用途に用いるプリント
配線板においては厚さが100μm以上の銅箔や銅合金
箔が使用されるが、弾性が大きいため、処理槽内を安定
して通過させることが困難な問題がある。また、リード
フレームにおいても同様に処理槽内を安定して通過さ
せ、所定の処理を行なうことは難しい。
In the conventional roughening method using an aqueous solution of copper sulfate, it is necessary to perform complicated multi-step treatments in order to achieve a predetermined roughened shape, and the thickness is 10 or less.
The copper foil having a thickness of less than μm has a problem that wrinkles are likely to occur. Further, since the roughened particles are relatively large and have different heights, it is difficult to completely remove the roughened particles that have entered the base resin by etching. On the other hand, in a printed wiring board used for power control or heat dissipation, a copper foil or a copper alloy foil having a thickness of 100 μm or more is used. There is a difficult problem. Similarly, it is difficult for the lead frame to stably pass through the treatment tank and perform a predetermined treatment.

【0004】すなわち、本発明は10μm以下の薄箔や
100μm以上の銅箔や銅合金箔、ならびにリードフレ
ームに用いられる42アロイにおいても、安定した処理
を行う粗化方法を提供するものである。また、本発明
は、該粗化方法により製造された金属箔を提供するもの
である。
That is, the present invention provides a roughening method for performing stable treatment even on thin foils of 10 μm or less, copper foils and copper alloy foils of 100 μm or more, and 42 alloy used for lead frames. The present invention also provides a metal foil produced by the roughening method.

【0005】[0005]

【課題を解決するための手段】本発明は、金属箔にレー
ザー光を照射して、表面粗さが10点平均粗さで0.5
から10μmの凹凸を形成することを特徴とする金属箔
の粗化方法である。さらに、本発明は上述した粗化方法
により粗化した金属箔である。
According to the present invention, a metal foil is irradiated with laser light so that the surface roughness is 0.5 at a 10-point average roughness.
To 10 μm of unevenness are formed. Furthermore, the present invention is a metal foil roughened by the above-mentioned roughening method.

【0006】[0006]

【発明の実施の形態】本発明の粗化処理に使用されるレ
ーザー光としてはCO2レーザーやYAGレーザーが用
いられる。粗化処理は、金属箔にレーザーを照射するこ
とで局部的に加熱し金属を蒸発させることで凹部が形成
される。照射を連続的に行うことで、金属箔の全面また
は必要な部分に粗化を行うことができる。レーザー照射
のパターンとしては、線状に走査する方法、千鳥状に走
査する方法、格子状あるいはランダムに走査する方法の
いずれも使用できるが、所望の粗化形状に応じて適宜選
択することが好ましい。表面粗さは10点平均粗さで
0.5〜10μmである。0.5μm以下の場合では密
着に対する効果が十分に発揮されない場合があり、また
10μm以上では粗さが増大するのみで効果に差が見ら
れず経済的でない。なお、当然のことながら銅箔の厚さ
が10μm未満の場合には、表面粗さが10μm以上と
なることはありえず、最大で厚さの1/3以下である。
BEST MODE FOR CARRYING OUT THE INVENTION As a laser beam used in the roughening treatment of the present invention, a CO2 laser or a YAG laser is used. In the roughening treatment, the metal foil is irradiated with a laser to locally heat the metal foil to evaporate the metal, thereby forming a recess. By continuously irradiating, it is possible to roughen the entire surface of the metal foil or a necessary portion. As the laser irradiation pattern, any of a linear scanning method, a staggered scanning method, a lattice scanning method and a random scanning method can be used, but it is preferable to appropriately select according to a desired roughened shape. . The surface roughness is 10-point average roughness of 0.5 to 10 μm. If it is less than 0.5 μm, the effect on adhesion may not be fully exerted, and
If it is 10 μm or more, the roughness is increased and the effect is not different, which is not economical. In addition, as a matter of course, when the thickness of the copper foil is less than 10 μm, the surface roughness cannot be 10 μm or more and is 1/3 or less of the maximum thickness.

【0007】本発明において用いられる金属箔は、電解
銅箔、圧延銅箔、圧延銅合金箔、亜鉛箔、ニッケル箔、
42アロイなどのニッケル合金箔に代表されるが、特に
限定するものではない。金属箔の厚みについても、プリ
ント回路及びヒートスプレッター、リードフレーム等の
樹脂との接合を要する金属箔として用いられる厚みのも
のであれば、特に制限はない。
The metal foil used in the present invention includes electrolytic copper foil, rolled copper foil, rolled copper alloy foil, zinc foil, nickel foil,
Although it is represented by a nickel alloy foil such as 42 alloy, it is not particularly limited. The thickness of the metal foil is not particularly limited as long as it has a thickness used as a metal foil that needs to be joined to a resin such as a printed circuit, a heat spreader, and a lead frame.

【0008】レーザー光照射後の表面に飛散した遊離の
飛沫など好ましくない粒子状物などを除去するために、
表面に対して粘着テープなどで表面を清掃することがで
きる。また、必要に応じて軽度のバフ研磨を行うことも
できる。また、粘着テープを用いずに真空吸着や水洗な
どの方法を用いることができる。さらには、エッチング
処理を行ってもよい。エッチング処理を行なうことによ
り、レーザー光により形成された粗化形状をさらに好ま
しいものとすることができる。すなわち、溶融した銅の
飛散による好ましくない粒状金属粒子や急峻なエッジ部
などを除去することができる。これらの粒状金属粒子や
急峻なエッジ部は、たとえばエッチング残として回路形
成の障害になったり、絶縁破壊の原因となる。エッチン
グには各種のエッチング液が用いられ、たとえば塩化第
二鉄水溶液や塩化第二銅水溶液、また、過酸化水素など
の酸化剤を含有する硫酸、塩酸などを用いることができ
る。
In order to remove undesired particulate matters such as free splashes scattered on the surface after laser light irradiation,
The surface can be cleaned with adhesive tape or the like. In addition, light buffing can be performed if necessary. Further, a method such as vacuum adsorption or washing with water can be used without using an adhesive tape. Furthermore, you may perform an etching process. By performing the etching process, the roughened shape formed by the laser beam can be made more preferable. That is, it is possible to remove undesired granular metal particles and sharp edges due to the scattering of molten copper. These granular metal particles and steep edge portions, for example, cause etching failure as an obstacle to circuit formation or cause dielectric breakdown. Various etching solutions are used for etching, and for example, ferric chloride aqueous solution, cupric chloride aqueous solution, and sulfuric acid or hydrochloric acid containing an oxidizing agent such as hydrogen peroxide can be used.

【0009】本発明の製造方法を実施するにあたって
は、例えば、所定の厚さと幅を有するコイル状に巻き取
られた金属箔を、レーザー処理装置内を定速走行させ、
連続的に巻き取って製造することが好ましい。また、こ
の際に必要があれば脱脂処理、酸洗浄処理、他の粗面化
処理、防錆処理、カップリング剤処理槽及び乾燥装置を
設けることができる。このとき、コイル状にすることが
困難な金属箔の場合は所定の厚さと幅及び長さをもつパ
ネル状の金属箔をコンベア等の搬送設備を用いて上記処
理を行なうこともできる。脱脂処理、酸洗処理、防錆処
理、カップリング剤処理はいずれも公知の方法を適宜選
択して使用する。脱脂処理としては各種の界面活性剤を
含む脱脂液中で電解処理することにより行うことができ
る。酸洗処理としては塩酸や硫酸の水溶液を用いて行う
ことができる。防錆処理としては、重クロム酸を含有す
る処理浴に浸漬し、必要に応じて電解処理することで行
うことができる。また、亜鉛などの各種金属を含有させ
てもよい。カップリング剤処理は、各種のシランカップ
リング剤を含有する水溶液を噴霧または塗工することに
より行うことができる。
In carrying out the manufacturing method of the present invention, for example, a metal foil wound into a coil having a predetermined thickness and width is run at a constant speed in a laser processing apparatus,
It is preferable to continuously wind and manufacture. If necessary, a degreasing treatment, an acid washing treatment, another surface roughening treatment, an anticorrosion treatment, a coupling agent treatment tank and a drying device can be provided at this time. At this time, in the case of a metal foil which is difficult to be coiled, a panel-shaped metal foil having a predetermined thickness, width and length can be subjected to the above treatment by using a transport facility such as a conveyor. For the degreasing treatment, pickling treatment, rustproofing treatment and coupling agent treatment, known methods are appropriately selected and used. The degreasing treatment can be carried out by electrolytic treatment in a degreasing liquid containing various surfactants. The pickling treatment can be performed using an aqueous solution of hydrochloric acid or sulfuric acid. The anticorrosion treatment can be carried out by immersing in a treatment bath containing dichromic acid and, if necessary, performing electrolytic treatment. Further, various metals such as zinc may be contained. The coupling agent treatment can be carried out by spraying or coating an aqueous solution containing various silane coupling agents.

【0010】[0010]

【実施例】以下、本発明を実施例に基づいて詳細に説明
するが、本発明はこれに限定されるものではない。 (実施例1)金属箔として電解銅箔(厚さ15μm、1
0点平均粗さ0.3)を用い、銅箔の光沢面側にYAG
レーザーを用い表面に微細な凹凸を形成した。レーザー
処理後、銅箔表面を1Nの塩酸で洗浄し、この銅箔を十
分水洗した後、重クロム酸ナトリウム3.5g/l水溶
液をpH5.7、温度26℃に調整した液に浸漬し、電
流密度0.5A/dm2、電解時間5秒で陰極電解する
ことにより、クロメート処理層を形成した。この銅箔を
十分水洗した後、温度100℃に保持した乾燥器中で5
分間乾燥させ、本発明の銅箔を製造した。得られた銅箔
の表面粗さを、JIS B 0601,JIS B 0
651に基づいて測定したところ、10点平均粗さで
3.0μmであった。
EXAMPLES The present invention will now be described in detail based on examples, but the present invention is not limited thereto. (Example 1) Electrolytic copper foil (thickness 15 μm, 1
YAG is applied to the shiny side of the copper foil using 0 point average roughness 0.3).
Fine irregularities were formed on the surface using a laser. After the laser treatment, the surface of the copper foil was washed with 1N hydrochloric acid, the copper foil was thoroughly washed with water, and then a 3.5 g / l aqueous solution of sodium dichromate was immersed in a solution adjusted to pH 5.7 and a temperature of 26 ° C., A chromate-treated layer was formed by performing cathodic electrolysis at a current density of 0.5 A / dm2 and an electrolysis time of 5 seconds. After sufficiently washing this copper foil with water, the copper foil was kept in a dryer kept at 100 ° C for 5
After being dried for a minute, the copper foil of the present invention was manufactured. The surface roughness of the obtained copper foil was measured according to JIS B 0601, JIS B 0
When measured based on 651, the 10-point average roughness was 3.0 μm.

【0011】次に、下記の特性試験を行うため、上記の
銅箔をFR−4グレードのガラス布基材エボキシ樹脂プ
リプレグに粗面を基材面に接して積層し、温度168
℃、圧力80kg/cm2、時間60分の条件下で加熱
加圧処理し、縦250mm、横250mm、厚さ1.6
mmの銅張積層板を作製し、試験片とした。引きはがし
強さは、JIS C 6481に準拠した条件で測定し
た。但し、引きはがし幅は1mmとした。また、粉落ち
は、銅箔を塩化第二銅エッチング液により全面除去し、
倍率100倍のルーペを用い2mmφ中の銅粒子の個数
を測定して粉落ちの個数とした。特性試験の結果を表1
に示した。
Next, in order to perform the following characteristic test, the above copper foil was laminated on an FR-4 grade glass cloth base material epoxy resin prepreg with the rough surface in contact with the base material surface, and the temperature was adjusted to 168.
Heat and pressure treatment under conditions of ℃, pressure 80kg / cm2, time 60 minutes, length 250mm, width 250mm, thickness 1.6
A copper clad laminate having a size of mm was prepared and used as a test piece. The peeling strength was measured under the conditions based on JIS C 6481. However, the peeling width was 1 mm. Also, for powder removal, the copper foil is entirely removed with a cupric chloride etching solution,
The number of copper particles in 2 mmφ was measured using a magnifying glass with a magnification of 100 to determine the number of powder drops. Table 1 shows the results of the characteristic tests.
It was shown to.

【0012】(実施例2)表面粗さを5.0μmとした
他は、実施例1と同様にして評価を行なった。結果を表
1に示した。
(Example 2) Evaluation was performed in the same manner as in Example 1 except that the surface roughness was set to 5.0 μm. The results are shown in Table 1.

【0013】(実施例3)表面粗さを0.5μmとした
他は、実施例1と同様にして評価を行なった。結果を表
1に示した。
(Example 3) Evaluation was performed in the same manner as in Example 1 except that the surface roughness was set to 0.5 μm. The results are shown in Table 1.

【0014】(実施例4)実施例1と同様に粗化処理を
行ない、クロメート処理層を形成した銅箔に、3−グリ
シドキシプロピルトリメトキシシラン0.1重量%水溶
液を常温でスプレーにより塗布し、直ちに温度100℃
に保持した乾燥器中で5分間乾燥させた。得られた銅箔
を試験片とし、実施例1と同様に特性試験を実施し、そ
の結果を表1に示した。
(Example 4) A roughening treatment was performed in the same manner as in Example 1, and a 0.1% by weight aqueous solution of 3-glycidoxypropyltrimethoxysilane was sprayed onto a copper foil having a chromate treatment layer formed thereon at room temperature. Immediately after application, temperature 100 ° C
It was dried for 5 minutes in the drier kept at. Using the obtained copper foil as a test piece, a characteristic test was conducted in the same manner as in Example 1, and the results are shown in Table 1.

【0015】(比較例1)レーザー光による粗化処理を
行なわない銅箔を用いて銅張積層板とし、特性を評価し
た。結果を表1に示した。
(Comparative Example 1) A copper-clad laminate was prepared by using a copper foil which was not roughened by laser light, and its characteristics were evaluated. The results are shown in Table 1.

【0016】(比較例2)シランカップリング剤処理を
行った他は、比較例1と同様にして特性を評価した。結
果を表1に示した。
Comparative Example 2 The characteristics were evaluated in the same manner as in Comparative Example 1 except that the silane coupling agent treatment was performed. The results are shown in Table 1.

【0017】[0017]

【表1】 [Table 1]

【0018】表1から明らかなように、本発明の粗化処
理を行なった銅箔は基材との接着力にすぐれ、極めて有
用である。
As is clear from Table 1, the copper foil subjected to the roughening treatment of the present invention has excellent adhesion to the substrate and is extremely useful.

【0019】[0019]

【発明の効果】以上のとおり、金属箔にレーザー光を照
射して、表面粗さが10点平均粗さで0.5から10μ
mの凹凸を形成した金属箔は、樹脂との接着性に優れ、
粉落ちがなく、実用上極めて有用である。
As described above, the metal foil is irradiated with laser light so that the surface roughness is 10 points and the average roughness is 0.5 to 10 μm.
The metal foil formed with the unevenness of m has excellent adhesiveness with the resin,
There is no powder drop and it is extremely useful in practice.

【0020】また、本発明では粗化処理において従来必
要とされた硫酸銅水溶液などの粗化処理液、化成処理液
及びエッチング処理液を用いないことから廃水処理の必
要がなく、管理上極めて容易でまた環境に対する影響が
少ない利点を備えており、工業規模での量産性に優れそ
の価値は大きい。
Further, in the present invention, since a roughening treatment liquid such as an aqueous solution of copper sulfate, a chemical conversion treatment liquid and an etching treatment liquid, which have been conventionally required in the roughening treatment, are not used, wastewater treatment is not necessary and management is extremely easy. In addition, it has the advantage that it has little impact on the environment, has excellent mass productivity on an industrial scale, and its value is great.

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 金属箔にレーザー光を照射して、表面粗
さが10点平均粗さで0.5から10μmの凹凸を形成
することを特徴とする金属箔の粗化方法。
1. A method for roughening a metal foil, which comprises irradiating a metal foil with a laser beam to form irregularities having a surface roughness of 10 to 10 μm in average roughness.
【請求項2】 請求項1の粗化方法により粗化した金属
箔。
2. A metal foil roughened by the roughening method according to claim 1.
【請求項3】 表面に防錆層を有することを特徴とする
請求項2の金属箔。
3. The metal foil according to claim 2, which has a rust preventive layer on its surface.
【請求項4】 表面にカップリング剤処理層を有するこ
とを特徴とする請求項2ないし請求項3の金属箔。
4. The metal foil according to claim 2, which has a coupling agent treatment layer on its surface.
【請求項5】 金属箔が銅箔であることを特徴とする請
求項3ないし請求項5の金属箔。
5. The metal foil according to claim 3, wherein the metal foil is a copper foil.
JP2002052973A 2002-02-28 2002-02-28 Method for roughening metal foil and roughened metal foil Pending JP2003258182A (en)

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JP2007245194A (en) * 2006-03-16 2007-09-27 Ricoh Opt Ind Co Ltd Optical unit for optical fusion, optical fusing apparatus and method
US7838153B2 (en) 2006-08-29 2010-11-23 Panasonic Corporation Current collector, electrode, and non-aqueous electrolyte secondary battery
US8202642B2 (en) 2006-11-15 2012-06-19 Panasonic Corporation Current collector for non-aqueous secondary battery, electrode plate for non-aqueous secondary battery using the same, and non-aqueous secondary battery
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WO2014065133A1 (en) * 2012-10-23 2014-05-01 株式会社アテックス Composite part and method for manufacturing composite part
US20160207287A1 (en) * 2013-10-23 2016-07-21 Furukawa Electric Co., Ltd. Copper-resin composite body and method for producing the same
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WO2007018002A1 (en) * 2005-08-05 2007-02-15 Valeo Thermal Systems Japan Corporation Method for processing valve mechanism constituting member
JP2007064196A (en) * 2005-08-05 2007-03-15 Valeo Thermal Systems Japan Corp Method for processing valve mechanism constituting member
JP2007245194A (en) * 2006-03-16 2007-09-27 Ricoh Opt Ind Co Ltd Optical unit for optical fusion, optical fusing apparatus and method
US7838153B2 (en) 2006-08-29 2010-11-23 Panasonic Corporation Current collector, electrode, and non-aqueous electrolyte secondary battery
US8202642B2 (en) 2006-11-15 2012-06-19 Panasonic Corporation Current collector for non-aqueous secondary battery, electrode plate for non-aqueous secondary battery using the same, and non-aqueous secondary battery
JP2012222113A (en) * 2011-04-07 2012-11-12 Disco Abrasive Syst Ltd Method of processing wafer
WO2014065133A1 (en) * 2012-10-23 2014-05-01 株式会社アテックス Composite part and method for manufacturing composite part
US20160207287A1 (en) * 2013-10-23 2016-07-21 Furukawa Electric Co., Ltd. Copper-resin composite body and method for producing the same
WO2024007441A1 (en) * 2022-07-07 2024-01-11 扬州纳力新材料科技有限公司 Composite foil and preparation method therefor, composite current collector, electrode sheet, and application

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